標準関係情報集ロシア国家標準(GOST R規格)、旧ソ連邦標準(GOST規格)ICS(国際規格分類)コード順一覧(Part 31)

ロシア国家標準、旧ソ連邦標準
(GOST R, GOST規格) ＩＣＳ(国際規格分類)コード順一覧
大分類 31

31	エレクトロニクス
31.020	電子機器部品一般注: 磁気的構成要素→ 29.100.10
31.040	抵抗器
31.060	コンデンサ
31.080	半導体装備注: 半導体材料→ 29.045
31.100	電子管
31.120	電子表示装備注: 液晶ディスプレィ装置を含む
31.140	圧電素子及び誘電素子
31.160	電気フィルタ
31.180	プリント回路及びプリント配線板
31.190	電子部品の実装
31.200	集積回路．マイクロエレクトロニクス注: エレクトロニックチップ、論理及びアナログマイクロストラクチュアを含む。注: マイクロプロセッサ→ 35.160
31.220	電子及び通信設備用機構部品
31.240	電子設備の機械的構造
31.260	オプトエレクトロニクス．レーザー設備注: 光電管及び光電池を含む。

手持ちの情報を整理したものであり、規格原本による確認は行っていません。
すべてを網羅しているわけでも、正確さ、最新性を保証するものではありませんので、規格原本などで確認してください。
31.020 電子機器部品一般
注: 磁気的構成要素→ 29.100.10

Sort Mk 規格番号規格名称(英語) 国際規格分類
( ICSコードの説明 )

04907 1981 　 GOST 4907-81 Control spindle ends of electronic components. Types and basic dimensions 21.120.10
31.020

13540 　 GOST 13540-74 Stabilized low voltage power units type 591 for electronis used General specifications 29.200
31.020

16841 1979 　 GOST 16841-79 Fan holes of devices frames of radioelectronic and electrotechnical products. Types, structure and dimensions 31.020

16962 1971 　 GOST 16962-71 Electronic and electrical equipment. Mechanical and climatic influence. Requirements and test methods 31.020
29.020

21493 1976 　 GOST 21493-76 Electronic components. Storageability requirements and test methods 31.020

23073 1978 　 GOST 23073-78 Heat pipe. Terms, definitions and letter symbols 01.040.31
31.020

23088 1980 　 GOST 23088-80 Electronic components. Requirements for package transportation and test methods 31.020

23586 1996 　 GOST 23586-96 Electrical wiring of radio-electronic equipment and devices. Technical requirements for wire harnesses and their mounting 31.020
29.060
31.220.10

23587 1996 　 GOST 23587-96 Electrical wiring of radio-electronic equipment and devices. Technical requirements for termination of hookup wires and wire strand attachment 31.020
29.060.10
31.220.10

23592 1979 　 GOST 23592-79 Mouting of electric and radioelectronic equipment and instruments. Technical requirements for hang electroradioelements 31.020

23592 1996 　 GOST 23592-96 Electrical wiring of radio-electronic equipment and devices. General requirements for three-dimensional wiring of electronic and electrical devices 31.020
29.060
31.220.10

23593 1979 　 GOST 23593-79 Mounting of electric radioelectronic equipment and instruments using flexible matrices. Technical requirements 31.020

24385 1980 　 GOST 24385-80 [withdrawn? => GOST 30668-2000]
Electronic components. The rules marking of packing 31.020

24686 1981 　 GOST 24686-81 Equipment for manufacture of electronic and electric products. General technical requirements. Marking, packing, transportation and preservation 29.020
31.020

24927 1981 　 GOST 24927-81 Electronic products. General requirements to the temporary corrosion protection and test methods 31.020

25359 1982 　 GOST 25359-82 Electronic components. General requirements on reliability and test methods 31.020
03.120.01

25467 1982 　 GOST 25467-82 Articles of electronics. Application conditions. Classification and requirements for resistance to environmental factors influence 31.020

25486 1982 　 GOST 25486-82 [withdrawn? => GOST 30668-2000]
Electronic components. Marking 31.020

25532 1989 　 GOST 25532-89 Photosensitive charge transfer devices. Terms and definitions 01.040.31
31.020

25874 1983 　 GOST 25874-83 Radioelectronic, electronic and electrotechnical. Conventional functional designations 01.080.40
29.020
31.020
33.020

25991 1983 　 GOST 25991-83 Equipment for manufacturing products of electronic technique. Dust-proof boxes and cabins with laminar air flow. Types. General technical requirements 31.020

26080 1984 　 GOST 26080-84 Mould fungi protection of radioelectronic equipment and electronic technique articles. General requirements 31.020

27597 1988 　 GOST 27597-88 Electronics items. Corrosion resistance evaluation method 31.020

28198 1989 　 GOST 28198-89 Basic environmental testing. Part 1: general and guidance 31.020

28199 1989 　 GOST 28199-89 Basic environmental, testing procedures. Part 2. Tests. Test A: Cold 19.040
31.020

28200 1989 　 GOST 28200-89 Basic environmental testing procedures. Part 2. Tests. Tests B: Dry heat 19.040
31.020

28201 1989 　 GOST 28201-89 Basic environmental testing procedures. Part 2: Tests. Test Ca: Damp heat, steady state 19.040
31.020

28202 1989 　 GOST 28202-89 Basic environmental testing. Part 2. Tests. Test Sa: Simulated solar radiation at ground level 19.040
31.020

28203 1989 　 GOST 28203-89 Basic environmental testing procedures. Part 2. Tests. Test Fc and Guidance: Vibration ( sinusoidal ) 19.040
31.020

28204 1989 　 GOST 28204-89 Basic environmental testing procedures. Part 2. Tests. Test Ga and Guidance: Acceleration, steady state 19.040
31.020

28205 1989 　 GOST 28205-89 Basic environmental testing procedures. Part 2: Tests. Guidance for solar radiation testing 19.040
31.020

28206 1989 　 GOST 28206-89 Basic environmental testing procedures. Part 2. Tests. Test J. And Guidance: Mould growth 19.040
31.020

28207 1989 　 GOST 28207-89 Basic environmental testing procedures. Part 2. Tests. Test Ka: Salt mist 19.040
31.020

28208 1989 　 GOST 28208-89 Basic environmental testing procedures. Part 2. Tests. Test M: Low air pressure 31.020
19.040

28209 1989 　 GOST 28209-89 Basic environmental testing procedures part 2: tests. Test N: Change of temperature 19.040
31.020

28210 1989 　 GOST 28210-89 Basic environmental testing procedures. Part 2. Test Q: Sealing 19.040
31.020

28211 1989 　 GOST 28211-89 Basic environmental testing procedures. Part 2. Tests. Test T: Soldering 19.040
31.020

28212 1989 　 GOST 28212-89 Basic environmental testing procedures. Part 2. Tests. Test U: Robustens of terminations and integral mounting devices 19.040
31.020

28213 1989 　 GOST 28213-89 Basic environmental testing prosedures. Part 2. Tests. Test Ea and guidance: Shock 19.040
31.020
19.060

28214 1989 　 GOST 28214-89 Basic environmental testing procedures. Part 2: Tests guidance for damp heat tests 19.040
31.020

28215 1989 　 GOST 28215-89 Basic environmental testing procedures. Part 2: Tests. Test Eb and guidance: Bump 19.040
31.020

28216 1989 　 GOST 28216-89 Basic environmental testing procedures. Part 2: Tests. Test Db and guidance: damp heat, cyclic ( 12 + 12 hour cycle) 19.040
31.020

28217 1989 　 GOST 28217-89 Basic environmental testing. Part 2. Tests. Test Ec: Drop and Topple, primarily for equipment-type specimens 19.040
31.020
19.060

28218 1989 　 GOST 28218-89 Basic environmental testing procedures. Part 2. Tests. Test Ed: Free fall 19.040
31.020

28219 1989 　 GOST 28219-89 Basic environmental testing procedures. Part 2: Tests. Guidance on change of temperature tests 19.040
31.020

28220 1989 　 GOST 28220-89 Basic environmental testing procedures. Part 2. Tests. Test Fd: Random vibration wide band. General requirements 19.040
31.020
19.060

28221 1989 　 GOST 28221-89 Basic environmental testing procedures. Part 2. Tests. Test Fda: Random vibration wide band - reproducibility high 19.040
31.020
19.060

28222 1989 　 GOST 28222-89 Basic environmental testing procedures. Part 2. Tests. Test Fdb: Random vibration wide band - reproducibility medium 19.040
31.020

28223 1989 　 GOST 28223-89 Basic environmental testing procedures. Part 2. Tests. Test Fde : Random vibration wide band - reproducibility low 19.040
31.020

28224 1989 　 GOST 28224-89 Basic environmental testing procedures. Part 2. Test Z/AD: Composite temperature and humidity cyclic test 19.040
31.020

28225 1989 　 GOST 28225-89 Basic environmental testing procedures. Part 2: Tests. Test Z/AMD : Combined sequential cold, low air pressure and damp heat test 19.040
31.020

28226 1989 　 GOST 28226-89 Basic environmental testing procedures. Part 2. Tests. Test Kc: Sulphur dioxide test for contacts and connections 19.040
31.020

28227 1989 　 GOST 28227-89 Basic environmental testing procedures. Part 2. Tests. Test Kd: Hidrogen sulphide test for contacts and connections 19.040
31.020

28228 1989 　 GOST 28228-89 Basic environmental testing procedures. Part 2. Tests. Guidance on test T: Soldering 19.040
31.020

28229 1989 　 GOST 28229-89 Basic environmental testing procedures. Part 2. Tests. Test XA and guidance. Immersion in cleaning solvents 19.040
31.020

28230 1989 　 GOST 28230-89 Basic environmental testing procedures. Part 2: Tests. Guidance to test Kd: Hydrogen sulphide test for contacts and connections 19.040
31.020

28231 1989 　 GOST 28231-89 Basic environmental testing procedures. Part 2. Tests. Mounting of components, equipment and other articles for dinamic tests including shock (Ea), bump (Eb), vibration (Fc and Fd) and steady-state acceleration (Ga) and guidance 19.040
31.020
19.060

28232 1989 　 GOST 28232-89 Basic environmental testing procedures. Part 2. Tests. Guidance on the application of the tests of IEC publication 68 to semulate the effects of storage 31.020
19.040

28233 1989 　 GOST 28233-89 Basic environmental testing procedures. Part 2. Tests. Guidance to test Kc: Sulphur dioxide test for contact and connections 31.020
19.040

28234 1989 　 GOST 28234-89 Basic environmental testing procedures. Part2. Tests. Test Kb: Salt mist, cyclic ( sodium chloride solution) 19.040
31.020

28235 1989 　 GOST 28235-89 Basic environmental testing procedures. Part 2. Tests. Test Ta: Soldering. Solderability testing by the wetting balance method 19.040
31.020
25.160.50

28236 1989 　 GOST 28236-89 Basic environmental testing procedures. Part 3. Background information. Cold and dry heat tests 19.040
31.020

29178 1991 　 GOST 29178-91 Electromagnetic compatibility of technical means. HUF electrovacuum equipment. Generators, amplifiers and modules on their basis. Requirements for side oscillations levels 33.100
31.020

29179 1991 　 GOST 29179-91 Electromagnetic compatibility of technical means. HUF equipment. Methods of measurements for side oscillations 33.100
31.020

29180 1991 　 GOST 29180-91 Electromagnetic compatibility of technical means. HUF equipment. Low noise amplifires. Parameters and characteristics. Methods of measurements 33.100
31.020

30668 2000 　 GOST 30668-2000 Electronic components. Marking 31.020

50139 1992 　 GOST R 50139-92 Processing equipment. General specifications 31.020

50730-01 1995 　 GOST R 50730.1-95 Microwave ferrite devices. General requirements for measurement of parametres at high power level 31.020

50730-02 1995 　 GOST R 50730.2-95 Microwave ferrite devices. Methods of measurement of losses at high power level 31.020

50730-03 1995 　 GOST R 50730.3-95 Microwave ferrite devices. Methods of measurement of return losses and isolation at high power level 31.020

50730-04 1995 　 GOST R 50730.4-95 Microwave ferrite devices. Methods of measurement of phase shift at high power level 31.020

50730-05 1995 　 GOST R 50730.5-95 Microwave ferrite devices. Methods of measurement of voltage standing wave ratio (VSWR) and maximum VSWR at high power level 31.020

51317-02-05 2000 　 GOST R 51317.2.5-2000 Electromagnetic compatibility of technical equipment. Electromagnetic environment. Classification of electromagnetic disturbances for different locations of technical equipment 33.100
29.020
31.020

51317-03-02 1999 　 GOST R 51317.3.2-99 Electomagnetic compatibility of technical equipment. Harmonic current emissions (equipment input current < 16 A per phase). Limits and test methods 33.100
29.020
31.020

51317-03-03 1999 　 GOST R 51317.3.3-99 Electromagnetic compatibility of technical equipment. Voltage fluctuation and fliker impressed on low-voltage supply systems by equipment with rated current <=16 A. Limits and test methods 33.100
29.020
31.020

51317-04-01 2000 　 GOST R 51317.4.1-2000 Electromagnetic compatibility of technical equipment. Immunity tests. Overview of the test 33.100
29.020
31.020

51317-04-02 1999 　 GOST R 51317.4.2-99 Electromagnetic compatibility of technical equipment. Immunity to electrostatic discharge. Requirements and test methods 33.100
29.020
31.020

51317-04-03 1999 　 GOST R 51317.4.3-99 Electromagnetic compatibility of technical equipment. Radiated, radio-frequency electromagnetic field immunity. Requirements and test methods 29.020
31.020
33.100

51317-04-04 1999 ★ GOST R 51317.4.4-99 [withdrawn]
Electromagnetic compatibility of technical equipment. Immunity to electrical fast transient/burst. Requirements and test methods 33.100
29.020
31.020

51317-04-05 1999 　 GOST R 51317.4.5-99 Electromagnetic compatibility of technical equipment. Microsecond high energy pulse disturbance immunity. Requirements and test methods 29.020
31.020
33.100

51317-04-06 1999 　 GOST R 51317.4.6-99 Electomagnetic compatibility of technical equipment. Immunity to conducted disturbance induced by radio-frequency fields. Requirements and test methods 33.100
29.020
31.020

51317-04-11 1999 ★ GOST R 51317.4.11-99 [withdrawn]
Electromagnetic compatibility of technical equipment. Immunity to dinamic changes of power supply voltage. Requirements and test methods 29.020
31.020
33.100

51317-04-12 1999 　 GOST R 51317.4.12-99 Electromagnetic compatibility of technical equipment. Oscillatory waves immunity. Requirements and test methods 33.100
29.020
31.020

51317-04-14 2000 　 GOST R 51317.4.14-2000 Electromagnetic compatidility of technical equipment. Immunity to power voltage fluctuations. Requirements and test methods 33.100
29.020
31.020

51317-04-16 2000 　 GOST R 51317.4.16-2000 Electromagnetic compatibility of technical equipment. Immunity to conducted disturbances in the frequency range 0 Hz to 150 kHz. Requirement and test methods 33.100
29.020
31.020

51317-04-17 2000 　 GOST R 51317.4.17-2000 Electromagnetic compatibility of technical equipment. Immunity to d.c. power voltage ripples. Requirements and test methods 33.100
29.020
31.020

51317-04-28 2000 　 GOST R 51317.4.28-2000 Electromagnetic compatibility of technical equipment. Immunity to variation of power frequency. Requirements and test methods 33.100
29.020
31.020

51317-06-01 1999 　 GOST R 51317.6.1-99 Electromagnetic compatibility of technical equipment. Immunity of technical equipment intended for use in residential, commercial and light-industry environments. Requirements and test methods 29.020
31.020
33.100

51317-06-02 1999 ★ GOST R 51317.6.2-99 [withdrawn]
Electromagnetic compatibility of technical equipment. Immunity of technical equipment intended for use in industry environments. Requirements and test methods 29.020
31.020
33.100

51317-06-03 1999 　 GOST R 51317.6.3-99 Electromagnetic compatibility of technical equipment. Emission from technical equipment intended for use in residential, commercial and light-industry environments. Limits and test methods 29.020
31.020
33.100

51317-06-04 1999 　 GOST R 51317.6.4-99 Electromagnetic compatibility of technical equipment. Emission from technical equipment intended for use in industry environments. Limits and test methods 29.020
31.020
33.100

51320 1999 　 GOST R 51320-99 Electromagnetic compatibility of technical equipment. Man-made radio disturbance. Test methods for technical equipment which are man-made radio disturbance sources 33.100
29.020
31.020

IEC 60536-02 2001 　 GOST R IEC 60536-2-2001 Classification of electrical and electronic equipment with regard to protection against electric shock. Part 2. Guidelines to requirements for protection against electric shock 29.020
31.020

31.040 抵抗器

Sort Mk 規格番号規格名称(英語) 国際規格分類
( ICSコードの説明 )

00002-728 1974 　 GOST 2.728-74 Unified system for design documentation. Graphical symbols in diagrams. Resistrors, capacitors 01.080.40
31.040
31.060

09663 1975 　 GOST 9663-75 Resistors. The series of rated dissipation 31.040

09664 1974 　 GOST 9664-74 Resistors. Tolerances on rated resistance 31.040

10318 1980 　 GOST 10318-80 Variable resistors. Main parameters 31.040.20

12661 1967 　 GOST 12661-67 Capacitors and resistors. Mounting lengths and diameters of wire leads 31.040
31.060

21342-00 1975 　 GOST 21342.0-75 Resistors. General requirements at measuring of electrical parameters 31.040

21342-01 1987 　 GOST 21342.1-87 Variable resistors. Method for measuring transient resistance of switch contacts 31.040.20

21342-02 1975 　 GOST 21342.2-75 Resistors variables. Test method for flexibility of resistance changing 31.040.20

21342-03 1987 　 GOST 21342.3-87 Variable resistors. Test methods for resistance law 31.040.20

21342-04 1987 　 GOST 21342.4-87 Variable resistors. Test method for matching of the resistance law 31.040.20

21342-05 1987 　 GOST 21342.5-87 Variable resistors. Methods of measuring minimal resistance, index of maximal attenuation and initial resistance jump 31.040.20

21342-06 1975 　 GOST 21342.6-75 Resistors variable. Control methods for dynamic noise of moving system 31.040.20

21342-07 1976 　 GOST 21342.7-76 Thermal resistors. Method of measuring resistance 31.040.30

21342-08 1976 　 GOST 21342.8-76 Thermal resistors. Method of measuring resistance temperature coefficient 31.040.30

21342-09 1976 　 GOST 21342.9-76 Varistors. Method of measuring voltage and current 31.040.20

21342-10 1976 　 GOST 21342.10-76 Varistors. Method of measuring non linearity coefficient 31.040.20

21342-11 1976 　 GOST 21342.11-76 Varistors. Method of measuring current asymmetry and voltage asymmetry 31.040.20

21342-12 1976 　 GOST 21342.12-76 Varistors. Method of measuring voltage and current temperature 31.040.20

21342-13 1978 　 GOST 21342.13-78 Resistors. Method of measuring insulation resistance 31.040

21342-14 1986 　 GOST 21342.14-86 Resistors. Test method by pulse load 31.040

21342-15 1978 　 GOST 21342.15-78 Resistors. Test method for temperature dependence of resistance 31.040

21342-16 1978 　 GOST 21342.16-78 Resistors. Method of measurement of non-linearity 31.040

21342-17 1978 　 GOST 21342.17-78 Resistors. Test method for resistance change depending upon voltage 31.040

21342-18 1978 　 GOST 21342.18-78 Resistors. Test method for withstand voltage 31.040

21342-19 1978 　 GOST 21342.19-78 Resistors. Methods of measuring noise level 31.040

21342-20 1978 　 GOST 21342.20-78 Resistors. Method of measuring resistance 31.040

21395-00 1975 　 GOST 21395.0-75 Resistors. Method of control of requirements for design. General 31.040

21395-03 1975 　 GOST 21395.3-75 Variable resistors. Test methods of easy running of motion smoothness, torque moment (stress of motion), starting (stress) torque movable system of resistor, operation of moment (stress) of resistor switch 31.040.20

21395-04 1975 　 GOST 21395.4-75 Alternating resistors. Control method of rotation angle or motion of movable system, operation angle of resistor's switch or motion under operation of resistor's switch 31.040.20

21395-05 1975 　 GOST 21395.5-75 Resistors variable. Test method for stopper strength of moving system 31.040.20

21395-06 1975 　 GOST 21395.6-75 Resistors variable. Test methods for rotational mechanical life of resistor and resistor switch 31.040.20

21395-07 1975 　 GOST 21395.7-75 Resistors variable. Test method for stop strength 31.040.20

21414 1975 　 GOST 21414-75 Resistors. Terms and definitions 01.040.31
31.040

22174 1976 　 GOST 22174-76 Variable non-wire resistors. Bodies. Basic dimensions 31.040.20

23203 1978 　 GOST 23203-78 Varistors. Series of currents and classification voltages 31.040.20

24013 1980 　 GOST 24013-80 Fixed resistors. Main parameters 31.040.10

24237 1984 　 GOST 24237-84 Variable non-wire-wound resistors. General specifications 31.040.20

24238 1984 　 GOST 24238-84 Fixed resistors. General specifications 31.040.10

24239 1984 　 GOST 24239-84 Variable wire-wound resistors. General specifications 31.040.20

27647 1988 　 GOST 27647-88 Veriable resistors. Test method of mechanical strength of lead screw 31.040.20

27648 1988 　 GOST 27648-88 Veriable resistors. Low voltage method of testing of moveable contact intermediate resistance 31.040.20

28608 1990 　 GOST 28608-90 Fixed resistors for use in electronic equipment. Part 1. General specification 31.040.10

28610 1990 　 GOST 28610-90 Fixed resistors for use in electronic equipment. Part 2. Sectional specification: fixed low-power non-wirewound resistors 31.040.10

28611 1990 　 GOST 28611-90 Fixed resistors for use in electronic equipment. Part 2. Blanc detail specification: fixed low-power non-wirewound resistors. Assessment level E 31.040.10

28626 1990 　 GOST 28626-90 Indirectly heated thermistors with negative temperature coefficient of resistance. General specification 31.040.30

28639 1990 　 GOST 28639-90 Indirectly heated thermistors with negative temperature coefficient resistance. Blank detail specification. Assessment level E 31.040.30

28883 1990 　 GOST 28883-90 Marking codes for resistors and capacitors 01.070
31.040
31.060

28884 1990 　 GOST 28884-90 Preferred number series for resistors and capacitors 31.040
31.060

29028 1991 　 GOST 29028-91 Fixed resistors for use in electronic equipment. Part 4. Sectional specification. Fixed power resistors 31.040.10

29029 1991 　 GOST 29029-91 Fixed resistors for use in electronic equipment. Part 4. Blank detail specification. Fixed power resistors. Assessment level E 31.040.10

29034 1991 　 GOST 29034-91 Fixed resistors for use in electronic equipment. Part 5. Sectional specification : fixed precision resistors 31.040.10

29035 1991 　 GOST 29035-91 Fixed resistors for use in electronic equirment. Part 5. Blank detail specification : fixed precision resistors. Assessment level E 31.040.10

29042 1991 　 GOST 29042-91 Fixed resistors for use in electronic equipment. Part 6. Sectional specification: fixed resistor networks with individually measurable resistors 31.040.10

29043 1991 　 GOST 29043-91 Fixed resistors for use in electronic equipment. Part 6. Blank detail specification: fixed resistor networks with individually measurable resistors, of either different resistance values or different rated dissipations. Assessment level E 31.040.10

29068 1991 　 GOST 29068-91 Fixed resistors for use in electronic equipment. Part 6. Blank detail specification: fixed resistor networks with individually measurable resistors, all of equal value and equal dissipation. Assessment level E 31.040.10

29069 1991 　 GOST 29069-91 Fixed resistors for use in electronic equipment. Part 7. Sectional specification: fixed resistor networks in which not all resistors are individually measurable 31.040.10

29070 1991 　 GOST 29070-91 Fixed resistors for use in electronic equipment. Part 7. Blank detail specification: fixed resistor networks in which not all resistors are individually measurable. Assessment level E 31.040.10

29071 1991 　 GOST 29071-91 Fixed resistors for use in electronic equipment. Part 8. Sectional specification: fixed chip resistors 31.040.10

29072 1991 　 GOST 29072-91 Fixed resistors for use in electronic equipment. Part 8. Blank detail specification fixed chip-resistors. Assessment level E 31.040.10

30264 1995 　 GOST 30264-95 Varistors. General requirements for electrical parameters measuring 31.040.20

30265 1995 　 GOST 30265-95 Varistors. Method of test by pulse electrical load 31.040.20

30346 1996 　 GOST 30346-96 Varistors. Method of measuring capacitance 31.040.20

31.060 コンデンサ

Sort Mk 規格番号規格名称(英語) 国際規格分類
( ICSコードの説明 )

00002-728 1974 　 GOST 2.728-74 Unified system for design documentation. Graphical symbols in diagrams. Resistrors, capacitors 01.080.40
31.040
31.060

00004-172 1985 　 GOST 4.172-85 System of product-quality indices. Power capacitors, capacitor installations. Nomenclature of indices 03.120
31.060.70

00012-02-007-05 1975 　 GOST 12.2.007.5-75 Occupation safety standards system. Safety requirements. Power capacitors. Capacitor installations 13.100
31.060.70

01282 1988 　 GOST 1282-88 Capacitors for power factor correction. Specifications 29.240.99
31.060.70

12661 1967 　 GOST 12661-67 Capacitors and resistors. Mounting lengths and diameters of wire leads 31.040
31.060

14611 1978 　 GOST 14611-78 Fixed and variable vacuum capacitore. Series of rated capacitance voltage and current 31.060

15581 1980 　 GOST 15581-80 Coupling and power selection capacitors for electric transmission lines. Specifications 29.240.99
31.060.70

18689 1981 　 GOST 18689-81 Capacitors for electric-thermal installations with frequences 0,5-10,0 kHz. General specifications 29.240.99
31.060.70

21415 1975 　 GOST 21415-75 Capacitors. Terms and definitions 01.040.31
31.060

24240 1984 　 GOST 24240-84 Fixed and variable vacuum capacitors. General specifications 31.060

25814 1983 　 GOST 25814-83 Ceramic capacitors type k10-7b. Specifications 31.060.20

25949 1983 　 GOST 25949-83 Ceramic trimmer capacitors type kpk=m. Specifications 31.060.20

26192 1984 　 GOST 26192-84 Fixed capacitors. Marking coloured codes 31.060.10

27389 1987 　 GOST 27389-87 Power factor capacitor bank. Terms and definitions. General technikal requirements 29.240.99
31.060.70

27390 1987 　 GOST 27390-87 Selfing capacitors for power factor corrections. Terms and definitions. Technical instructions. Regulations of acceptance. Test methods 29.240.99
31.060.70

27550 1987 　 GOST 27550-87 Fixed aluminium capacitors with non-solid electrolyte. General specifications 31.060.10

27778 1988 　 GOST 27778-88 Ceramic fixed capacitors. General specification 31.060.10

28309 1989 　 GOST 28309-89 Oxide electrolytic aluminium fixed capacitors. Explosion-proof test methods 31.060.10
31.060.50

28883 1990 　 GOST 28883-90 Marking codes for resistors and capacitors 01.070
31.040
31.060

28884 1990 　 GOST 28884-90 Preferred number series for resistors and capacitors 31.040
31.060

28885 1990 　 GOST 28885-90 Capacitors. Methods of measurements and tests 31.060

28896 1991 　 GOST 28896-91 Fixed capacitors for use in electronic equipment. Part 1. General specification 31.060.10

28897 1991 　 GOST 28897-91 Fixed capacitors for use in electronic equipment. Part 11. Sectional specification. Fixed polyethylene-terephthalate film dielectric metal foil d.c. capacitors 31.060.10
31.060.30

28898 1991 　 GOST 28898-91 Fixed capacitors for use in electronic equipment. Part 11. Blanc detail specification. Fixed polyethylene-terephthalate film dielectric metal foil d.c. capacitors. Assessment level E 31.060.10
31.060.30

50292 1992 　 GOST R 50292-92 Fixed capacitors for use in electronic equipment. Part 8. Sectional specification. Fixed capacitors of ceramic dielectric class 1 31.060.10

50293 1992 　 GOST R 50293-92 Fixed capacitors for use in electronic equipment. Part 8. Blank detail specification. Fixed capacitors of ceramic dielectric, class 1. Assessment level E 31.060.20

50294 1992 　 GOST R 50294-92 Fixed capacitors for use in electronic equipment. Part 9. Sectional specifications: fixed capacitors of ceramic dielectric, class 2 31.060.20

50295 1992 　 GOST R 50295-92 Fixed capacitors for use in electronic equipment. Part 9. Blank detail specification: fixed capacitors of ceramic dielectric, class 2. Assessment level E 31.060.20

50296 1992 　 GOST R 50296-92 Fixed capacitors for use in electronic equipment. Part 10. Sectional specification: fixed multilayer ceramic chip capacitors 31.060.20

50297 1992 　 GOST R 50297-92 Fixed capacitors for use in electronic equipment. Part 10. Sectional specification: fixed multilayer ceramic chip capacitors. Assessment level E 31.060.20

IEC 60252 1994 　 GOST R IEC 252-94 [withdrawn]
Capacitors for alternating - motors 31.060.30

IEC 60252 1995 　 GOST IEC 252-95 Capacitors for alternating - motors 31.060.30

IEC 60252-01 2005 　 GOST R IEC 60252-1-2005 AC motor capacitors. Part 1. General. Performance, testing and rating. Safety requirements. Guide for installation and operation 31.060.30

IEC 60384-01 2003 　 GOST R IEC 60384-1-2003 Fixed capacitors for use in electronic equipment. Part 1. General specifications 31.060.10

IEC 60384-14 1994 　 GOST R IEC 384-14-94 [wuithdrawn]
Fixed capacitors for use in electronic equipment. Part 14. Sectional specification. Fixed capacitors for electromagnetic interference suppression and connection to the supply mains 31.060.10

IEC 60384-14 1995 　 GOST IEC 384-14-95 [withdrawn?]
Fixed capacitors for use in electronic equipment. Part 14. Sectional spesification. Fixed capacitors for electromagnetic interference suppression and connection to the supply mains 31.060.10

IEC 60384-14 2004 　 GOST R IEC 60384-14-2004 Fixed capacitors for use in electronic equipment. Part 14. Sectional specification on fixed capacitors for electromagnetic interference suppression and connection to the supply mains 31.060.20

IEC 60384-14-01 2004 　 GOST R IEC 60384-14-1-2004 Fixed capacitors for use in electronic equipment. Part 14-1. Blank detail specification on fixed capacitors for electromagnetic interference suppression and connection to the supply mains. Assessment level D 31.060.20

31.080 半導体装備
注: 半導体材料→ 29.045

Sort Mk 規格番号規格名称(英語) 国際規格分類
( ICSコードの説明 )

00002-730 1973 　 GOST 2.730-73 Unified system for design documentation. Graphical symbols in diagrams. Semiconductor devices 01.080.40
31.080

00004-137 1985 　 GOST 4.137-85 Product-quality index system. Power semiconductor devices. Nomenclature of indices 03.120
31.080

00029-05-002 1982 　 GOST 29.05.002-82 Standards system of ergonomical requirments and ergonomical means. Digital and sign-synthesizing indicators. General ergonomical requirements 13.180
31.080

11612-02 1981 　 GOST 11612.2-81 Photomultipliers. Measuring method of anode luminous sensitivity 31.080
31.260

11630 1984 　 GOST 11630-84 Semiconductor devices. General specification 31.080

14343 1969 　 GOST 14343-69 Semiconductors diodes types of Д 223, Д 223a, Д 223Б for widely used devices 31.080.10

14949 1969 　 GOST 14949-69 Transistors of mП111, mП111a, mП111, mП112, mП113, mП113a types for widely used devices 31.080.30

15133 1977 　 GOST 15133-77 Semiconductor devices. Terms and definitions 01.040.31
31.080

15172 1970 　 GOST 15172-70 Transistors. List of basic and reference electrical parameters 31.080.30

15606 1970 　 GOST 15606-70 Tunnel diodes. Types aИ301a, aИ301, aИ301b, aИ301Г for widely used devices 31.080.10

16947 1971 　 GOST 16947-71 Transistors type Гt701a for wide using equipment 31.080.30

17465 1980 　 GOST 17465-80 Semiconductor diodes. Basic parameters 31.080.10

17466 1980 　 GOST 17466-80 Transistors bipolar and field-effect. Basic parameters 31.080.30

17704 1972 　 GOST 17704-72 Semiconductor devices. Photoelectric receivers of radiant energy. Classification and system designations 31.080

17772 1988 　 GOST 17772-88 Semiconducting photoelectric detectors and receiving photoelectric devices. Methods of measuring photoelectric parameters and determining characteristics 31.080
31.260

18472 1988 　 GOST 18472-88 Semiconductor devices. Basic dimensions 31.080

18577 1980 　 GOST 18577-80 Thermoelectric semiconductor devices. Terms and definitions 01.040.31
31.080

18604-00 1983 　 GOST 18604.0-83 Bipolar transistors. General requirements for measuring of electrical parameters 31.080.30

18604-01 1980 　 GOST 18604.1-80 Transistors bipolar. Method for measuring collector-tobase time constant at high frequencies 31.080.30

18604-02 1980 　 GOST 18604.2-80 Transistors bipolar. Methods for measuring of static coefficient of current transmission 31.080.30

18604-03 1980 　 GOST 18604.3-80 Transistors bipolar. Methods for measuring collector and emitter capacitances 31.080.30

18604-04 1974 　 GOST 18604.4-74 Transistors. Method for measuring collector reverse current 31.080.30

18604-05 1974 　 GOST 18604.5-74 Transistors. Method for measuring collector-emitter reverse current 31.080.30

18604-06 1974 　 GOST 18604.6-74 Transistors. Method for measuring emitter reverse current 31.080.30

18604-07 1974 　 GOST 18604.7-74 Transistors. Method for measuring current transfer coefficient 31.080.30

18604-08 1974 　 GOST 18604.8-74 Transistors. Method for measuring output conductivity 31.080.30

18604-09 1982 　 GOST 18604.9-82 Transistors bipolar. Methods for determining cut-off frequency and transition frequency 31.080.30

18604-10 1976 　 GOST 18604.10-76 Transistors bipolar. Input resistance measurement technique 31.080.30

18604-11 1988 　 GOST 18604.11-88 Transistors bipolar. Method of measuring noise figure at high and ultra-high frequencies 31.080.30

18604-13 1977 　 GOST 18604.13-77 Bipolar microwave oscillator transistors. Techniques for measuring output power, power gain and collector efficiency 31.080.30

18604-14 1977 　 GOST 18604.14-77 Bipolar microwave oscillator transistors. Techniques for measuring coefficient modulus of inverse transmission of voltage in the circuit with general base at high frequency 31.080.30

18604-15 1977 　 GOST 18604.15-77 Bipolar microwave oscillator transistors. Techniques for measuring critical current 31.080.30

18604-16 1978 　 GOST 18604.16-78 Transistors bipolar. Method of measurement of voltage feedback ratio in low signal conditionals 31.080.30

18604-19 1988 　 GOST 18604.19-88 Bipolar transistors . Method of measuring threshold voltage 31.080.30

18604-20 1978 　 GOST 18604.20-78 Transistors bipolar. Methods for measuring noise figure at low frequencies 31.080.30

18604-22 1978 　 GOST 18604.22-78 Transistors bipolar. Methods for measuring collector-emitter and base-emitter saturation voltage 31.080.30

18604-23 1980 　 GOST 18604.23-80 Bipolar transistors. Method for measuring combination frequencies 31.080.30

18604-24 1981 　 GOST 18604.24-81 Transistors bipolar high-frequency. Techniques for measuring output power, power gain and collector efficiency 31.080.30

18604-26 1985 　 GOST 18604.26-85 Bipolar transistors. Methods of time parameters measurement 31.080.30

18604-27 1986 　 GOST 18604.27-86 Power high-voltage bipolar transistors. Collector-base (emitter-base) breakdown voltage measurement at emitter (collector) cut-off current 31.080.30

18986-00 1974 　 GOST 18986.0-74 Semiconductor diodes. Measuring methods for electrical parameters. General requirements 31.080.10

18986-01 1973 　 GOST 18986.1-73 Semiconductor diodes. Method for measuring direct reverse current 31.080.10

18986-03 1973 　 GOST 18986.3-73 Semiconductor diodes. Method of measuring of direct forward voltage and direct forward current 31.080.10

18986-04 1973 　 GOST 18986.4-73 Semiconductor diodes. Methods for measuring capacitance 31.080.10

18986-05 1973 　 GOST 18986.5-73 Semiconductor diodes. Method for measuring transition time 31.080.10

18986-06 1973 　 GOST 18986.6-73 Semiconductor diodes. Method for measuring recovery charge 31.080.10

18986-07 1973 　 GOST 18986.7-73 Semiconductor diodes. Methods for measuring life time 31.080.10

18986-08 1973 　 GOST 18986.8-73 Semiconductor diodes. Method for measuring reverse recovery time 31.080.10

18986-09 1973 　 GOST 18986.9-73 Semiconductor diodes. Method for measuring pulse direct voltage and forword recovery time 31.080.10

18986-10 1974 　 GOST 18986.10-74 Semiconductor diodes. Methods for measuring inductance 31.080.10

18986-11 1984 　 GOST 18986.11-84 Semiconductor diodes. Total series equivalent resistance measurement methods 31.080.10

18986-12 1974 　 GOST 18986.12-74 Semiconductor tunnel diodes. Method for measuring negative conductance of the intrinsic diode 31.080.10

18986-13 1974 　 GOST 18986.13-74 Semiconductor tunnel diodes. Methods for measuring peak point current, valley point current, peak point voltage, valley point voltage, projected peak point voltage 31.080.10

18986-14 1985 　 GOST 18986.14-85 Semiconductor diodes. Methods for measuring differential and slope resistances 31.080.10

18986-15 1975 　 GOST 18986.15-75 Reference diodes. Method of measuring stabilization voltage 31.080.99

18986-16 1972 　 GOST 18986.16-72 Rectifier diodes. Methods of measuring average forward voltage and average reverse current 31.080.10

18986-17 1973 　 GOST 18986.17-73 Reference diodes. Method of measuring of temperature coefficient of working voltage 31.080

18986-18 1973 　 GOST 18986.18-73 Variable capacitance diodes. Method of measuring temperature coefficient of capacitance 31.080.10

18986-19 1973 　 GOST 18986.19-73 Variable capacitance diodes. Method for measuring the quality factor 31.080.10

18986-20 1977 　 GOST 18986.20-77 Semiconductor diodes. Reference zener diodes. Method for measuring warm up time 31.080

18986-21 1978 　 GOST 18986.21-78 Reference diodes and stabistors. Method for measuring time drift of working voltage 31.080

18986-22 1978 　 GOST 18986.22-78 Reference diodes. Methods for measuring differential resistance 31.080

18986-23 1980 　 GOST 18986.23-80 Zener diodes. Methods for measuring spectral noise density 31.080

18986-24 1983 　 GOST 18986.24-83 Semiconductor diodes. Measurement method of breakdown voltage 31.080.10

19095 1973 　 GOST 19095-73 Field effect transistors. Terms, definitions and parameter symbols 01.040.31
31.080.30

19138-00 1985 　 GOST 19138.0-85 Thyristors. General requirements for methods of measuring parameters 31.080.20

19138-01 1985 　 GOST 19138.1-85 Thyristors. Method for measuring switching voltage 31.080.20

19138-02 1985 　 GOST 19138.2-85 Triode thyristors. Method for measuring trigger direct and peak gate current and trigger direct and peak gate voltage 31.080.20

19138-03 1985 　 GOST 19138.3-85 Triode thyristors. Method for measuring turn-off time 31.080.20

19138-04 1973 　 GOST 19138.4-73 Thyristors. Method for measuring turn-on, rise and delay times 31.080.20

19138-05 1985 　 GOST 19138.5-85 Triode thyristors. Method for measuring turn-on, rise and delay time 31.080.20

19138-06 1986 　 GOST 19138.6-86 Thyristors. Methods for measuring electrical parameters 31.080.20

19138-07 1974 　 GOST 19138.7-74 Thyristors. Measurement method of peak gate turn-off current, peak gate turn-off voltage, peak turn-off coefficient 31.080.20

19656-00 1974 　 GOST 19656.0-74 Semiconductor UHF diodes. Measurement methods of electrical parameters. General conditions 31.080.10

19656-01 1974 　 GOST 19656.1-74 Semiconductor UHF mixer and detector diodes. Measurement method of voltage standing-wave ratio 31.080.10

19656-02 1974 　 GOST 19656.2-74 Semiconductor UHF mixer diodes. Measurement method of rectified current 31.080.10

19656-03 1974 　 GOST 19656.3-74 Semiconductor UHF mixer diodes. Measurement methods of output impedance at an intermediate frequency 31.080.10

19656-04 1974 　 GOST 19656.4-74 Semiconductor UHF mixer diodes. Measurement methods of conversion losses 31.080.10

19656-05 1974 　 GOST 19656.5-74 Semiconductor UHF mixer and detector diodes. Measurement methods of output noise ratio 31.080.10

19656-06 1974 　 GOST 19656.6-74 Semiconductor UHF mixer diodes. Measurement methods of standard overall noise figure 31.080.10

19656-07 1974 　 GOST 19656.7-74 Semiconductor UHF detector diodes. Measurement method of current sensitivity 31.080.10

19656-09-1979 　 GOST 19656.9-79 Semiconductor microwave varactors and multiplier diodes. Methods of measuring time constant and limiting frequency 31.080.10

19656-10 1988 　 GOST 19656.10-88 Semiconductor microwave switching and limiter diodes. Methods of measuring loss resistances 31.080.10

19656-12 1976 　 GOST 19656.12-76 Semicondactor UHF mixer diodes. Measurement method of input impedance 31.080.10

19656-13 1976 　 GOST 19656.13-76 Semiconductor UHF detector diodes. Measurement methods of tangential sensitivity 31.080.10

19656-14 1979 　 GOST 19656.14-79 Semiconductor microwave switching diodes. Measurement method of critical frequency 31.080.10

19656-15 1984 　 GOST 19656.15-84 Semiconductor UHF diodes. Measurement methods of thermal resistance and pulse thermal resistance 31.080.10

19656-16 1986 　 GOST 19656.16-86 Semiconductor microwave limiter diodes. Measurement method of break-down and leakage powers 31.080.10

19834-00 1975 　 GOST 19834.0-75 Semiconductor emitters. Methods for measurement of parameters. General principles 31.080.99

19834-02 1974 　 GOST 19834.2-74 Semiconductor emitters. Methods of measurement of radiant intensity and radiance 31.080.99

19834-03 1976 　 GOST 19834.3-76 Semiconductor emitters. Methods of measurement for relative spectral energy distribution and spectral bandwidth 31.080.99

19834-04 1979 　 GOST 19834.4-79 Semiconductor radiating infra-red diodes. Methods of measurement of radiation power 31.080.10

19834-05 1980 　 GOST 19834.5-80 Semiconductor emitting infra-red diodes. Method for measuring of radiation pulse switching times 31.080.10

20003 1974 　 GOST 20003-74 Bipolar transistors. Terms, definitions and parameter symbols 01.040.31
31.080.30

20215 1984 　 GOST 20215-84 Semiconductor microwave diodes. General specifications 31.080.10

20332 1984 　 GOST 20332-84 Thyristors. Electrical parameters. Terms, definitions and letter symbols 01.040.31
31.080.20

20398-00 1983 　 GOST 20398.0-83 Field-effect transistors. General requirements for measuring electrical parameters 31.080.30

20398-01 1974 　 GOST 20398.1-74 Field-effect transistors. Shot-circuit forward transfer admittance measurement technique 31.080.30

20398-02 1974 　 GOST 20398.2-74 Field-effect transistors. Noise figure measurement technique 31.080.30

20398-03 1974 　 GOST 20398.3-74 Field-effect transistors. Forward transconductance measurement technique 31.080.30

20398-04 1974 　 GOST 20398.4-74 Field-effect transistors. Active output conductance component measurement technique 31.080.30

20398-05 1974 　 GOST 20398.5-74 Field-effect transistors. Input transfer and output capacitance measurement technique 31.080.30

20398-06 1974 　 GOST 20398.6-74 Field-effect transistors. Gate leakage current measurement technique 31.080.30

20398-07 1974 　 GOST 20398.7-74 Field-effect transistors. Threshold and cut-off voltage measurement technique 31.080.30

20398-08 1974 　 GOST 20398.8-74 Field-effect transistors. Drain current for V(Gs)=0 measurement technique 31.080.30

20398-09 1980 　 GOST 20398.9-80 Field-effect transistors. Forward fransconductance inpulse measurement technique 31.080.30

20398-10 1980 　 GOST 20398.10-80 Field-effect transistors. Drain current for Vgs=0 impulse measurement technique 31.080.30

20398-11 1980 　 GOST 20398.11-80 Field-effect transistors. Short-circuit equivalent input noise voltage measurement technique 31.080.30

20398-12 1980 　 GOST 20398.12-80 Field-effect transistors. Drain residual current measurement technique 31.080.30

20398-13 1980 　 GOST 20398.13-80 Field-effect transistors. Drain source resistance measurement technique 31.080.30

20398-14 1988 　 GOST 20398.14-88 Field-effect transistors. Method of measuring output power, power gain and drain efficiency 31.080.30

20420 1975 　 GOST 20420-75 Strain gauges. Terms and definitions 01.040.31
31.080.99

20859-01 1989 　 GOST 20859.1-89 Power semiconductor devices. General technical requirements 31.080
29.200

21934 1983 　 GOST 21934-83 Semiconducting photoelectric detectors and receiving photoelectric devices. Terms and definitions 01.040.31
31.080

22902 1978 　 GOST 22902-78 Man-machin system. Reading device of visual display. General ergonomic requirements 13.180
31.080

23448 1979 　 GOST 23448-79 Semiconductor infra-red emitting diodes. Basic dimensions 31.080.10

23900 1987 　 GOST 23900-87 Power semiconducting devices. Mounting and overall dimensions 29.200
31.080

24041 1980 　 GOST 24041-80 Gas discharge devices. Tesitrons. Main parameters 31.080

24173 1980 　 GOST 24173-80 Thyristors. Essential parameters 31.080.20

24352 1980 　 GOST 24352-80 Semiconductor. Photoemitters. Main parameters 31.080.99

24376 1991 　 GOST 24376-91 Semiconductor inverters. General specifications 29.200
31.080

24461 1980 　 GOST 24461-80 Power semiconducting devices. Test and measurement methods 29.200
31.080

24607 1988 　 GOST 24607-88 Semiconductor frequency converters. General technical requirements 29.200
31.080

25293 1982 　 GOST 25293-82 Coolers of air-cooling system of power semiconducting devices. General specifications 29.200
31.080

25529 1982 　 GOST 25529-82 Semiconductors diodes. Terms, definitions and letter symbols 01.040.31
31.080.10

26169 1984 　 GOST 26169-84 Radioelectronic equipment electromagnetic compatibility. High-power bypolar high-frequency linear transistors, intermodulation component coefficient standards 33.100
31.080.30

27264 1987 　 GOST 27264-87 Power bipolar transistors. Measurement methods 29.200
31.080.30

27299 1987 　 GOST 27299-87 Semiconductor optoelectronic devices terms,definitions and letter symbols of parameters 01.040.31
31.080

27591 1988 　 GOST 27591-88 Power semiconductor modules. Orerall and mounting dimensions 29.200
31.080

28167 1989 　 GOST 28167-89 Semiconductor alternating voltage converters. General specifications 29.200
31.080

28578 1990 　 GOST 28578-90 Semiconductor devices. Mechanical and climatic test methods 31.080

28623 1990 　 GOST 28623-90 Semiconductor devices. Part 10. General specification for discrete devices and integrated circuits 31.080
31.200

28624 1990 　 GOST 28624-90 Semiconductor devices. Part 11. Sectional specification for discrete devices 31.080

28625 1990 　 GOST 28625-90 Semiconductor devices. Discrete devices. Part 3. Signal (including switching) and regulator diodes. Section 2. Blank detail specification for voltage-regulator diodes and voltage-reference diodes, excluding temperature-compensated precision reference diodes 31.080.10

29209 1991 　 GOST 29209-91 Semiconductor devices. Discrete devices and integrated circuits. Part 2. Rectifire diodes 31.080.10

29210 1991 　 GOST 29210-91 Semiconductor devices. Discrete devices. Part 3. Signal (including switching) and regulator diodes 31.080.10

30617 1998 　 GOST 30617-98 Power semiconductor modules. General specifications 31.080.01
31.080.99

50471 1993 　 GOST R 50471-93 Semiconductor photoemitters. Measuring method for halfintensity angle 31.080.99

50638 1994 　 GOST R 50638-94 Electromagnetic compatibility of technical equipment. Semicondactor microvawe oscillator devices and modules. List of EMC parameters and requirements for them. Methods of measurement 33.100
31.080

31.100 電子管

Sort Mk 規格番号規格名称(英語) 国際規格分類
( ICSコードの説明 )

00002-731 1981 　 GOST 2.731-81 Unified system for designe documentation. Graphic identifications in schemes. Electronic tubes and valves 01.080.40
31.100

00004-443 1986 　 GOST 4.443-86 Product-quality index system. Colour picture tubes. Index nomenclature 03.120
33.160.25
31.100

00004-444 1986 　 GOST 4.444-86 Product-quality index system. Black-and-white picture tubes. Index nomenclature 03.120
33.160.25
31.100

00029-05-006 1985 　 GOST 29.05.006-85 System of ergonomie requirements and ergonomic assurance standards. Cathode-ray receiver tules. General ergonomic requirements 13.180
31.100

01914 1981 　 GOST 1914-81 Oscillator, amplifier, rectifier, control and modulator tubes with anode dissipated power more than 25 W. General specification 31.100

02182 1975 　 GOST 2182-75 Electric vacuum devices. Anode and filament voltage 31.100

03839 1970 　 GOST 3839-70 Low-power electronic tubes. Test methods for life cycle 31.100

07428 1974 　 GOST 7428-74 Amplifying, ractifying and transmitting tubes of anode dissipated power to 25 W and vacuum display tubes for wide aplication designs. General specifications 31.100

07842 1971 　 GOST 7842-71 Electronic tubes and valves. Compatibility dimensions. Pin alignment. Gauges 31.100

08090 1973 　 GOST 8090-73 Receiving and transmitting tubes and valves with long anode dissipation up to 25 W. Method of measurement of filament or heater voltage and current 31.100

08106 1970 　 GOST 8106-70 Low-power vacuum valves. Methods of internal shorts and breaks tests 31.100

10413 1984 　 GOST 10413-84 Black-and-white picture tubes. General specifications 31.100

11163 1984 　 GOST 11163-84 Gas-discharge devices. General specifications 31.100

12491 1967 　 GOST 12491-67 Cathod-ray tubes for reception. Method of measurement of screen brilliancy 31.100

13820 1977 　 GOST 13820-77 Electronic tubes. Terms and definitions 01.040.31
31.100

14205 1984 　 GOST 14205-84 Cathode-ray camera tubes. General specifications 31.100

15177 1970 　 GOST 15177-70 Transparent silica glass tubes for light sources 81.040.30
29.140
31.100

15962 1984 　 GOST 15962-84 Cathode-ray receptive tubes. General specifications 31.100

16755 1971 　 GOST 16755-71 Cathode-ray receiver devices. Method for measurement of irregularity fluorescent screen brightness 31.100

17450 1978 　 GOST 17450-78 Pulsed thyratrons. Main parameters 31.100

17451 1978 　 GOST 17451-78 Pulsed gas filled rectifiers. Main characteristics 31.100

17452 1978 　 GOST 17452-78 Ignitrons. Basic parameters 31.100

17457 1972 　 GOST 17457-72 Glow discharge thyratrons tubes. Basic parameters 31.100

17487 1972 　 GOST 17487-72 Display tubes with electromagnetic deflection. Basic parameters and dimensions 31.100

17489 1972 　 GOST 17489-72 Vidicons, X-ray. Basic parameters and dimensions 31.100

17639 1972 　 GOST 17639-72 Kinescopes for black-and-white television receivers. Test method for guaranted operating time 31.100

17791 1982 　 GOST 17791-82 Cahtode-ray devices. Terms and definitions 01.040.31
31.100

17793 1977 　 GOST 17793-77 Kinescopes for monochrome television. Main parameters 31.100

18485 1973 　 GOST 18485-73 Modulator tubes for operation in pulse conditions. Methods for measurement of electrodes pulse voltages 31.100

18571 1973 　 GOST 18571-73 Kinescopes for color television. Method of contrast measurement 31.100

18588 1973 　 GOST 18588-73 Kinescopes for color and black-and-white television. Method of measuring coefficient of cathode quality 31.100

18720 1990 　 GOST 18720-90 Television camera tubes. Methods of measuring for parameters 31.100

18720-08 1980 　 GOST 18720.8-80 Television camera tubes. Method of measuring for lag 31.100

18720-09 1976 　 GOST 18720.9-76 Television camera tubes. Methods of measurement for dark current and dark current nonuniformity 31.100

18720-10 1976 　 GOST 18720.10-76 Television camera tubes. Methods of measurement for black and white background nonuniformity 31.100

18720-11 1976 　 GOST 18720.11-76 Television camera tubes. Methods of measurement for signal-tu-noise ratio 31.100

18720-12 1977 　 GOST 18720.12-77 Television camera tubes. Methods of plotting for afterimage 31.100

18720-13 1977 　 GOST 18720.13-77 Television camera tubes. Methods of plotting index gamma of light characteristic 31.100

18720-14 1977 　 GOST 18720.14-77 Television camera tubes. Methods of plotting for contrast sensitivity 31.100

18720-15 1977 　 GOST 18720.15-77 Television camera tubes. Method of measuring for readiness time 31.100

18720-16 1985 　 GOST 18720.16-85 Television camera tubes. Methods of measuring ent-off voltage and modulation voltage 31.100

18720-17 1985 　 GOST 18720.17-85 Television camera tubes. Determination of background quality 31.100

18720-18 1985 　 GOST 18720.18-85 Television camera tubes. Methods of measuring insulation resistance and leakage cuvvent between electrodes 31.100

18862 1973 　 GOST 18862-73 Kinescopes for black-and-white television. Method of contrast measurement 31.100

18933 1973 　 GOST 18933-73 Picture tubes (kinescopes). Explosion proof test methods 31.100

19139 1973 　 GOST 19139-73 Kinescopes for black-and-white and color TV. Methods of resolution measurement 31.100

19438-00 1980 　 GOST 19438.0-80 Low powered electronic tubes. Method of measurements of parameters. General principles 31.100

19438-01 1974 　 GOST 19438.1-74 Receiving amplifier and transmitting tubes with power to 25 watt continuously scattered by anode. Measurement methods of dynamic amplification factor and amplificating asymmetri at LF 31.100

19438-02 1974 　 GOST 19438.2-74 Low-power electronic tubes. Methods of measurement of direct interelectrode capacitances 31.100

19438-03 1974 　 GOST 19438.3-74 Low-power electronic tubes and valves. Method of measurement of insulation resistance between electrodes and between electrodes and all other elements of tubes and valves 31.100

19438-04 1974 　 GOST 19438.4-74 Low-power electronic tubes. Methods of measurement of current of control grids 31.100

19438-06 1975 　 GOST 19438.6-75 Low-power electronic tubes and valves. Methods of measurement of ampleication factor 31.100

19438-07 1975 　 GOST 19438.7-75 Electron low power tubes; Measuring method for steepuess of characteristic 31.100

19438-08 1975 　 GOST 19438.8-75 Low-power electronic tubes and valves. Methods of measurement of current due to the cathode electron emission 31.100

19438-09 1975 　 GOST 19438.9-75 Low-power electronic tubes and valves. Method of measurements of plate resistance 31.100

19438-10 1975 　 GOST 19438.10-75 Low-power electronic tubes or valves. Methods of test and measurement under rectitying conditions 31.100

19438-11 1975 　 GOST 19438.11-75 Low-power electronic tubes or valves. Measuring methods 31.100

19438-12 1975 　 GOST 19438.12-75 Low-power electronic tubes and valves. Methods of measurement of plate current and currents of grids having positive potential 31.100

19438-13 1975 　 GOST 19438.13-75 Low-power electronic tubes and valves. Methods of measurement of conversion transconductance and electrode currents under conversion conditions 31.100

19438-14 1975 　 GOST 19438.14-75 Method of measurement of output power and non-linear distertiens of electronic tubes and valves under test in the conditions of low-frequeneq amplification 31.100

19438-15 1977 　 GOST 19438.15-77 Low-power electronic tubes and valves. Methods of measuring the equivalent resistance of noises 31.100

19438-16 1977 　 GOST 19438.16-77 Low-power vacuum valves. Methods for measurement of input resistance 31.100

19438-17 1977 　 GOST 19438.17-77 Low-power electronic tubes and valves. Methods of measurement of cathode heating time and readiness time 31.100

19438-18 1978 　 GOST 19438.18-78 Low-power electronic tubes. Test methods for multiple switching on and swit ching off the heating voltage 31.100

19438-19 1978 　 GOST 19438.19-78 Low-power electronic tubes. Measurement of microphone effect by method of shock excitation 31.100

19438-20 1979 　 GOST 19438.20-79 Low powered electronic tubes. Method for measurement of the temperature of the bulb 31.100

19438-21 1979 　 GOST 19438.21-79 Low-power electronic tubes and valves for output cascades of TV line scanninp. Methods of measurement of electrice parametres and test for service time 31.100

19748-02 1974 　 GOST 19748.2-74 [?] 31.100

19785 1974 　 GOST 19785-74 Oscillographic electron-beam tubes. Methods for measurement of basic parameters 31.100

19785 1988 　 GOST 19785-88 Cathode-ray tubes for reception. Methods for measurement and control of parameters 31.100

20271-01 1991 　 GOST 20271.1-91 Microwave electronic devices. Methods of measuring electrical parameters 31.100

20271-03 1991 　 GOST 20271.3-91 Microwave electronic devices. Methods of measuring of modulating impulse parameters 31.100

20412 1975 　 GOST 20412-75 Oscillator, modulator and regulation tube. Terms and definitions 01.040.31
31.100

20526 1982 　 GOST 20526-82 Vacuum photoelectronic devices. Terms and definitions 01.040.31
31.100

20724 1983 　 GOST 20724-83 Gas discharge devices. Terms and definitions 01.040.31
31.100

21011-00 1975 　 GOST 21011.0-75 High-voltage kenotrons. Methods measurements of electric parameters. General requirements 31.100

21011-01 1976 　 GOST 21011.1-76 High-voltage kenotrons. The anode current measurement method 31.100

21011-02 1976 　 GOST 21011.2-76 High-voltage kenotrons. The anode current measurement method within the voltage pulse 31.100

21011-03 1977 　 GOST 21011.3-77 High-voltage kenotrons. Heater current measuring method 31.100

21011-04 1977 　 GOST 21011.4-77 High-voltage kenotrons. Test methods of electric strength 31.100

21011-05 1978 　 GOST 21011.5-78 High-voltage kenotrons. Methods of measurement of cathode heatting time and readiness time controlling 31.100

21011-06 1978 　 GOST 21011.6-78 High-voltage kenotrons. Test method for multiple switching on and switching off the heating voltage 31.100

21011-07 1980 　 GOST 21011.7-80 High-voltage kenotrons. The emission current measurement method 31.100

21059-00 1975 　 GOST 21059.0-75 Kinescopes for black-white and colour television. General statements of measuring electric and light emitting parameters 31.100
33.160.25

21059-01 1975 　 GOST 21059.1-75 Picture tubes for TV. Methods for measurement of screen brightness and uniformity of screen brilliancy 31.100

21059-02 1975 　 GOST 21059.2-75 Kinescopes for black-and-white and colour television. Methods for determination of gassing coefficient 31.100

21059-03 1975 　 GOST 21059.3-75 Colour television picture tubes. Method for determination of value gamma 31.100

21059-04 1976 　 GOST 21059.4-76 Black-white and colour television picture tubes. Method of measurement of external conductive coating resistances 31.100

21059-05 1976 　 GOST 21059.5-76 Kinescopes for black-white and colour television. Measurement methods of chromacity and non-uniformity of screen glow chromacity 31.100

21059-06 1979 　 GOST 21059.6-79 Monochrome and colour TV picture tubes. Measurement techniques of heater current, anode current and cathode current 31.100

21059-07 1979 　 GOST 21059.7-79 Monochrome and colour TV picture tubes. Leakage current measurement technique 31.100

21059-08 1979 　 GOST 21059.8-79 Monochrome and colour TV picture tubes. Measurement techniques of cut-off voltage 31.100

21059-09 1979 　 GOST 21059.9-79 Monochrome and colour TV picture tubes. Modulating voltage measurement techniques 31.100

21059-10 1979 　 GOST 21059.10-79 Monochrome and colour TV picture tubes. Measurement technique of focusing voltage 31.100

21106-00 1975 　 GOST 21106.0-75 Oscillator, modulator and regulation tubes anode dissipated power more than 25 W. Method of measurements of electrical parameters. General principles 31.100

21106-01 1975 　 GOST 21106.1-75 Oscillator, modulator and regulation tubes; anode dissipated power more than 25 W. Test method for multiple switching on and switching off the heating voltage 31.100

21106-02 1975 　 GOST 21106.2-75 Oscillator tubes anode dissipated more than 25 W. Test method for relative level of combinative products 31.100

21106-03 1976 　 GOST 21106.3-76 Oscillator tubes with anode dissipation above 25 W. Method of electric strength test 31.100

21106-04 1976 　 GOST 21106.4-76 Modulator flash tubes with anode dissipation above 25 W. Method of electric strength test 31.100

21106-05 1977 　 GOST 21106.5-77 Oscillator, modulator and regulation tubes; anode dissipated power more than 25 W. Methods of measurement of filament current and voltage 31.100

21106-06 1977 　 GOST 21106.6-77 Oscillator, modulator and regulation tubes with anode dissipated power above 25 W. Measurement methods of currents of anode and grids, having positive voltage relative to cathode and zero anode and grids currents 31.100

21106-07 1977 　 GOST 21106.7-77 Oscillator, modulator and regulation tubes with anode dissipated power above 25 W. Method of measurement of cathode current 31.100

21106-08 1977 　 GOST 21106.8-77 Oscillator, modulator and regulation tubes with anode dissipated power above 25 W. Methods of measurements of cathode emission 31.100

21106-09 1977 　 GOST 21106.9-77 Oscillator, modulator and regulation tubes with anode dissipated power above 25 W. Method of measurements of pulse anode and grids currents 31.100

21106-10 1977 　 GOST 21106.10-77 Oscillator, modulator and regulation tubes with anode dissipated power above 25 W. Methods of measurements of reverse control grid and anode currents 31.100

21106-11 1977 　 GOST 21106.11-77 Oscillator, modulator and regulation tubes with anode dissipated power above 25 W. Methods of measurements of thermionic control grid current 31.100

21106-12 1977 　 GOST 21106.12-77 Oscillator, modulator and regulation tubes with anode dissipated power above 25 W. Method of measurement of leakage currents between electrodes and between cathode and heater 31.100

21106-13 1978 　 GOST 21106.13-78 Oscillator, modulator and regulation tubes with anode dissipated power above 25 W. Methods of measurement of direct interelectrode capacitances 31.100

21106-14 1978 　 GOST 21106.14-78 Oscillator, modulator and regulation tubes with anode dissipated power above 25 W. Methods of cut-off voltage (bias), trans. Conductance and amplification factor measurements 31.100

21106-15 1979 　 GOST 21106.15-79 Modulator pulse tubes with anode dissipated power above 25 W. Method of control of starting time 31.100

21106-16 1979 　 GOST 21106.16-79 Oscillator tubes with anode dissipated power above 25 W. Measurement methods of power, input voltage and determination frequency characteristics 31.100

21107-00 1975 　 GOST 21107.0-75 Gas discharge devices. Methods of measurement of electrical parameters. General principles 31.100

21107-01 1975 　 GOST 21107.1-75 Gas discharge devices. Methods of measurement of electrical parameters of stabilizing tube 31.100

21107-02 1975 　 GOST 21107.2-75 Gas discharge devices. Methods of measurement of electrical parameters of hot-cathode thyratrons and gas-filled rectifiers 31.100

21107-03 1975 　 GOST 21107.3-75 Gas discharge devices. Decatrons. Polyatrons. Methods for measurement of electrical parameters 31.100

21107-04 1975 　 GOST 21107.4-75 Gas discharge devices. Ignitrons. Methods for measurement of parameters 31.100

21107-05 1975 　 GOST 21107.5-75 Gas discharge devices. Methods of measurement of electrical parameters of glow-discharge thyratrons and gas-filled rectifiers 31.100

21107-06 1975 　 GOST 21107.6-75 Gas discharge devices. Methods of measurement of electrical parameters of charactes display 31.100

21107-07 1975 　 GOST 21107.7-75 Gas discharge devices. Methods of measurement of electrical parameters of spark discharges 31.100

21107-08 1976 　 GOST 21107.8-76 Gas discharge devices. Measuring methods of electrical characteristics of impulsive diodes 31.100

21107-09 1976 　 GOST 21107.9-76 Gas-discharge devices. Methods of measurement of electrial parameters of pulse thyratrons 31.100

21107-10 1978 　 GOST 21107.10-78 Gas discharge devices. Methods of measurement of electrical parameters of operating and measuring conditions for glow-discharge thyratrons and gas-filled rectifiers 31.100

21107-11 1978 　 GOST 21107.11-78 Gas discharge devices. Methods of measurement of electrical parameters of operating and measuring conditions for glow-discharge indicators 31.100

21107-12 1978 　 GOST 21107.12-78 Gas discharge devices. Methods of measurement of electrical parameters of operating and measuring conditions for spark discharges 31.100

21107-13 1978 　 GOST 21107.13-78 Gas discharge devices. Methods of measurement of electrical parameters of operating and measuring conditions for pulsed thyratrons and gas-filled rectifiers 31.100

21107-14 1980 　 GOST 21107.14-80 Gas discharge devices. Methods of the measurement of electrical parameters of tacitrons 31.100

21815-04 1986 　 GOST 21815.4-86 Image intensifier and image converter tubes. Method of measuring the background brightness 31.100

21815-05 1986 　 GOST 21815.5-86 Image intensifier and image converter tubes. Check of the testing voltage 31.100

21815-13 1986 　 GOST 21815.13-86 Image intensifier and image converter tubes. Method of measuring the angular displacement of the image 31.100

22052 1976 　 GOST 22052-76 Vidicons. Basic dimensions 31.100

22060 1976 　 GOST 22060-76 Subminiature electron glass-type valves and tubes. Basic dimensions 31.100

22603 1977 　 GOST 22603-77 Black-and-white television picture tubes. Basic dimensions 31.100

23010 1978 　 GOST 23010-78 Glow-discharge indicators. Basic parameters 31.100

23012 1978 　 GOST 23012-78 Devices multiposition counting indicated and sivitching. Basic parameters 31.100

23769 1979 　 GOST 23769-79 Electronic tubes and microwave protection devices. Terms, definitions and latter symbols 01.040.31
31.100

24127 1980 　 GOST 24127-80 Continuous operation gas-discharge lamps. Terms and definitions 01.040.31
31.100

25793 1983 　 GOST 25793-83 Broad band oscillograph tubes. Methods of parameters measurement 31.100

26799 1985 　 GOST 26799-85 Color picture tubes. Specifications 31.100

27810 1988 　 GOST 27810-88 Cathode-ray converter tubes. Measurement and control methods of parameters 31.100

27943 1988 　 GOST 27943-88 Photosensitive sharge transfer devices. General specifications 31.100

28176 1989 　 GOST 28176-89 Colour television picture tubes. Methods of measuring parameters 31.100

28855 1990 　 GOST 28855-90 Cathode-ray tubes for reception. Supply and driving voltages standards 31.100

30831 2002 　 GOST 30831-2002 Gaseous discharge pulsed and continuous sources of high-intensity optical radiation. Methods of electrical and radiation parameters measuring 31.100

51050 　 GOST R 51050-97 Deflection yoke systems. Methods of measurement and control of parameters 31.100

31.120 電子表示装備
注: 液晶ディスプレィ装置を含む。

Sort Mk 規格番号規格名称(英語) 国際規格分類
( ICSコードの説明 )

20186 1974 　 GOST 20186-74 Vacuum luminescent display tubes. Basic parameters 31.120

21803-01 1976 　 GOST 21803.1-76 Vacuum enclosed prove tubes. Methods of measurement of heater voltage and current 31.120

21803-02 1976 　 GOST 21803.2-76 Vacuum enclosed prove tubes. Methods of measurement of plate current of segment 31.120

21803-03 1976 　 GOST 21803.3-76 Vacuum enclosed prove tubes. Method of measurement of current of grid having positive potential with respect to cathode 31.120

23618 1979 　 GOST 23618-79 Products made of ferrites and magnetodielectrics. Terms and definitions 01.040.31
31.120

24354 1980 　 GOST 24354-80 Semiconductor character displays. Basic dimensions 31.120

24891 1981 　 GOST 24891-81 Plasma signal produce displays. Basic parameters 31.120

25024-00 1983 　 GOST 25024.0-83 Signal produce displays. General requirements to parameter measurement 31.120

25024-01 1981 　 GOST 25024.1-81 Signal produce displays. Method of response time measuring 31.120

25024-02 1983 　 GOST 25024.2-83 Signal produce displays. Measuring methods of response and relaxation time 31.120

25024-03 1983 　 GOST 25024.3-83 Signal produce displays. Measuring methods of current and voltage 31.120

25024-04 1985 　 GOST 25024.4-85 Character displays. Methods measuring brightness, luminous intensity, irregularity of brightness and irregularity of luminious intensity 31.120

25024-05 1987 　 GOST 25024.5-87 Charachter displays. Methods measuring inherent brightness contrast, irregularity of inherent brightness contrast 31.120

25024-06 1988 　 GOST 25024.6-88 Gas discharge matrix, sign synthesizing indicators. Methods of measuring the electric parameters 31.120

25024-07 1990 　 GOST 25024.7-90 Character displays. Methods of measuring spectral characteristics and chromaticity coordinates 31.120

25066 1991 　 GOST 25066-91 Character displays. Terms, definitions and letter symbols 01.040.31
31.120

50446 1992 　 GOST R 50446-92 Gas-discharge sign-synthesizing indicators. Method of frequency time measaring characteristics 31.120

50923 1996 　 GOST R 50923-96 Displays. Operator's workplace. General ergonomic requirements and environmental requirements. Measuring methods 13.180
31.120

50948 2001 　 GOST R 50948-2001 Display means for individual use. General ergonomic requirements and safety requirements 31.120
13.180
13.100

50949 2001 　 GOST R 50949-2001 Display means for individual use. Methods of measurement and assessment of ergonomic and safety parameters 13.180
31.120
13.100

52871 2007 ★ GOST R 52871-2007 Displays for visually impaired. Requirements and characteristics 11.180.30
31.120

31.140 圧電素子及び誘電素子

Sort Mk 規格番号規格名称(英語) 国際規格分類
( ICSコードの説明 )

18669 1973 　 GOST 18669-73 Piezoelectric resonators. Terms and definitions 01.040.31
31.140

18670 1973 　 GOST 18670-73 Piezoelectric filters. Terms and definitions 01.040.31
31.140

21712 1983 　 GOST 21712-83 Piezoelectric resonators. Main characteristics 31.140

22866 1977 　 GOST 22866-77 Crystal oscillators. Terms and definitions 01.040.31
01.040.33
31.140

23546 1984 　 GOST 23546-84 Piezoelectric resonators. General specifications 31.140

27124 1986 　 GOST 27124-86 Piezoelectric rezonators for industrial and domestic radioelectronic equipment application. Basic parameters 31.140

31.160 電気フィルタ

Sort Mk 規格番号規格名称(英語) 国際規格分類
( ICSコードの説明 )

00008-0553 1988 　 GOST 8.553-88 State system for ensuring the uniformity of measurements. Electronic octave and third-octave filters. Methods and means of calibration 17.020
31.160

17168 1982 　 GOST 17168-82 Filters electrical octave and third-octave. General technical requirements and methods of testing 31.160

17597 1978 　 GOST 17597-78 Low frequency rectiefir filter chokes. Basic parameters 31.160

18670 1984 　 GOST 18670-84 Piezoelectric and electromechanical filters. Terms and definitions 01.040.31
31.160

21281 1982 　 GOST 21281-82 Piezoelectric filters. Main parameters 31.160

27075 1986 　 GOST 27075-86 Piezoelectric filters for industrial and domestic radioelectronic equipment application. Basic parameters 31.160

30382 1995 　 GOST 30382-95 Electromagnetic compatibility of technical means. Throttles for interference suppression. General specifications 31.160
33.100

50013 1992 　 GOST R 50013-92 Electromagnetic compatibility of technical means. Throttles for interference suppression. General specifications 31.160
33.100

31.180 プリント回路及びプリント配線板

Sort Mk 規格番号規格名称(英語) 国際規格分類
( ICSコードの説明 )

00002-417 1991 　 GOST 2.417-91 Unified system for design documentation. Printed circuit boards. Rules for making drawings 01.100.25
31.180

00002-755 1987 　 GOST 2.755-87 Unified system for design documentation. Graphic designations in electric diagrams. Commutational devices and contact connections 01.080.40
31.180

00002-756 1976 　 GOST 2.756-76 Unified system for design documentation. Graphic designations in diagrams. The receiving part of electromechanical devices 01.080.40
31.180

00002-758 1981 　 GOST 2.758-81 Unified system for design documentation. Graphic designations in diagrams. Signal techniqe 01.080.40
31.180

00002-759 1982 　 GOST 2.759-82 Unified system for design documentation. Graphic designations in diagrams. Elements of analogue technique 01.080.40
31.180

00002-762 1985 　 GOST 2.762-85 Unified system for design documentation. Graphic designations in electric diagrams. Frequencies and frequency ranges for transmission systems with friquency division of channels 01.080.40
31.180

00002-763 1985 　 GOST 2.763-85 Unified system for design documentation. Graphic designations in electric diagrams. Devices of pulse-code modulation 01.080.40
31.180

00002-764 1986 　 GOST 2.764-86 Unified system for design documentation. Graphic designations in electric diagrams. Integral optoelectronic elements of indication 01.080.40
31.180

00002-765 1987 　 GOST 2.765-87 Unified system of design documentation. Graphical identification on electric diagrams. Storage 01.080.40
31.180

00002-766 1988 　 GOST 2.766-88 Unified system of design documentation. Graphic symbols for use in electric schemes, systems of information transmission with temporal division of canals 01.080.40
31.180

00002-768 1990 　 GOST 2.768-90 Unified system for design documentation. Graphical symbols for diagrams. Electrochemical, electrothermal and heat sources 01.080.40
31.180

00002-770 1968 　 GOST 2.770-68 Unified system for design documentation. Graphic designation in diagrams. Cinematic elements 01.080.40
31.180

00003-1428 　 GOST 3.1428-91 Unified system for technological documentation. Rules of making documents on technological processes (operations) for production of printing plates 01.110
31.180

10317 1979 　 GOST 10317-79 Printed circuit boards. Basic dimensions 31.180

17467 1988 　 GOST 17467-88 Integrated microcircuits. Basic dimentions 31.180
31.200

20406 1975 　 GOST 20406-75 Printed boards. Terms and definitions 01.040.31
31.180

22318 1977 　 GOST 22318-77 Printed circuit junction wires. Types, construction and dimensions, technical requirements 31.180

23661 1979 　 GOST 23661-79 Multilayer printed circuit boards. Requirements to standard technological pressing process 31.180

23662 1979 　 GOST 23662-79 Printed circuit boards. Production of blanks, location and technological holes. Requirements for type technological processes 31.180

23663 1979 　 GOST 23663-79 Printed circuit boards. Mechanical surface stripping. Requirements for type technological process 31.180

23664 1979 　 GOST 23664-79 Printed circuit boards. Production of plated through and mounting holes. Requirements for type technological processes 31.180

23665 1979 　 GOST 23665-79 Printed circuit boards. Profile cutting. Requirements for type technological processes 31.180

23751 1986 　 GOST 23751-86 Printed circuit boards. Basis parameters of structure 31.180

23752 1979 　 GOST 23752-79 Printed circuit boards. General specifications 31.180

23752-01 1992 　 GOST 23752.1-92 Printed circuit boards. Test methods 31.180

23770 1979 　 GOST 23770-79 Printed circuit boards. Requirements for a typical technological process of chemical and galvanic metallization 31.180

26164 1984 　 GOST 26164-84 Printed boards for item export delivery. Grid pitches 31.180

26246-00 1989 　 GOST 26246.0-89 Foil-clad electrical insulating materials for manufacture of printed plates. Test methods 29.035.99
31.180

26246-01 1989 　 GOST 26246.1-89 Phenol impregnated cellulose paper foil-clad electrical insulating material for printed plates, high electrical quality. Specifications 29.035.10
31.180

26246-02 1989 　 GOST 26246.2-89 Phenol-impregnated cellulose paper foil-clad electrical insulating material for printed plates, economic quality. Specifications 29.035.10
31.180

26246-03 1989 　 GOST 26246.3-89 Epoxide impregnated cellulose paper foil-clad electrical insulating material of rated combustibility for printed plates. Specifications 29.035.10
31.180

26246-04 1989 　 GOST 26246.4-89 Epoxide-impregnated glass fabric foil-clad electrical insulating material of general use for printed plates. Specifications 29.035.30
31.180

26246-05 1989 　 GOST 26246.5-89 Epoxide impregnated glass fabric foil-clad electrical insulating material of rated combustibility for printed plates. Specifications 29.035.30
31.180

26246-06 1989 　 GOST 26246.6-89 Phenol impregnated cellulose paper foil-clad electrical insulating material of rated combustibility for printed plates. Specifications 29.035.10
31.180

26246-07 1989 　 GOST 26246.7-89 Phenol impregnated cellulose paper foil-clad electrical insulating material of rated combustibility for printed plates. Specifications 29.035.10
31.180

26246-08 1989 　 GOST 26246.8-89 Metal-clad polyester film for flexible printed plates. Specifications 29.035.20
31.180

26246-09 1989 　 GOST 26246.9-89 Electric insulating metal-clad material of rated combustibility for printed plates base on non-woven epoxide impregnated glass fabric. Specifications 29.035.30
31.180

26246-10 1989 　 GOST 26246.10-89 Thin epoxide impregnated glass fabric foil-clad electrical insulating material of general use for multilayer printed plates. Specifications 29.035.30
31.180

26246-11 1989 　 GOST 26246.11-89 Thin epoxide-impregnated glass fabric foil-clad electrical insulating material of rated combustibility for multilayer printed plates. Specifications 29.035.30
31.180

26246-12 1989 　 GOST 26246.12-89 General-purpose polyimide foil-clad film for flexible printed plates. Specifications 29.035.20
31.180

26246-13 1989 　 GOST 26246.13-89 Polyimide foil-clad film of rated combustibility for flexible printed plates. Specifications 29.035.20
31.180

26246-14 1991 　 GOST 26246.14-91 Foil-clad electrical insulating materials for manufacture of printed plates. Prepreg for use as bonding sheet material in the fabrication of multilayer printed boards. Specifications 29.035.20
31.180

27200 1987 　 GOST 27200-87 Printed circuit boards. Rules of repair work 31.180

27716 1988 　 GOST 27716-88 Masks for printed boards. General specifications 31.180

29137 1991 　 GOST 29137-91 Lead forming and electronic component insertion onto PC boards. General requirements and design specifications 31.180

50562 1993 　 GOST R 50562-93 Originals and marks of printed circuit boards. General requirements for unit manufacturing methods 31.180

50621 1993 　 GOST R 50621-93 Single and double sided printed boards with plain holes. General specifications 31.180

50622 1993 　 GOST R 50622-93 Double sided printed boards with plated-through holes. General specifications 31.180

50624 1993 　 GOST R 50624-93 Epoxide cellulose paper core, epoxide glass cloth surfaces copper-clad electrical insulating material laminated sheet of defined flammability (vertical burning test). Specifications 29.035.10
31.180
29.035.99

50625 1993 　 GOST R 50625-93 Phenolic cellulose paper copper-clad electrical insulating material laminated sheet of defined flammability (vertical burning test), economic quality. Specifications 29.035.10
31.180

50626 1993 　 GOST R 50626-93 Printed boards. Basic rules for composition of specifications 31.180

51039 1997 　 GOST R 51039-97 Printed boards. Requirements for rework and repair 31.180

51040 1997 　 GOST R 51040-97 Printed boards. Grid systems 31.180

31.190 電子部品の実装

Sort Mk 規格番号規格名称(英語) 国際規格分類
( ICSコードの説明 )

00020-57-406 1981 　 GOST 20.57.406-81 Complex quality control system. Electronic, quantum electronic and electrotechnical components. Test methods 03.120.10
31.190

25360 1982 　 GOST 25360-82 Electronic components. Acceptance rules 03.120.10
31.190

31.200 集積回路．マイクロエレクトロニクス
注: エレクトロニックチップ、論理及びアナログマイクロストラクチュアを含む。
注: マイクロプロセッサ→ 35.160

Sort Mk 規格番号規格名称(英語) 国際規格分類
( ICSコードの説明 )

00004-465 1987 　 GOST 4.465-87 Product-quality index system. Integratet circuits. Index nomenclature 03.120
31.200

17021 1988 　 GOST 17021-88 Integrated circuits. Terms and definitions 01.040.31
31.200

17230 1971 　 GOST 17230-71 Integrated microcircuits. Supply voltage range 31.200

17447 1972 　 GOST 17447-72 Integrated circuits for digital computers and discrete automatic systems. Basic parameters 31.200

17467 1988 　 GOST 17467-88 Integrated microcircuits. Basic dimentions 31.180
31.200

18683-00 1983 　 GOST 18683.0-83 Digital integrated circuits. General requirements for measuring electrical parameters 31.200

18683-01 1983 　 GOST 18683.1-83 Digital integrated circuits. Methods for measuring static electrical parameters 31.200

18683-02 1983 　 GOST 18683.2-83 Digital integrated cirсuits. Methods of measuring dynamic electrical parameters 31.200

18725 1983 　 GOST 18725-83 Integrated circuits. General specifications 31.200

19480 1989 　 GOST 19480-89 Integrated circuits. Terms, definitions and letter symbols of electrical parameters 01.040.31
31.200

19799 1974 　 GOST 19799-74 Analog integrated circuits. Methods for measurement of electric parameters and determination of responses 31.200

20281 1974 　 GOST 20281-74 Micromodules of stacked and spaced construction. Measuring methods of electrical characteristics 31.200

23070 1978 　 GOST 23070-78 Computerized circuits analysis and optimization. Terms and definitions 01.040.31
31.200

23089-00 1978 　 GOST 23089.0-78 Integrated circuits. General requirements at measuring electrical parameters of operational amplifiers and voltage comparators 31.200

23089-01 1983 　 GOST 23089.1-83 Integrated circuits. Method of measuring the operational amplifiers and voltage comparators gain 31.200

23089-02 1983 　 GOST 23089.2-83 Integrated circuits. Method of measuring the operational amplifiers maximum output voltage 31.200

23089-03 1983 　 GOST 23089.3-83 Integrated circuits. Methods of measuring the operational amplifiers and voltage comparators zero offset voltage and emf 31.200

23089-04 1983 　 GOST 23089.4-83 Integrated cirсuits. Method of measuring the input currents and input bias current of operational amplifiers and voltage comparators 31.200

23089-05 1983 　 GOST 23089.5-83 Integrated circuits. Method of measuring the operational amplifiers and voltage comparators consumption current and power 31.200

23089-06 1983 　 GOST 23089.6-83 Integrated circuits. Method of measuring the operational amplifiers output voltage settling time 31.200

23089-07 1983 　 GOST 23089.7-83 Integrated circuits. Method of measuring the power sources instability effect on the operational amplifiers zero drift voltage and emf 31.200

23089-08 1983 　 GOST 23089.8-83 Integrated circuits. Method of measuring the operational amplifiers average temperature voltage drift and zero offset emf 31.200

23089-09 1983 　 GOST 23089.9-83 Integrated circuits. Method of measuring the operational amplifiers input bias current temperature drift and input currents 31.200

23089-10 1983 　 GOST 23089.10-83 Integrated circuits. Method of measuring the operational amplifiers output voltage maximum build-up rate and time 31.200

23089-11 1983 　 GOST 23089.11-83 Integrated circuits. Methods of measuring the operational amplifiers and voltage comparators input common mode voltage rejection ratio 31.200

23089-12 1986 　 GOST 23089.12-86 Intergated microcircuits. Methods for measuring noise parameters of operational amplifiers 31.200

23089-13 1986 　 GOST 23089.13-86 Integrated microcircuits. Measurement methods of the operational amplifiers cut-off frequency and unitary-gain frequency 31.200

23089-14 1988 　 GOST 23089.14-88 Integrated microcircuits. Methods for measuring delay time of the switching on/off the voltage comparators 31.200

23089-15 1990 　 GOST 23089.15-90 Integrated microcircuits. Method of measuring full power frequency of operational amplifiers 31.200

23089-16 1990 　 GOST 23089.16-90 Integrated microcircuits. Method of measuring phase stability margin of operational amplifiers 31.200

23089-17 1990 　 GOST 23089.17-90 Integrated microcircuits. Methods of measuring input and output resistances of operational amplifiers 31.200

23622 1979 　 GOST 23622-79 Logic elements of integrated circuits. Basic parameters 31.200

24459 1980 　 GOST 24459-80 Intergated microcircuits for storages and its elements. Basic parameters 31.200

24460 1980 　 GOST 24460-80 Intergated microcircuits for digital devices. Basic parameters 31.200

24613-00 1981 　 GOST 24613.0-81 Optoelectronic integrated microcircuits and opto-couples. General requirements at measuring of electrical parameters 31.200

24613-01 1981 　 GOST 24613.1-81 Optoelectronic integrated microcircuits and opto-couples. Methods for measuring of input-to-output capacitance 31.200
31.260

24613-02 1981 　 GOST 24613.2-81 Optoelectronic integrated microcircuits and opto-couples. Method for measuring leatage current 31.200
31.260

24613-03 1981 　 GOST 24613.3-81 Optoelectronic integrated microcircuits and opto-couples. Method for measuring input voltage 31.200
31.260

24613-04 1981 　 GOST 24613.4-81 Electronic integrated microcircuits. Method of switsching on and switching off time measurement of commutators of analog signals and load 31.200
31.260

24613-05 1981 　 GOST 24613.5-81 Optoelectronic integrated microcircuits. Method of zero remnant voltage measurement of commutators of analog signals and load 31.200
31.260

24613-06 1981 　 GOST 24613.6-81 Optoelectronic integrated microcircuits and opto-couples. Metod for measuring isolation voltage 31.200
31.260

24613-07 1983 　 GOST 24613.7-83 Resistor opto-couples. Method for measuring light and dark output resistance 31.200
31.260

24613-08 1983 　 GOST 24613.8-83 Optoelectronic integrated microcircuits and opto-couples. Methods for measuring critical change rate of dielectric voltage 31.200
31.260

24613-09 1983 　 GOST 24613.9-83 Optoelectronic integrated microcircuits and optocouplers. Method for measuring switching times 31.200

24613-10 1977 　 GOST 24613.10-77 Optoelectronic integrated microcircuits. Method for measuring noise current and noise voltage for low and high levels of logic signal switches 31.200
31.260

24613-11 1977 　 GOST 24613.11-77 Optoelectronic integrated microcircuits. Method for measuring input voltage for low and high levels of logic signal switches 31.200
31.260

24613-12-1977 　 GOST 24613.12-77 Optoelectronic integrated microcircuits. Method for measuring output voltage for low and high levels of logic signal switches 31.200
31.260

24613-13 1977 　 GOST 24613.13-77 Optoelectronic integrated microcircuits. Method for measuring short circuit of logic signal switches 31.200
31.260

24613-14 1977 　 GOST 24613.14-77 Optoelectronic integrated microcircuits. Method for measuring consumption currents of low and high levels of logic signal switches 31.200
31.260

24613-15 1977 　 GOST 24613.15-77 Optoelectronic integrated microcircuits. Method for measuring consumption carrent of switching and its duration of logic signal switches 31.200
31.260

24613-16 1977 　 GOST 24613.16-77 Optoelectronic integrated microcircuits. Method for measuring initial residual voltage of analogue signal commutators 31.200
31.260

24613-17 1977 　 GOST 24613.17-77 Optoelectronic integrated microcricuits. Method for measuring output differential resistance of analogue signal commutators 31.200
31.260

24613-18 1977 　 GOST 24613.18-77 Optoelectronic integrated microcircuits and opto-couples. Methods for measuring isolation resistance 31.200

24613-19 1977 　 GOST 24613.19-77 Optoelectronic integrated microcircuits and optocouplers. Method for measuring current transfer ratio 31.200

26949 1986 　 GOST 26949-86 Integrated microcircuits. Methods for measuring of electrical parameters of continuous voltage regulators 31.200

26975 1986 　 GOST 26975-86 Micro-assemblies. Terms and definitions 01.040.31
31.200

27694 1988 　 GOST 27694-88 Integrated circuits. Low-, intermediate- and high-frequency amplifiers. Methods for measuring electric parameters 31.200

27780 1988 　 GOST 27780-88 Integrated circurts. Multiplexers and switches. Methods for measurement of electric parameters 31.200

28111 1989 　 GOST 28111-89 Bubble memory device. Terms and definitions 01.040.31
31.200

28623 1990 　 GOST 28623-90 Semiconductor devices. Part 10. General specification for discrete devices and integrated circuits 31.080
31.200

28814 1990 　 GOST 28814-90 Integrated circuits. Methods of measuring electrical parameters of puls voltage regulators operation circuits 31.200

29106 1991 　 GOST 29106-91 Semiconductor devices. Integrated circuits. Part 1. General 31.200

29107 1991 　 GOST 29107-91 Semiconductor devices. Integrated circuits. Part 2. Digital integrated circuits 31.200

29108 1991 　 GOST 29108-91 Semiconductor devices. Integrated circuits. Part 3. Analog integrated circuits 31.200

29109 1991 　 GOST 29109-91 Semiconductor devices. Integrated circuits. Part 4. Interface integrated circuits 31.200

30350 1996 　 GOST 30350-96 Analog integrated circuits. General requirements to apparatus and conditions for measurement of electrical parameters 31.200

50044 1992 　 GOST R 50044-92 Integrated microcircuits and semiconductor device service mounted technology. Requirements to packages 31.200

IEC 60748-11-01 2001 　 GOST R IEC 748-11-1-2001 Semiconductor devices integrated circuits. Part 11. Section 1. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits 31.200

31.220 電子及び通信設備用機構部品

Sort Mk 規格番号規格名称(英語) 国際規格分類
( ICSコードの説明 )

05010 1984 　 GOST 5010-84 Tubular fuse links for rated currents to 10a. General specifications 31.220

16541 1976 　 GOST 16541-76 Ring cores of soft ferrites. Main sizes 31.220.99

16840 1978 　 GOST 16840-78 Pinned wire. Design and dimensions 31.220.99

17596 1972 　 GOST 17596-72 Low frequency matehing transformers with a power not exceeding 25 W. Basic parameters 31.220.99
29.180

18096 1987 　 GOST 18096-87 Mica details for electronic devices. Specifications 31.220
73.080

18614 1979 　 GOST 18614-79 Closed E-cores made of magnetically soft ferrites. Basic dimensions 31.220.99

18628 1973 　 GOST 18628-73 Single-phase feeding transformers for main with voltage from 1000 up to 35000 V and a power up to 4000 V A. Basic parameters 31.220.99
33.120.99
29.180

18629 1973 　 GOST 18629-73 Feeding transformers and filter chokes. Seeries of electrics potentials 31.220.99
29.180

18630 1973 　 GOST 18630-73 Puise transformers. Basis parameters 31.220.99
29.180

19104 1988 　 GOST 19104-88 Low-frequency voltage up to 1500 V cylindrical connectors. Basic parameters and dimensions 31.220.10

19150 1984 　 GOST 19150-84 Magnetically-operated sealed switches. General specifications 31.220.99

19197 1973 　 GOST 19197-73 Pot cores of ferrite. Construction and sizes 31.220.99
29.100.10

19726 1979 　 GOST 19726-79 Rond and tubular cores of magnetically soft ferrites. Basic dimensions 31.220.99
29.100.10

19761 1981 　 GOST 19761-81 Push-button and key module switches and circuit breakers. General specifications 31.220.20

20249 1980 　 GOST 20249-80 Plates and platemade magnetoframes designed for transformers and throttles. Type and basic dimensions 31.220.99
29.100.10

20265 1983 　 GOST 20265-83 Connectors, radiofrequency, for general application. Coupling dimensions 31.220.10

21057 1975 　 GOST 21057-75 Top-caps electronic valves or tubes. Types and connecting dimensions 31.220.99

21962 1976 　 GOST 21962-76 Electrical connectors. Terms and definitions 01.040.31
31.220.10

22375 1977 　 GOST 22375-77 Dual-sided leaves fixed by screws and rivets. Design and sizes 31.220.99

22376 1977 　 GOST 22376-77 One-sided leaves fixed by screws and rivets. Design and dimensions 31.220.99

22719 1977 　 GOST 22719-77 Microswitches. Terms and definitions 01.040.31
31.220.20

22742 1977 　 GOST 22742-77 Sets of square connectors fixture of radioelectronic items. Specifications 21.060.01
31.220

23585 1979 　 GOST 23585-79 Mounting of electric and radioelectronic equipment and instruments. Technical requirements for wire screens termination and connection 31.220.10

23586 1979 　 GOST 23586-79 Mounting of electric and radioelectronic equipment and instruments. Technical requirements for braids and their fastening 31.220.10

23586 1996 　 GOST 23586-96 Electrical wiring of radio-electronic equipment and devices. Technical requirements for wire harnesses and their mounting 31.020
29.060
31.220.10

23587 1979 　 GOST 23587-79 Mounting of electric radioelectronic equipment and instruments. Technical requirements for hookup wires termination and conductors fastening 31.220.10
33.120

23587 1996 　 GOST 23587-96 Electrical wiring of radio-electronic equipment and devices. Technical requirements for termination of hookup wires and wire strand attachment 31.020
29.060.10
31.220.10

23588 1979 　 GOST 23588-79 Mounting of electric radioelectronic equipment and instruments. Technical requirements for mounting of connectors A and РП 31.220.10

23589 1979 　 GOST 23589-79 Mounting of electric radioelectronic equipment and instruments. Technical requirements for mounting of connectors РМ and МР 31.220.10

23590 1979 　 GOST 23590-79 Mounting of electric radioelectronic equipment and instruments. Technical requirements for mounting of connectors 2РМ 31.220.10

23591 1979 　 GOST 23591-79 Mounting of electric radioelectronic equipment and instruments. Technical requirements for mounting of connectors ШР, СШР, СШРГ and ШРГ 31.220.10

23592 1996 　 GOST 23592-96 Electrical wiring of radio-electronic equipment and devices. General requirements for three-dimensional wiring of electronic and electrical devices 31.020
29.060
31.220.10

23594 1979 　 GOST 23594-79 Mounting of electric radioelectronic equipment and instruments. Marking 31.220.10
33.120

23784 1984 　 GOST 23784-84 Low-frequency voltages up to 1500 V and rectangular connectors mated set. General specifications 31.220.10

23784 1998 　 GOST 23784-98 Low-frequency low voltage and combined connectors. General specifications 31.220.10

23871 1979 　 GOST 23871-79 Transformers multifunctional electronic and magnetic. Terms and definitions 01.040.31
31.220.99

23873 1979 　 GOST 23873-79 Transformers, multifunctional electronic and magnetic. Basic parameters 31.220.99
29.180

23882 1979 　 GOST 23882-79 Magnetic circuits, tape orthogonal for multifunctional electromagnetic transformers 31.220.99
29.100.10

23920 1979 　 GOST 23920-79 Triple-sided leaves fixed by screws or rivets, or by pressing. Design and sizes 31.220.99

23921 1979 　 GOST 23921-79 Quadruple-sided leaves fixed by screws or rivets, or by pressing. Design and sizes 31.220.99

24011 1980 　 GOST 24011-80 Belt ring magnetic. Construction and dimensions 31.220.99
29.100.10

24606-00 1981 　 GOST 24606.0-81 Switches, hardware and electric connectors. General requirements for measuring electric parameters 31.220

24606-01 1981 　 GOST 24606.1-81 Switches, hardware and electric connectors. Methods for control of insulation dielectric strength 31.220

24606-02 1981 　 GOST 24606.2-81 Switches, hardware and electric connectors. Methods of measuring insulation resistance 31.220

24606-03 1982 　 GOST 24606.3-82 Switching and mocenting components, and electrical connectors. Methods of measurement of contact resistance, and dynamic and static instability of contact transient resistance 31.220

24606-04 1983 　 GOST 24606.4-83 Switches, hardware and connectors. Methods of determination of current-carrying capacity 31.220

24606-05 1983 　 GOST 24606.5-83 Switches, hardware and electric connectors. Method of capacitance measuring 31.220

24606-06 1983 　 GOST 24606.6-83 Switches, hardware and electric connectors. Performance checking in low-level cirenits 31.220

24606-07 1984 　 GOST 24606.7-84 Switching and connecting components and electrical connectors. Methods of control of requirements for design 31.220

25810 1983 　 GOST 25810-83 Sealed ferreed contacts. Methods of measuring electrical parameters 31.220

25903 1983 　 GOST 25903-83 Vacuum switches and multiway switches for high-frequency current. Terms and definitions 01.040.31
31.220.20

26895 1986 　 GOST 26895-86 Radiocomponents electromechanical. Method of testing of contact fixing 31.220

26896 1986 　 GOST 26896-86 Radiocomponents electromechanical. Method of testing of strength of insulator fixing in housing axially 31.220

27276 1987 　 GOST 27276-87 Electromechanical radio components. Method of electric and mechanical testing for wear resistance 31.220

27277 1987 　 GOST 27277-87 Electromechanical radio components. Test method of confining force of elastic contacts 31.220

27278 1987 　 GOST 27278-87 Electromechanical radio components. Method of testing cable clamp strength to cable bending 31.220

27279 1987 　 GOST 27279-87 Electromechanical radio components. Method of testing cable clamp strength to cable rotation 31.220

27280 1987 　 GOST 27280-87 Electromechanical radio components. Method of testing cable clamp stregth to cable twisting 31.220

27281 1987 　 GOST 27281-87 Electromechanical radio components. Method of testing cable clamp strength to cable tension 31.220

27381 1987 　 GOST 27381-87 Sensitive switches. General specification 31.220.20

27382 1987 　 GOST 27382-87 Rotary switches. General specification 31.220.20

27383 1987 　 GOST 27383-87 Toggle switches. General specification 31.220.20

27447 1987 　 GOST 27447-87 Electromechanical components. Orientation test of connectors 31.220

27448 1987 　 GOST 27448-87 Electromechanical components. Electrical overload test 31.220

27449 1987 　 GOST 27449-87 Electromechanical components. Coupling device test 31.220

28017 1989 　 GOST 28017-89 Electromechanical radio components. Method of measuring operating force and operating torque 31.220

28381 1989 　 GOST 28381-89 Electromechanical components for electronic equipment. Basic testing procedures and measuring methods 31.220

28627 1990 　 GOST 28627-90 Electromechanical components for electrical equipment. General specification 31.220.20

28752 1990 　 GOST 28752-90 Connectors for frequencies below 3 MHz. Part 9. Circular connectors for radio and associated sound equipment 31.220.10

28811 1990 　 GOST 28811-90 Electromechanical switches for use in electronice equipment. Sectional specification for lever (toggle) switches 31.220.20

28934 1991 　 GOST 28934-91 Electromagnetic compatibility of technical equipment. Electromagnetic compatibility technical requirements. Contents 31.220.99

28998 1991 　 GOST 28998-91 Inductor and transformer cores for telecommunication. Part 2. Sectional specification magnetic oxide cores for inductor applications 29.100.10
31.220.99

28999 1991 　 GOST 28999-91 Inductor and transformer cores for telecommunication. Part 2. Blank detal specification magnetic oxide cores for inductor application. Assessment level A 29.100.10
31.220.99

29000 1991 　 GOST 29000-91 Inductor and transformer cores for telecommunication. Part 3. Sectional specification magnetic oxide cores for broad-band transformers 29.100.10
31.220.99

29001 1991 　 GOST 29001-91 Inductor and transformer cores for telecommunication. Part 3. Blank detail specification magnetic oxide cores for broad-band transformers assessment levels A and B 29.100.10
31.220.99

29002 1991 　 GOST 29002-91 Inductor and transformer cores for telecommunication. Part 4. Sectional specification magnetic oxide cores for transformers and chokes for power applications 29.100.10
31.220.99

29003 1991 　 GOST 29003-91 Inductor and transformer cores for telecommunications. Part 4. Blanc detal specification, magnetic oxide cores transformers and chokes for power applications assessment level A 29.100.10
31.220.99

29004 1991 　 GOST 29004-91 Cores for inductors and transformers for telecommunications. Part 1. Measuring methods 29.100.10
31.220.99
33.120.99

29005 1991 　 GOST 29005-91 Cores for inductors and transformers for telecommunications. Part 2. Guides for drafting specifications 29.100.10
31.220.99
33.120.99

29011 1991 　 GOST 29011-91 Electromechanical switches for use in electronic equipment. Part 2. Sectional specification for rotary switches 31.220.20

50319 1992 　 GOST R 50319-92 Electromechanical switches for use in electronic equipment. Sectional specification for in-line package switches 31.220.20

50320 1992 　 GOST R 50320-92 Electromechanical switches for use in electronic equipment. Sectional specification for pushbutton switches 31.220.20

50321 1992 　 GOST R 50321-92 Electromechanical switches for use in electronic equipment. Sectional specification for sensitive switches 31.220.20

50477 1993 　 GOST R 50477-93 Electromechanical switches for use in electronic equipment. Blank detail specification for rotary switches 31.220.20

50478 1993 　 GOST R 50478-93 Electromechanical switches for use in electronic equipment. Blank detail specification for lever (toggle) switches 31.220.20

51799 2001 　 GOST R 51799-2001 High power radio frequency connectors. Basic parameters and technical requirements. Methods of tests and measurements 33.060.40
31.220.10

IEC 60127-06 1999 　 GOST R IEC 127-6-99 Miniature fuses. Part 6. Fuse-holders for miniature cartridge fuse-links 31.220

IEC 61020-03-01 1994 　 GOST R IEC 1020-3-1-94 Electromechanical switches for use in electronic equipment. Blank detail specification for in-line package switches 31.220.20

IEC 61020-05-01 1994 　 GOST R IEC 1020-5-1-94 Electromechanical switches for use in electronic equipment. Blank detail specification for pushbutton switches 31.220.20

IEC 61020-06-01 1994 　 GOST R IEC 1020-6-1-94 Electromechanical switches for use in electronic equipment. Blаnk detail specification for sensitive switches 31.220.20

31.240 電子設備の機械的構造

Sort Mk 規格番号規格名称(英語) 国際規格分類
( ICSコードの説明 )

20862 1981 　 GOST 20862-81 Adjusting fixturing hexahedral supports with theaded end and hole. Design and dimensions 31.240

20863 1981 　 GOST 20863-81 Adjusting fixturing rings supports with a flat, threaded end and hole. Design and dimensions 31.240

20864 1981 　 GOST 20864-81 Adjusting fixturing ring supports with slit, theaded end and hole. Design and dimensions 31.240

20865 1981 　 GOST 20865-81 Adjusting fixturing hexahedral supports with threaded holes. Design and dimensions 31.240

20866 1981 　 GOST 20866-81 Adjusting fixturing ring support with flats and threaded holes. Design and dimensions 31.240

20867 1981 　 GOST 20867-81 Adjusting fixturing ring with a slit and threaded holes. Design and dimensions 31.240

20868 1981 　 GOST 20868-81 Adjusting fixturing supports. Technical requirements 31.240

22623 1977 　 GOST 22623-77 Fixtures for spindle-operated electronic components. Basic dimensions 31.240

28601-01 1990 　 GOST 28601.1-90 Systems of bearing structures of the 482,6 mm series. Panels and racks. Main dimensions 31.240

28601-02 1990 　 GOST 28601.2-90 Systems of bearing structures of the 482,6 mm series. Cabinets and rack structures. Main dimensions 31.240

28601-03 1990 　 GOST 28601.3-90 Systems of bearing structures of the 482,6 mm series. Subracks and associated plug-in units. Main dimensions 31.240

51623 2000 　 GOST R 51623-2000 Mechanical structure designs of electronic equipment. Construction system and coordinating sizes 31.240

51676 2000 　 GOST R 51676-2000 Mechanical structure designs of electronic equipment. Terms and definitions 01.040.31
31.240

31.260 オプトエレクトロニクス．レーザー設備
注: 光電管及び光電池を含む。

Sort Mk 規格番号規格名称(英語) 国際規格分類
( ICSコードの説明 )

00002-746 1968 　 GOST 2.746-68 Unified system for design documentation. Graphic identifications in schemes. Quantum generators and amplifiers 01.080.40
31.260

00004-431 1986 　 GOST 4.431-86 Product-quality index system. Photoelectric detectors. Nomenclature of indices 03.120
31.260

00005-2105 1973 　 GOST 5.2105-73 Laser ellipsometric microscope ЛЭМ-2. Quality requirements of sertified products 31.260

00008-0559 1994 　 GOST R 8.559-94 State system for ensuring the uniformity of measurements. Measuring lasers. Method for verification 31.260
17.020

00012-01-031 1981 　 GOST 12.1.031-81 Occupational safety standards system. Lasers. Methods of dosimetrical control of laser radiation 13.280
31.260

02388 1970 　 GOST 2388-70 Selenium photocells for photometric and colorimetric measurement of pirotechnical agents. General technical requirements 31.260

11612-00 1981 　 GOST 11612.0-81 Photomultipliers. Measuring methods of the electric and lighttechnics parameters. 31.260

11612-01 1981 　 GOST 11612.1-81 Photomultipliers. Measuring method of catode luminous sensitivity 31.260

11612-02 1981 　 GOST 11612.2-81 Photomultipliers. Measuring method of anode luminous sensitivity 31.080
31.260

11612-03 1975 　 GOST 11612.3-75 Photomultipliers. Measuring method of non-uniformity of light anode sensitivity over the photocatode area 31.260

11612-04 1984 　 GOST 11612.4-84 Photomultipliers. Measuring method of dark anode current 31.260

11612-05 1975 　 GOST 11612.5-75 Photomultipliers. Measuring method of signal to "noise in the signal" ratio 31.260

11612-06 1983 　 GOST 11612.6-83 Photomultipliers. Measuring methods of light equivalent of anode dark current noise 31.260

11612-07 1983 　 GOST 11612.7-83 Photomultipliers. Measuring methods of light and spectral equivalent of anode current noise produced by luminous flux 31.260

11612-08 1985 　 GOST 11612.8-85 Photomultipliers. Measuring method of energy resolution 31.260

11612-09 1984 　 GOST 11612.9-84 Photomultipliers. Measuring method of nonlinearity of light characteristic in static mode 31.260

11612-10 1984 　 GOST 11612.10-84 Photomultipliers. Measuring method of nonlinearity of light characteristic in pulse mode 31.260

11612-11 1985 　 GOST 11612.11-85 Photomultipliers. Measuring method of instability 31.260

11612-12 1984 　 GOST 11612.12-84 Photomultipliers. Measuring method of energetic equivalent of intrinsic noise 31.260

11612-13 1985 　 GOST 11612.13-85 Photomultipliers. Method of measuring pulse response rise time and width 31.260

11612-14 1975 　 GOST 11612.14-75 Photomultipliers. Measuring method of variation of signal transit time in dependence of the position of illuminated part of the photocathode area 31.260

11612-15 1975 　 GOST 11612.15-75 Photomultipliers. Measuring method of readiness time 31.260

11612-16 1975 　 GOST 11612.16-75 Photomultipliers. Method of measuring cut-off voltage 31.260

11612-17 1981 　 GOST 11612.17-81 Phetomultiplirs. Methods of measuring spectral anode sensitivity 31.260

13917 1992 　 GOST 13917-92 Optical materials. Methods for determination of chemical stability. Groups of chemical stability 31.260

15093 1990 　 GOST 15093-90 Lasers and laser modulation devices. Terms and definitions 01.040.31
31.260

15114 1978 　 GOST 15114-78 Telescope system for optical devices. Visual method of resolution limits determination 31.260

15856 1984 　 GOST 15856-84 Photomultipliers. General specifications 31.260

16208 1984 　 GOST 16208-84 High-intensity gas-discharge sources of optical radiation. General specifications 31.260

17333 1980 　 GOST 17333-80 Photoelectronic devices. Methods for measurement of spectral sensitivity of photocathodes 31.260

17470 1977 　 GOST 17470-77 Multiplier phototubes. Basic parameters 31.260

17485 1977 　 GOST 17485-77 Photocells. Basic parameters 31.260

17490 1977 　 GOST 17490-77 Injection lasers and radiators, laser diodes. Key parameters. 31.260

17772 1988 　 GOST 17772-88 Semiconducting photoelectric detectors and receiving photoelectric devices. Methods of measuring photoelectric parameters and determining characteristics 31.080
31.260

19319 1982 　 GOST 19319-82 Solid-state lasers. Basic parameters 31.260

19798 1974 　 GOST 19798-74 Photocells. General specifications 31.260

21195 1984 　 GOST 21195-84 Spectral high-intensity gas-discharge sources of optical radiation. General specifications 31.260

21316-00 1975 　 GOST 21316.0-75 Photocells. General requirements for characteristics measurements 31.260

21316-01 1975 　 GOST 21316.1-75 Photocells. Method of measurement of luminous sensitivity 31.260

21316-02 1975 　 GOST 21316.2-75 Photocells. Method of dark current measurement 31.260

21316-03 1975 　 GOST 21316.3-75 Photocells. Method of insulation resistance measurement 31.260

21316-04 1975 　 GOST 21316.4-75 Photocells. Method of measurement of sensitivity nenuniformity 31.260

21316-05 1975 　 GOST 21316.5-75 Photocells. Method of instability measurement 31.260

21316-06 1975 　 GOST 21316.6-75 Photocells. Determination method of correspondence of current-illumination characteristic of photocell to given linearity limit in continuous operation conditions 31.260

21316-07 1975 　 GOST 21316.7-75 Photocells. Determination method of correspondence of current-illumination characteristic of photocell to given linearity limit in pulsed operation conditions 31.260

21815-00 1986 　 GOST 21815.0-86 Image intensifier and image converter tubes. Common rules of measuring electrical, viewing and optical parameters 31.260

21815-01 1986 　 GOST 21815.1-86 Image intensifier and image converter tubes. Method of measuring sensitivity of the photocathode to white light and to white light with selective light filter 31.260

21815-02 1986 　 GOST 21815.2-86 Image intensifier and image converter tubes. Method of measuring the conversion factor 31.260

21815-03 1986 　 GOST 21815.3-86 Image intensifier and image converter tubes. Method of measuring the luminance gain 31.260

21815-06 1986 　 GOST 21815.6-86 Image intensifier and image converter tubes. Method of checking useful diameter of the photocathode 31.260

21815-07 1986 　 GOST 21815.7-86 Image intensifier and image converter tubes. Method of measuring the contrast of the image 31.260

21815-08 1986 　 GOST 21815.8-86 Image intensifier and image converter tubes. Method of measuring the limiting resolution 31.260

21815-09 1986 　 GOST 21815.9-86 Image intensifier and image converter tubes. Method of measuring the low light level limiting resolution 31.260

21815-10 1986 　 GOST 21815.10-86 Image intensifier and image converter tubes. Method of measuring the electron optic magnification 31.260

21815-11 1986 　 GOST 21815.11-86 Image intensifier and image сonverter tubes. Method of measuring the threshold of point illumination of the photocathode 31.260

21815-12 1986 　 GOST 21815.12-86 Image intensifier and image converter tubes. Method of checking the image eccentricity 31.260

21815-14 1986 　 GOST 21815.14-86 Image intensifier and image converter tubes. Method of measuring the image drift 31.260

21815-15 1986 　 GOST 21815.15-86 Image intensifier and image converter tubes. Method of checking the viewing area picture quality 31.260

21815-16 1986 　 GOST 21815.16-86 Image intensifier and image converter tubes. Method of measuring the output brightness non- uniformity ratio 31.260

21815-17 1986 　 GOST 21815.17-86 Image intensifier and image converter tubes. Method of measuring density of scintillations 31.260

21815-18 1990 　 GOST 21815.18-90 Image intensifier and image converter tubes. Modulation franster function 31.260

21815-19 1990 　 GOST 21815.19-90 Image intensifier and image converter tubes. Methods of measuring the signal-to-noise ratio 31.260

22466-00 1982 　 GOST 22466.0-82 Gaseous discharge sources of high-intensity optical radiation. Methods for measuring the electrical and luminous parameters. General rules 31.260

22466-01 1988 　 GOST 22466.1-88 Gaseous discharge sources of high-intensity optical radiation. Method for measiring luminous parameters 31.260

22466-02 1977 　 GOST 22466.2-77 Discharge impulsive sources of highintensity optical radiation. Method for measuring the starting voltage 31.260

22466-03 1977 　 GOST 22466.3-77 Discharge impulsive sources of highintensity optical radiation. Method for measuring the self-breakdown voltage 31.260

22466-04 1982 　 GOST 22466.4-82 Gaseons discharge continuous sources of high-intensity optical radiation. Methods for measuring electrical parameters 31.260

22511 1988 　 GOST 22511-88 Photomultipliers. Basic dimensions 31.260

23339 1978 　 GOST 23339-78 Optoelectron switches of logic signals. Basic parameters 31.260

23340 1978 　 GOST 23340-78 Optoelectron commutators of analog signal. Basic parameters 31.260

23449 1979 　 GOST 23449-79 Onconfines discharge impulsive sources of high-intensity optical radiation. Construction and basic dimensions 31.260

23506 　 GOST 23506-79 [?] 31.260
37.040.10

23547 1979 　 GOST 23547-79 Optoelectron commutators. Basic parameters 31.260

24428 1980 　 GOST 24428-80 Gas lasers. General specifications 31.260

24453 1980 　 GOST 24453-80 Laser parameter and characteristic measurements. Terms, definitions and letter symbols 01.040.31
31.260

24458 1980 　 GOST 24458-80 Semiconductor optoelectronic couplers. Essential parameters 31.260

24613-01 1981 　 GOST 24613.1-81 Optoelectronic integrated microcircuits and opto-couples. Methods for measuring of input-to-output capacitance 31.200
31.260

24613-02 1981 　 GOST 24613.2-81 Optoelectronic integrated microcircuits and opto-couples. Method for measuring leatage current 31.200
31.260

24613-03 1981 　 GOST 24613.3-81 Optoelectronic integrated microcircuits and opto-couples. Method for measuring input voltage 31.200
31.260

24613-04 1981 　 GOST 24613.4-81 Electronic integrated microcircuits. Method of switsching on and switching off time measurement of commutators of analog signals and load 31.200
31.260

24613-05 1981 　 GOST 24613.5-81 Optoelectronic integrated microcircuits. Method of zero remnant voltage measurement of commutators of analog signals and load 31.200
31.260

24613-06 1981 　 GOST 24613.6-81 Optoelectronic integrated microcircuits and opto-couples. Metod for measuring isolation voltage 31.200
31.260

24613-07 1983 　 GOST 24613.7-83 Resistor opto-couples. Method for measuring light and dark output resistance 31.200
31.260

24613-08 1983 　 GOST 24613.8-83 Optoelectronic integrated microcircuits and opto-couples. Methods for measuring critical change rate of dielectric voltage 31.200
31.260

24613-10 1977 　 GOST 24613.10-77 Optoelectronic integrated microcircuits. Method for measuring noise current and noise voltage for low and high levels of logic signal switches 31.200
31.260

24613-11 1977 　 GOST 24613.11-77 Optoelectronic integrated microcircuits. Method for measuring input voltage for low and high levels of logic signal switches 31.200
31.260

24613-12-1977 　 GOST 24613.12-77 Optoelectronic integrated microcircuits. Method for measuring output voltage for low and high levels of logic signal switches 31.200
31.260

24613-13 1977 　 GOST 24613.13-77 Optoelectronic integrated microcircuits. Method for measuring short circuit of logic signal switches 31.200
31.260

24613-14 1977 　 GOST 24613.14-77 Optoelectronic integrated microcircuits. Method for measuring consumption currents of low and high levels of logic signal switches 31.200
31.260

24613-15 1977 　 GOST 24613.15-77 Optoelectronic integrated microcircuits. Method for measuring consumption carrent of switching and its duration of logic signal switches 31.200
31.260

24613-16 1977 　 GOST 24613.16-77 Optoelectronic integrated microcircuits. Method for measuring initial residual voltage of analogue signal commutators 31.200
31.260

24613-17 1977 　 GOST 24613.17-77 Optoelectronic integrated microcricuits. Method for measuring output differential resistance of analogue signal commutators 31.200
31.260

24714 1981 　 GOST 24714-81 Zasers. The measurement methods of radiation parameters. General rules 31.260

25212 1982 　 GOST 25212-82 Lasers. Methods for measurement of one pulse energy 31.260

25213 1982 　 GOST 25213-82 Methods for measurement of the pulse length and the pulse repetition frequency 31.260

25312 1982 　 GOST 25312-82 Measuring thermal thermoelectric laser radiation transducers. Types and basic parameters. Measuring methods 31.260

25369 1982 　 GOST 25369-82 Measuring photocells. Basic parameters, measuring methods of basic parameters 31.260

25370 1982 　 GOST 25370-82 Measuring photomultipliers. Basic parameters, measuring methods of basic parameters 31.260

25373 1982 　 GOST 25373-82 Measuring lasers. Types. Basic parameters technical requirements 31.260

25677 1983 　 GOST 25677-83 Measuring image converter tubes of pulse laser radiation. Basic parameters. Methods of measurement 31.260

25678 1983 　 GOST 25678-83 Instruments for measurements of pulse laser energy. Types. Basic parameters. Methods for measurement of basic parameters 31.260

25763 1983 　 GOST 25763-83 Gas-discharge sources of high-intensity optical radiation for laser pumping. Basic dimensions 31.260

25774 1983 　 GOST 25774-83 Image-intensifier and image-converter tubes. The determination of amplitude frequency characteristic method 31.260

25786 1983 　 GOST 25786-83 Lasers. Measuring methods of average power, pulse average power, relative average power instability 31.260

25819 1983 　 GOST 25819-83 Lasers. Methods of pulse laser radiation peak power measurement 31.260

25917 1983 　 GOST 25917-83 Lasers. Methods for measurement of relative distribution of radiant energy (power) 31.260

25918 1983 　 GOST 25918-83 Continuous-wave lasers. Methods for measurement of radiation frequency instability 31.260

26086 1984 　 GOST 26086-84 Lasers. Methods for measurement of beam diameter and beam energy divergence angle 31.260

28953 1991 　 GOST 28953-91 Photosensitive charge transfer device. Measuring methods for parameters 31.260

29283 1992 　 GOST 29283-92 Semiconductor devices. Discrete devices and integrated circuits. Part 5. Optoelectronic devices 31.260

50005 1992 　 GOST R 50005-92 Lasers and solid-state laser heads. Measurement methods of peak local energy (power) density 31.260

50006 1992 　 GOST R 50006-92 Lasers and solid-state laser heads. Method of measurement of polarization characteristics 31.260

50723 1994 　 GOST R 50723-94 Laser safety. General requirements for development and operation the laser products 13.280
31.260

50737 1995 　 GOST R 50737-95 Laser passive switches. Methods of measurement and assessment of parameters 31.260

50964 1996 　 GOST R 50964-96 Nonlinear elements of harmonic generators. Methods for measurement of parameters 31.260

51036 1997 　 GOST R 51036-97 Electrooptical elements. Methods for measurement of electrooptical parameters 31.260

51106 1997 　 GOST R 51106-97 Lazers injection, lazer heads, lazers diodes matiсes, lazers diodes. Methods for measurement of parameters 31.260

51846 2001 　 GOST R 51846-2001 Solid-state lasers and solid-state laser heads for wide application devices. General specifications 31.260

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