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ICS 国際規格分類	中国標準分類	規格番号	規格名称(中国語)	規格名称(英語)	国際整合
31.080	L40	GB/T 249-1989	半导体分立器件型号命名方法	The rule of type designation for discrete semiconductor devices
31.100	L35	GB/T 787-1974	电子管管基尺寸	Dimensions of electronic tube bases
31.180	L30	GB/T 1360-1998	印制电路网格体系	Grid systems for printed circuits	IDT IEC 60097:1991
31.020	L10	GB/T 1772-1979	电子元器件失效率试验方法	Determination of failure rate of electronic elements and components
31.180	L30	GB/T 2036-1994	印制电路术语	Terms for printed circuits	NEQ IEC 60194-88
31.030	L32	GB/T 2413-1980	压电陶瓷材料体积密度测量方法	Piezoelectric ceramic materials--Measuring methods for determination of volume density
31.030	L90	GB/T 2414.1-1998	压电陶瓷材料性能试验方法 圆片径向伸缩振动模式	Test methods for the properties of piezoelectric ceramics Radial extension vibration mode for disk
31.030	L90	GB/T 2414.2-1998	压电陶瓷材料性能试验方法 长条横向长度伸缩振动模式	Test methods for the properties of piezoelectric ceramics Transverse length extension vibration mode for bar
31.020	L11	GB/T 2470-1995	电子设备用固定电阻器、固定电容器型号命名方	Type designation system for fixed resistors and fixed capacitors for use in electronic equipment
31.020	L13	GB/T 2471-1995	电阻器和电容器优先数系	Preferred number series for resistors and capacitors	IDT IEC 60063-1963
31.020	L05	GB/T 2689.1-1981	恒定应力寿命试验和加速寿命试验方法总则	Constant stress life tests and acceleration life tests--General rules
31.020	L05	GB/T 2689.2-1981	寿命试验和加速寿命试验的图估计法 (用于威布尔分布)	Life test and acceleration life test charts--Evaluation of their Weibull distributons
31.020	L05	GB/T 2689.3-1981	寿命试验和加速寿命试验的简单线性无偏估计法 (用于威布尔分布)	Life test and acceleration life test--Simple linear deflection-free--Evaluation of Weibull distributions
31.020	L05	GB/T 2689.4-1981	寿命试验和加速寿命试验的最好线性无偏估计法 (用于威布尔分布)	Life test and acceleration life test--Optimal linear deflection-free--Evaluation of Weibull distributions
31.020	L04	GB/T 2691-1994	电阻器和电容器的标志代码	Marking codes for resistors and capacitors	IDT IEC 60062-92
31.060.10	L11	GB/T 2693-2001	电子设备用固定电容器 第1部分: 总规范	Fixed capacitors for use in electronic equipment Part 1: Generic specitigation	IDT IEC 60384-1:1999
31.020	L22	GB/T 2775-1993	手控电子元件的轴端尺寸	Dimensions of spendle ends for manually operated electronic components	EQV IEC 60390A-1976
31.100	L35	GB/T 2987-1996	电子管参数符号	Letter symbols of parameter for electronic tubes
ICS 国際規格分類	中国標準分類	規格番号	規格名称(中国語)	規格名称(英語)	国際整合
31.240	K05	GB/T 3047.1-1995	高度进制为20mm的面板、架和柜的基本尺寸系列	Series of basic dimensions of panels, rack and cabinets for vertical increment of 20mm
31.240	L89	GB/T 3047.2-1992	高度进制为44.45mm 的面板、机架和机柜的基本尺寸系列	Series of basic dimensions of panels, racks and enclosures for vertical increment of 44.45mm
31.240	K05	GB/T 3047.3-1989	高度进制为20mm的插箱、插件基本尺寸系列	20mm increment's basic dimension series for subracks and subassemblies
31.240	L89	GB/T 3047.4-1986	高度进制为44.45mm 的插箱、插件的基本尺寸系列	Series of basic dimensions of subracks and plug-in units for vertical increment of 44.45mm	NEQ IEC 60297-3
31.240	K05	GB/T 3047.5-1989	高度进制为20mm的台式机箱基本尺寸系列	20mm increment's basic dimensions series for cabiners
31.240	L89	GB/T 3047.6-1986	电子设备台式机箱基本尺寸系列	Series of basic dimensions of cases for electronic equipment
31.240	L94	GB/T 3047.8-1996	高度进制为44.45mm的窄柜基本尺寸系列	Series of basic dimension of narrow cabinets for vertical increment of 44.45mm
31.100	L35	GB/T 3188-1982	电子管外形尺寸	Outline dimensions of electrnic tubes
31.100	L35	GB/T 3189-1982	电子管引出帽连接尺寸	Connecting dimensions for caps of electronic tubes	NEQ IEC 60067
31.120	L38	GB/T 3212-1982	�K白电视显象管测试方法	The methods of the measurement of the black and-white television picture tubes
31.100	L39	GB/T 3213-1994	闸流管与充气整流管测试方法	Methods of measurement for thyratrons and gas-filled rectifier tubes
31.060.20	Y20	GB/T 3295-1996	陶瓷制品45°镜向光泽度试验方法	Standard test method for 45°specular gloss of ceramic ware	NEQ ASTM C 346-1976
31.100	L36	GB/T 3306-2001	小功率电子管电性能测试方法	Measurements of the electrical properties of low-power electronic tubes
31.100	L36	GB/T 3307-1982	小功率电子管灯丝断续试验方法	Method of heater intermittent test of low-poewr electronic tubes
31.020	L18	GB/T 3351-1982	人造石英晶体的型号命名	Designations for synthetic quartz crystals
31.020	L90	GB/T 3352-1994	人造石英晶体	Synthetic quartz crystal
31.020	L90	GB/T 3353-1995	人造石英晶体使用指南	Guide to the use of synthetic quartz crystal	EQV IEC 60758-1993
31.030	L18	GB/T 3388-1982	压电陶瓷材料型号命名方法	Designations for types of piezoelectric ceramics
31.030	L90	GB/T 3389.1-1996	铁电压电陶瓷词汇	Vocabulary for ferroelectric and piezoelectric ceramics
31.030	L90	GB/T 3389.2-1999	压电陶瓷材料性能测试方法 纵向压电应变常数d33的静态测试	Test methods for the properties of piezoelectric ceramics-- Static test for piezoelectric strain constant d33
31.030	L90	GB/T 3389.3-2001	压电陶瓷材料性能试验方法 居里温度Tc的测试	Test methods for the properties of piezoelectric ceramics test for Curie temperature Tc
31.030	L18	GB/T 3389.4-1982	压电陶瓷材料性能测试方法 柱体纵向长度伸缩振动模式	Test methods for the properties of piezoelectric ceramics--Longitudinal length extension vibration mode for rod
31.030	L90	GB/T 3389.5-1995	压电陶瓷材料性能测试方法 圆片厚度伸缩振动模式	Test methods for the properties of piezoelectric ceramics--Thickness extension vibration mode for disk	NEQ IEC 60483
31.030	L90	GB/T 3389.6-1997	压电陶瓷材料性能测试方法 长方片厚度切变振动模式	Test methods for properties of piezoelectric ceramics--Thickness-shear vibration mode for rectangular plate
31.030	L18	GB/T 3389.7-1986	压电陶瓷材料性能测试方法 强场介电性能的测试	Test methods for the properties of piezoelectric ceramics--Test for dielectric properties in high electric field
31.030	L18	GB/T 3389.8-1986	压电陶瓷材料性能测试方法 热释电系数的测试	Test methods for the properties of piezoelectric ceramics--Test for the pyroelectric coefficient
31.200	L55	GB/T 3430-1989	半导体集成电路型号命名方法	The rule of type designation for semiconductor integrated circuits
31.200	L56	GB/T 3431.2-1986	半导体集成电路文字符号 引出端功能符号	Letter symbols for semiconductor integrated circuits--Letter symbols for function of pins
31.200	L56	GB/T 3432.4-1989	半导体集成电路TTL电路系列和品种 54/74LS系列的品种	Series and products for TTL semiconductor integrated circuits - Products of series 54/74 LS
31.200	L56	GB/T 3434-1986	半导体集成电路ECL电路系列和品种	Families and products of ECL circuits for semiconductor integrated circuits
31.200	L56	GB/T 3435-1987	半导体集成CMOS电路系列和品种 4000系列的品种	Series and products for semiconductor CMOS integrated circuits--Products of families 4000
31.020; 33.	L04	GB/T 3482-1983	电子设备雷击试验方法	Lightning test for electronic equipments
31.020; 33.	L04	GB/T 3483-1983	电子设备雷击试验导则	Guidance for lightning test for electronic equipments
31.030; 71.	H65	GB/T 3503-1993	氧化钇	Yttrium oxide
31.030;71.	H65	GB/T 3504-1992	荧光级氧化铕	Europium oxide phosphor grade
31.060.70	K42	GB 3667-1997	交流电动机电容器	A.C. motor capacitors	IDT IEC 60252:1992
31.060	L11	GB/T 3788-1995	真空电容器通用技术条件	General specification for vacuum capacitors	NEQ MIL-C-23183
31.100	L35	GB/T 3789.1-1991	发射管电性能测试方法 总则	Measurements of the electrical properties of transmitting tubes - General
31.100	L35	GB/T 3789.2-1991	发射管电性能测试方法 阳极电流和栅极电流的测试方法	Measurements of the electrical properties of transmitting tubes - Measuring methods of current of anode and grid
31.100	L35	GB/T 3789.3-1991	发射管电性能测试方法 阴极发射电流的测试方法	Measurements of the electrical properties of transmitting tubes - Measuring methods of cathode emission current
31.100	L35	GB/T 3789.4-1991	发射管电性能测试方法 栅极反向电流的测试方法	Measurements of the electrical properties of transmitting tubes - Measuring methods of reverse grids current
31.100	L35	GB/T 3789.5-1991	发射管电性能测试方法 栅极热放射电流的测试方法	Measurements of the electrical properties of transmitting tubes - Measuring methods of grid thermo-emission current
31.100	L35	GB/T 3789.6-1991	发射管电性能测试方法 跨导、放大系数的测试方法	Measurements of the electrical properties of transmitting tubes - Measuring methods of transconductance and amplification factor
31.100	L35	GB/T 3789.7-1991	发射管电性能测试方法 阳极离子流的测试方法	Measurements of the electrical properties of transmitting tubes - Measuring methods of anode ion current
31.100	L35	GB/T 3789.8-1991	发射管电性能测试方法 阳极最大耗散功率和阳极过载耗散功率的测试方法	Measurements of the electrical properties of transmitting tubes - Measuring methods of maximum anode dissipation power and anode overload dissipation power
31.100	L35	GB/T 3789.9-1991	发射管电性能测试方法 栅极最大耗散功率的测试方法	Measurements of the electrical properties of transmitting tubes - Measuring methods of maximum grid dissipation power
31.100	L35	GB/T 3789.10-1991	发射管电性能测试方法 第一栅极截止电压的测试方法	Measurements of the electrical properties of transmitting tubes - Measuring methods of grid No1 cut-off voltage
31.100	L35	GB/T 3789.11-1991	发射管电性能测试方法 第三栅极截止电压的测试方法	Measurements of the electrical properties of transmitting tubes - Measuring methods of grid No3 cut-off voltage
31.100	L35	GB/T 3789.12-1991	发射管电性能测试方法 极间绝缘的测试方法	Measurements of the electrical properties of transmitting tubes - Measuring methods of interelectrode insulation
31.100	L35	GB/T 3789.13-1991	发射管电性能测试方法 共栅电路静态特性曲线的测试方法	Measurements of the electrical properties of transmitting tubes？ Methods of measurements of static characteristic curve for common grid circuit
31.100	L35	GB/T 3789.14-1991	发射管电性能测试方法 共阴电路静态特性曲线的测试方法	Measurements of the electrical properties of transmitting tubes？Measuring methods of static characteristic curve for common cathode circuit
31.100	L35	GB/T 3789.15-1991	发射管电性能测试方法 输出功率的测试方法	Measurements of the electrical properties of transmitting tubes？Measuring methods of output power
31.100	L35	GB/T 3789.16-1991	发射管电性能测试方法 脉冲输出功率的测试方法	Measurements of the electrical properties of transmitting tubes - Measuring methods of pulse output power
31.100	L35	GB/T 3789.17-1991	发射管电性能测试方法 电气强度的测试方法	Measurements of the electrical properties of transmitting tubes - Measuring methods of electrical intensity
31.100	L35	GB/T 3789.18-1991	发射管电性能测试方法 电极间绝缘体高频损耗的测试方法	Measurements of the electrical properties of transmitting tubes ？ Measuring methods of high frequency loss for interelectrode insulators
31.100	L35	GB/T 3789.19-1991	发射管电性能测试方法 频率特性曲线的测试方法	Measurements of the electrical properties of transmitting tubes - Measuring methods of frequency characteristic curve
31.100	L35	GB/T 3789.20-1991	发射管电性能测试方法 第一栅极电流截止电压的测试方法	Measurements of the electrical properties of transmitting tubes - Measuring methods of grid No1 current cut-off voltage
31.100	L35	GB/T 3789.21-1991	发射管电性能测试方法 静态特性参考点的测试方法	Measurements of the electrical properties of transmitting tubes - Measuring methods of static characteristic reference point
31.100	L35	GB/T 3789.22-1991	发射管电性能测试方法 振动稳定性的测试方法	Measurements of the electrical properties of transmitting tubes - Measuring methods of vibration stability
31.100	L35	GB/T 3789.23-1991	发射管电性能测试方法 第三栅极控制能力的测试方法	Measurements of the electrical properties of transmitting tubes - Measuring methods of grid No3 control ability
31.100	L35	GB/T 3789.24-1991	发射管电性能测试方法 线性放大管双音互调失真的测试方法	Measurements of the electrical properties of transmitting tubes - Measuring methods of dual tone inter-modulation distortion of linear amplifier tubes
31.100	L35	GB/T 3789.25-1991	发射管电性能测试方法 图象输出功率的测试方法	Measurements of the electrical properties of transmitting tubes - Methods of measuring the vision output power
31.100	L35	GB/T 3789.26-1991	发射管电性能测试方法 功率�揄v的测试方法	Measurements of the electrical properties of transmitting tubes - Methods of measuring the power gain
31.100	L35	GB/T 3789.27-1991	发射管电性能测试方法 三音互调失真的测试方法	Measurements of the electrical properties of transmitting tubes - Methods of measuring the inter-modulation distortion of a three tone signal
31.100	L35	GB/T 3789.29-1991	发射管电性能测试方法 低频亮度非线性的测试方法	Measurements of the electrical properties of transmitting tubes - Method of measuring the non-linearity in the luminance of the lower frequency
31.100	L35	GB/T 3789.30-1991	发射管电性能测试方法 由亮度信号不同引起的色度信号失真 (微分�揄vDG和微分相位DP) 的测试方法	Measurements of the electrical properties of transmitting tubes？Methods of measuring the distortion in the chrominance signal due to the luminance (differential gain and dfferential phgase)
31.100	L35	GB/T 3789.31-1991	发射管电性能测试方法 同步脉冲压缩的测试方法	Measurements of the electrical properties of trausmitting tubes - Methods of measuring the press of synchronizing pluse
31.120	L39	GB/T 3790-1995	荧光显示管测试方法	Methods of measurement for fluorescent display tubes
31.100	L35	GB/T 3789.28-1991	发射管电性能测试方法 交叉调制的测试方法	Measurements of the electrical properties of transmitting tubes - Method of measuring the cross modulation
31.120	L38	GB/T 3951-1983	液晶显示器件型号命名方法	The rule of type designation of liquid crystal display devices
ICS 国際規格分類	中国標準分類	規格番号	規格名称(中国語)	規格名称(英語)	国際整合
31.080.10	L41	GB/T 4023-1997	半导体器件 分立器件和集成电路 第2部分: 整流二极管	Semiconductor devices--Discrete devices and integrated circuits--Part 2: Rectifier diodes	EQV IEC 60747-2:1983
31.030	L90	GB/T 4070-1996	荧光粉性能试验方法	Test methods for properties of phosphors
31.030	L32	GB/T 4071-1983	光致荧光粉测试方法	Measuring method for the phosphor excited by light
31.030	L32	GB/T 4072-1983	阴极射线致荧光粉测试方法	Measuring method of the phosphor excited by cathod rays
31.030	L90	GB/T 4073-1996	荧光粉牌号	Type of phosphor
31.060.60	L11	GB/T 4165-1984	电子设备用可变电容器的使用导则	Guide to the use of variable capacitors in electronic equipment	EQV IEC 60612-78
31.060.60	L11	GB/T 4166-1984	电子设备用可变电容器的试验方法	Methods of test of variable capacitors in electronic equipment	EQV IEC 60418-1-81
31.030	L90	GB/T 4181-1997	钨丝	Tungsten wires
31.030	L90	GB/T 4182-1997	钼丝	Molybdenum wires
31.030	L90	GB/T 4314-2000	吸气剂术语	Getter terms
31.200	L56	GB/T 4376-1994	半导体集成电路 电压调整器系列和品种	Series and products of voltage regulators for semiconductor integrated circuits
31.200	L56	GB/T 4377-1996	半导体集成电路 电压调整器测试方法的基本原理	Semiconductor integrated circuits--General principles of measuring methods of voltage regulator
31.020	L15	GB/T 4475-1995	敏感元器件术语	Terms of sensor
31.080	L42	GB/T 4586-1994	半导体器件 分立器件 第8部分: 场效应晶体管	Semiconductor devices--Discrete devices--Part 8: Field-effect transistors	IDT IEC 60747-8-84
31.080	L42	GB/T 4587-1994	半导体分立器件和集成电路 第7部分: 双极型晶体管	Semiconductor discrete devices and integrated circuits--Part 7: Bipolar transistors	IDT IEC 60747-7-88
31.180	L30	GB/T 4588.1-1996	无金属化孔单双面印制板分规范	Sectional specification:single and double sided printed boards with plain holes	IDT IEC/PQC 89-1990
31.180	L30	GB/T 4588.2-1996	有金属化孔单双面印制板分规范	Sectional specification:single and double sided printed boards with plated-through holes	IDT IEC/PQC 90-90
31.180	L30	GB/T 4588.3-1988	印制电路板设计和使用	Design and use of printed boards	NEQ IEC 60326-3-80
31.180	L30	GB/T 4588.4-1996	多层印制板 分规范	Seetional spocification--Multilayer printed boards	IDT IEC/PQC 91-1990
31.180	L30	GB/T 4588.10-1995	印制板 第10部分: 有贯穿连接的刚挠双面印制板规范	Printed boards--Part 10: Specification for flex-rigid double-sided printed boards with through connections	IDT IEC 60326-10-91
31.180	L30	GB/T 4588.12-2000	预制内层层压板规范(半制成多层印制板)	Specification for mass lamination panels (semi-manufactured multilayer printed boards)	IDT IEC 60326-12:1991
31.080	L40	GB/T 4589.1-1989	半导体器件 分立器件和集成电路总规范 (可供认证用)	Semiconductor devices - Generic specification for discrete devices and integrated circuits	IDT IEC 60747-10-84
31.100	L35	GB/T 4597-1996	电子管词汇	Vocabulary of electronic tubes
31.120	L49	GB/T 4619-1996	液晶显示器件测试方法	Measuring methods for liquid crystal display devices
31.180	L30	GB/T 4677.1-1984	印制板表层绝缘电阻测试方法	Test method of surface insulation resistance for printed boards	NEQ IEC 60326-2-76
31.180	L30	GB/T 4677.2-1984	印制板金属化孔镀层厚度测试方法 微电阻法	Micro-resistance test method of plating thickness of platedthrough holes for printed boards	NEQ IPC TM-650
31.180	L30	GB/T 4677.3-1984	印制板拉脱强度测试方法	Test methods of pull strength for printed boards	NEQ IEC 60326-2-76
31.180	L30	GB/T 4677.4-1984	印制板抗剥强度测试方法	Test methods of peel strength for printed boards	NEQ IEC 60326-2-76
31.180	L30	GB/T 4677.5-1984	印制板翘曲度测试方法	Test methods of platness for printed boards	NEQ IPC D-300
31.180	L30	GB/T 4677.6-1984	金属和氧化覆盖层厚度测试方法 截面金相法	Test methods for thickness of metal and oxide coating by microscopical examination of cross-section	EQV ISO 1463-73
31.180	L30	GB/T 4677.7-1984	印制板镀层附着力试验方法 胶带法	Test method of plating adhesion by adhesive type for printed boards	NEQ IPC A 600B
31.180	L30	GB/T 4677.8-1984	印制板镀涂覆层厚度测试方法 β反向散射法	Test method of plating and coating thickness by beta backscattering for printed boards	NEQ ANSI/ASTM B567-79
31.180	L30	GB/T 4677.9-1984	印制板镀层孔隙率电图象测试方法	The electrographic test method of plating porosity for printed boards	NEQ IEC 60326-2-76
31.180	L30	GB/T 4677.10-1984	印制板可焊性测试方法	Test method of solderability for printed boards	NEQ IEC 60068-2-20C
31.180	L30	GB/T 4677.11-1984	印制板耐热冲击试验方法	Test methods of thermal shock for printed boards	NEQ IEC 60326-2-76
31.180	L30	GB/T 4677.12-1988	印制板互连电阻测试方法	Test method of interconnection resistance for printed boards	EQV IEC 60326-2-76
31.180	L30	GB/T 4677.13-1988	印制板金属化孔电阻的变化 热循环测试方法	Test method of change in resistance of plated-through holes--Thermal cycling for printed boards	EQV IEC 60326-2A-80
31.180	L30	GB/T 4677.14-1988	印制板蒸汽-氧气加速老化试验方法	Test method of steam/oxygen accelerated ageing of printed board	EQV IEC 60326-2A-80
31.180	L30	GB/T 4677.15-1988	印制板绝缘涂层耐溶剂和耐焊剂试验方法	Test method for solvent and flux resistance of insulating coating on printed boards	EQV IEC 60326-2-76
31.180	L30	GB/T 4677.16-1988	印制板一般检验方法	General examination method for printed boards
31.180	L30	GB/T 4677.17-1988	多层印制板内层绝缘电阻测试方法	Test method for insulation resistance within inner layers of multilayer printed boards	EQV IEC 60326-2-76
31.180	L30	GB/T 4677.18-1988	多层印制板层间绝缘电阻测试方法	Test method for insulation resistance between layers of multilayer printed boards	EQV IEC 60326-2-76
31.180	L30	GB/T 4677.19-1988	印制板电路完善性测试方法	Test method for electrical integrity of printed boards
31.180	L30	GB/T 4677.20-1988	印制板镀层附着性试验方法 摩擦法	Test method for plating adhesion of printed boards--Burnishing	EQV IEC 60326-2-76
31.180	L30	GB/T 4677.21-1988	印制板镀层孔隙率测试方法 气体暴露法	Test method for plating porosity of printed boards--The gas exposure method
31.180	L30	GB/T 4677.22-1988	印制板表面离子污染测试方法	Test method for surface ionic contamination of printedboards
31.180	L30	GB/T 4677.23-1988	印制板阻燃性能测试方法	Test method for flammability of printed boards	EQV IEC 60326-2-76
31.180	L30	GB/T 4721-1992	印制电路用覆铜箔层压板通用规则	General rules for copper-clad laminated sheets for printed circuits	NEQ IEC 60249-85~88
31.180	L30	GB/T 4722-1992	印制电路用覆铜箔层压板试验方法	Test methods for copper-clad laminated sheets for printed circuits	NEQ IEC 60249-1-82
31.180	L30	GB/T 4723-1992	印制电路用覆铜箔酚醛纸层压板	Phenolic cellulose paper copper-clad laminated sheets for printed circuits	NEQ IEC 60249-2-85~88
31.180	L30	GB/T 4724-1992	印制电路用覆铜箔环氧纸层压板	Epoxide cellulose paper copper-clad laminated sheets for printed circuits	NEQ IEC 60249-2-87
31.180	L30	GB/T 4725-1992	印制电路用覆铜箔环氧玻璃布层压板	Epoxide woven glass fabric copper-clad laminated sheets for printed circuits	NEQ IEC 60249-2-87
31.030	L32	GB/T 4779.1-1984	彩色显象管用荧光粉Y22-G3荧光粉	Phosphors for color picture tubes use--Phosphor Y22-G3
31.030	L32	GB/T 4779.2-1984	彩色显象管用荧光粉Y22-B2荧光粉	Phosphors for color picture tubes use--Phosphor Y22-B2
31.030	L32	GB/T 4779.3-1984	彩色显象管用荧光粉Y22-R4荧光粉	Phosphors for color picture tubes use--Phosphor Y22-R4
31.060	K42	GB/T 4787-1996	断路器电容器	Circuit-breaker capacitors
31.260	L51	GB/T 4799-2001	激光器型号命名方法	The type designation for laseres
31.180	L30	GB/T 4825.1-1984	印制板导线局部放电测试方法	Test method for partial discharge of conductors on printed boards	NEQ IEC 60512-2
31.180	L30	GB/T 4825.2-1984	印制板导线载流量测试方法	Test method for current carrying capacity of conductors on printed boards	EQV ANSI C83.59
31.200	L56	GB/T 4855-1984	半导体集成电路线性放大器系列和品种	Families and products of linear amplifier for semiconductor integrated circuits
31.060.30	L11	GB/T 4874-1985	直流固定金属化纸介电容器总规范	Generic specification for fixed metallized paper dielectric capacitors for direct current
31.260	L51	GB/T 4931-2000	氦氖激光器系列型谱	The series and type spectrum for helium neon lasers
31.260	L51	GB/T 4932-2000	二氧化碳激光器系列型谱	The series and type spectrum for carbon dioxide lasers
31.080	L40	GB/T 4937-1995	半导体器件机械和气候试验方法	Mechanical and climatic test methods for semiconductor devices	IDT IEC 60749-84
31.020	L35	GB/T 4965-1985	吸气剂分类及型号命名方法	Classification and designation for getter
ICS 国際規格分類	中国標準分類	規格番号	規格名称(中国語)	規格名称(英語)	国際整合
31.020	L10	GB/T 5076-1985	具有两个轴向引出端的圆柱体元件的尺寸测量	Measurement of the dimensions of a cylindrical component having two axial terminations	EQV IEC 60294-69
31.020	L10	GB/T 5077-1985	电容器和电阻器的最大外形尺寸	Maximum case dimensions for capacitors and resistors	EQV IEC 60451-74
31.020	L10	GB/T 5078-1985	单向引出的电容器和电阻器所需空间的测定方法	Method for the determination of the space required by capacitors and resistors with unidirectional terminations	EQV IEC 60717-81
31.020	L05	GB/T 5081-1985	电子产品现场工作可靠性、有效性和维修性数据收集指南	Guide for the collection of reliability,availability and maintainability data from field performance of electronic items	IDT IEC 60362-71
31.220	L23	GB/T 5095.1-1997	电子设备用机电元件 基本试验规程及测量方法 第1部分: 总则	Electromechanical components for electronic equipment Basic testing procedures and measuring methods--Part 1: General	IDT IEC 60512-1:1994
31.220	L23	GB/T 5095.2-1997	电子设备用机电元件 基本试验规程及测量方法 第2部分: 一般检查、电连续性和接触电阻测试、绝缘试验和电压应力试验	Electromechanical components for electronic equipment Basic testing procedures and measuring methods--Part 2: General examination,electrical continuity and contact resistance tests,insulation tests and voltage stress tests	IDT IEC 60512-2:1994
31.220	L23	GB/T 5095.3-1997	电子设备用机电元件 基本试验规程及测量方法 第3部分: 载流容量试验	Electromechanical components for electronic equipment Basic testing procedures and measuring methods--Part 3: Current-carrying capacity tests	IDT IEC 60512-3:1976
31.220	L23	GB/T 5095.4-1997	电子设备用机电元件 基本试验规程及测量方法 第4部分: 动态应力试验	Electromechanical components for electronic equipment Basic testing procedures and measuring methods--Part 4: Dynamic stress tests	IDT IEC 60512-4:1976
31.220	L23	GB/T 5095.5-1997	电子设备用机电元件 基本试验规程及测量方法 第5部分: 撞击试验(自由元件)、静负荷试验(固定元件)、寿命试验和过负荷试验	Electromechanical components for electronic equipment--Basic testing procedures and measuring methods--Part 5: Impact tests(free components),static load test(fixed components),endurance tests and overload tests	IDT IEC 60512.5:1992
31.220	L23	GB/T 5095.6-1997	电子设备用机电元件 基本试验规程及测量方法 第6部分: 气候试验和锡焊试验	Electromechanical components for electronic equipment Basic testing procedures and measuring methods--Part 6: Climatic tests and soldering tests	IDT IEC 60512-6:1984
31.220	L23	GB/T 5095.7-1997	电子设备用机电元件 基本试验规程及测量方法 第7部分: 机械操作试验和密封性试验	Electromechanical components for electronic equipment Basic testing procedures and measuring methods--Part 7: Mechanical operating tests and sealing tests	IDT IEC 60512-7:1993
31.220	L23	GB/T 5095.8-1997	电子设备用机电元件 基本试验规程及测量方法 第8部分: 连接器、接触件及引出端的机械试验	Electromechanical components for electronic equipment--Basic testing procedures and measuring methods--Part 8: Connector tests(mechanical) and mechanical tests on contacts and terminations	IDT IEC 60512-8:1993
31.220	L23	GB/T 5095.9-1997	电子设备用机电元件 基本试验规程及测量方法 第9部分: 杂项试验	Electromechanical components for electronic equipment--Basic testing procedures and measuring methods--Part 9: Miscellaneous tests	IDT IEC 60512-9:1992
31.220	L23	GB/T 5095.11-1997	电子设备用机电元件 基本试验规程及测量方法 第11部分: 气候试验	Electromechanical components for electronic equipment--Basic testing procedures and measuring methods-Part 11: Climatic tests	IDT IEC 60512-11-1:1995
31.220	L23	GB/T 5095.12-1997	电子设备用机电元件 基本试验规程及测量方法 第12部分: 锡焊试验第六篇: 试验12f-在机器焊接中封焊处耐焊剂和清洁剂	Electromechanical components for electronic equipment--Basic testing procedures and measuring methods-Part 12: Soldering tests-Section 6: Test 12f--Sealing against flux and cleaning solvents in machine soldering	IDT IEC 60512-12-6-1996
31.220	L23	GB/T 5095.15-1997	电子设备用机电元件 基本试验规程及测量方法 第15部分: 接触件和引出端的机械试验 第八篇: 试验15h-接触件固定机构耐工具使用性	Electromechanical components for electronic equipment--Basic testing procedures and measuring methods-Part 15: Mechanical tests on contacts and terminations--Section 8: Test 15h--Contact retention system resistance to tool application	IDT IEC 60512-15-8-1995
31.260	L39	GB/T 5295-1985	光电阴极光谱响应特性系列	The spectral response characteristic series of photocathodes
31.260	Y40	GB 5296.3-1995	消费品使用说明 化妆品通用标签	Instructions for use of products--Generel labelling of cosmetics
31.180	L30	GB/T 5489-1985	印制板制图	Printed board drawing
31.030	C90	GB/T 5593-1996	电子元器件结构陶瓷材料	Structure ceramic materials used in electronic components
31.030; 31.	L32	GB/T 5594.1-1985	电子元器件结构陶瓷材料性能测试方法 气密性测试方法	Test methods for properties of structure ceramic used in electronic components--Test method for gas-tightness
31.030; 31.	L32	GB/T 5594.2-1985	电子元器件结构陶瓷材料性能测试方法 杨氏弹性模量、泊松比测试方法	Test methods for properties of structure ceramic used in electronic components--Test method for Youngs elastic modulus and Poisson ratio
31.030; 31.	L32	GB/T 5594.3-1985	电子元器件结构陶瓷材料性能测试方法 平均线膨胀系数测试方法	Test methods for properties of structure ceramic used in electronic components--Test method for mean coefficient of linear expansion
31.030; 31.	L32	GB/T 5594.4-1985	电子元器件结构陶瓷材料性能测试方法 介质损耗角正切值的测试方法	Test methods for properties of structure ceramic used in electronic components--Test method for dielectric loss angle tangent value
31.030; 31.	L32	GB/T 5594.5-1985	电子元器件结构陶瓷材料性能测试方法 体积电阻率测试方法	Test methods for properties of structure ceramic used in electronic components--Test method for volume resistivity
31.030; 31.	L32	GB/T 5594.6-1985	电子元器件结构陶瓷材料性能测试方法 化学稳定性测试方法	Test methods for properties of structure ceramic used in electronic components--Test method for chemical durability
31.030; 31.	L32	GB/T 5594.7-1985	电子元器件结构陶瓷材料性能测试方法 透液性测定方法	Test methods for properties of structure ceramic used in electronic components--Test method for liquid permeability
31.030; 31.	L32	GB/T 5594.8-1985	电子元器件结构陶瓷材料性能测试方法 显微结构的测定	Test methods for properties of structure ceramic used in electronic components--Determination of microstructure
31.030	L90	GB/T 5596-1996	电容器用陶瓷介质材料	Ceramic dielectric materials used for capacitors
31.030	L90	GB/T 5597-1999	固体电介质微波复介电常数的测试方法	Test method for complex permittivity of solid dielectric materials at microwave frequencies
31.040.10	L13	GB/T 5729-1994	电子设备用固定电阻器 第一部分: 总规范	Fixed resistors for use in electronic equipment--Part 1: Generic specification	IDT IEC 60115-1-82
31.040.10	L13	GB/T 5730-1985	电子设备用固定电阻器第二部分: 分规范: 低功率非线绕固定电阻器 (可供认证用)	Fixed resistors for use in electronic equipment--Part 2: Sectional specification: Fixed low-power nonwire wound resistors	IDT IEC 60115-2-82
31.040.10	L13	GB/T 5731-1985	电子设备用固定电阻器 第二部分: 空白详细规范: 低功率非线绕固定电阻器评定水平E (可供认证用)	Fixed resistors for use in electronic equipment--Part 2: Blank detail specification: Fixed low-power non-wirewound resistors--Assessment level E	IDT IEC 60115-2-1-82
31.040.10	L13	GB/T 5732-1985	电子设备用固定电阻器 第四部分: 分规范: 功率型固定电阻器(可供认证用)	Fixed resistors for use in electronic equipment--Part 4: Sectional specification: Fixed power resistors	IDT IEC 60115-4-82
31.040.10	L13	GB/T 5733-1985	电子设备用固定电阻器 第四部分: 空白详细规范: 功率型固定电阻器 评定水平E (可供认证用)	Fixed resistors for use in electronic equipment--Part 4: Blank detail specification: Fixed power resistors Assessment level E	IDT IEC 60115-4-1-83
31.040.10	L13	GB/T 5734-1985	电子设备用固定电阻器 第五部分: 分规范: 精密固定电阻器 (可供认证用)	Fixed resistors for use in electronic equipment--Part 5: Sectional specification: Fixed precision resistors	IDT IEC 60115-5-82
31.040.10	L13	GB/T 5735-1985	电子设备用固定电阻器 第五部分: 空白详细规范: 精密固定电阻器 评定水平E (可供认证用)	Fixed resistors for use in electronic equipment--Part 5: Blank detail specification: Fixed precision resistors--Assessment level E	IDT IEC 60115-5-1-83
31.030	L32	GB/T 5838-1986	荧光粉名词术语	Terms for phosphors
31.020	L04	GB/T 5839-1986	电子管和半导体器件额定值制	Rating systems for electronic tubes and semiconductor devices	IDT IEC 60134-61
31.100	L39	GB/T 5960-1986	阴极射线管总规范(可供认证用)	Generic specification for cathode ray tubes
31.120	L38	GB/T 5961-1986	彩色显象管空白详细规范(可供认证用)	Blank detail specification for colour picture tubes
31.200	L56	GB/T 5965-2000	半导体器件 集成电路 第2部分: 数字集成电路 第一篇 双极型单片数字集成电路门电路(不包括自由逻辑阵列) 空白详细规范	Semiconductor devices--Integrated circuits--Part 2: Digital integrated circuits--Section one--Blank detail specification for bipolar monolithic digital integrated circuit gates(excluding uncommitted logic arrays)	IDT IEC 60748-2-1:1991
31.060.10	L11	GB/T 5966-1996	电子设备用固定电容器 第8部分: 分规范: 1类瓷介固定电容器	Fixed capacitors for use in electronic equipment--Part 8: Sectional specification: Fixed capacitors of ceramic dielectric, class 1	IDT IEC 60384-8-1988
31.060.10	L11	GB/T 5967-1996	电子设备用固定电容器 第8部分: 空白详细规范 1类瓷介固定电容器 评定水平E	Fixed capacitors for use in electronic equipment--Part 8: Blank detail specification Fixed capacitors of ceramic dielectric, class 1--Assessment level E	IDT IEC 60384-8-1-1988
31.060.20	L11	GB/T 5968-1996	电子设备用固定电容器 第9部分: 分规范 2类瓷介固定电容器	Fixed capacitors for use in electronic equipment--Part 9: Sectional specification Fixed capacitors of ceramic dielectric, class 2	IDT IEC 60384-9-1988
31.060.20	L11	GB/T 5969-1996	电子设备用固定电容器 第9部分: 空白详细规范 2类瓷介电容器 评定水平 E	Fixed capacitors for use in electronic equipment--Part 9: Blank detail specification Fixed capacitor of ceramic dielectric, class 2 --Assessment level E	IDT IEC 60384-9-1-1988
31.060.50	L11	GB/T 5993-1986	电子设备用固定电容器 第四部分: 分规范 固体和非固体电解质铝电容器(可供认证用)	Fixed capacitors for use in electronic equipment--Part 4: Sectional specification--Aluminium electrolytic capacitors with solid and non-solid electrolyte	IDT IEC 60384-4-85
31.060.50	L11	GB/T 5994-1986	电子设备用固定电容器 第四部分: 空白详细规范 非固体电解质铝电容器 评定水平 E (可供认证用)	Fixed capacitors for use in electronic equipment--Part 4: Blank detail specification--Aluminium electrolytic capacitors with non-solid electrolyte--Assessment level E	IDT IEC 60384-4-1-85
31.120	L38	GB/T 5998-1994	彩色显象管测试方法	Methods of measurement of colour picture tubes
31.120	L38	GB/T 5999-1986	示波管和指示管测试方法	Methods of measurement of oscilloscope tubes and indicator tubes
ICS 国際規格分類	中国標準分類	規格番号	規格名称(中国語)	規格名称(英語)	国際整合
31.060	K42	GB/T 6115.1-1998	电力系统用串联电容器 第1部分: 总则 性能、试验和额定值 安全要求 安全导则	Series capacitors for power systems Part 1: General--Performance,testing and rating--Safety requirements--Guide for installation	EQV IEC 60143-1:1992
310.030	N05	GB/T 6145-1999	锰铜、康铜精密电阻合金线、片及带	Manganin and constantan alloy wires,sheet and rolled wires for precision electrical resistance
31.120	L38	GB/T 6206-1986	�K白显象管空白详细规范 (可供认证用)	Blank detail specification for black and white picture tubes	NEQ CECC 11001
31.120	L38	GB/T 6207-1986	示波管和指示管空白详细规范 (可供认证用)	Blank detail specification for oscilloscope tubes and indicator tubes	IDT CECC 11001
31.080.30	L42	GB/T 6217-1998	半导体器件 分立器件 第7部分: 双极型晶体管 第一篇 高低频放大环境额定的双极型晶体管空白详细规范	Semiconductor Devices Discrete devices Part 7: Bipolar transistors Section One-Blank detail specification for ambient-rated bipolar transistors for low and high frequency amplification	IDT IEC 60747-7-1:1989
31.080.30	L42	GB/T 6218-1996	开关用双极型晶体管空白详细规范	Blank detail specification for bipolar transistors for switching applications	IDT IEC 60747-7-3-1991
31.080.30	L42	GB/T 6219-1998	半导体器件 分立器件 第8部分: 场效应晶体管 第一篇 1GHz、5W以下的单栅场效应晶体管 空白详细规范	Semiconductor devices Discrete devices Part 8: Field-effect transistors Section One-Blank detail specification for singe-gate field-effect transistors up to 5W and 1GHz	IDT IEC 60747-8-1:1987
31.120	L38	GB/T 6250-1986	液晶显示器件名词术语	Terms for liquid crystal displays
31.120	L38	GB/T 6251-1986	液晶显示器件外形尺寸标注及引线排布规则	Dimensionsing of outline and rule of terminals alignment for liquid crystal displays
31.060.60	L11	GB/T 6252-1986	电子设备用A类调谐可变电容器类型规范	Type specification for variable tuning capacitors--Type A in electronic equipments	EQV IEC 60418-2-76
31.060.60	L11	GB/T 6253-1986	电子设备用B类微调可变电容器类型规范	Type specification for variable trimmer capacitors--Type B in electronic equipments	EQV IEC 60418-3-76
31.060.60	L11	GB/T 6254-1986	电子设备用C类预调可变电容器类型规范	Type specification for variable preset capacitors--Type C in electronic equipments	EQV IEC 60418-4-76
31.100	L36	GB/T 6255-2001	空间电荷控制电子管总规范	General specification for space-charge controlled tubes
31.080.30	L42	GB/T 6256-1986	工业加热三极管空白详细规范 (可供认证用)	Blank detail specification for industrial heating triodes
31.100	L36	GB/T 6257-1986	阳极耗散功率不大于1kW 的小功率发射管空白详细规范 (可供认证用)	Blank detail specification for small power transmitting tubes of anode dissipation up to 1kW
31.100	L38	GB/T 6258-1986	盘封电子管空白详细规范	Blank detail specification for disk seal power tubes
31.060.20	L11	GB/T 6261-1998	电子设备用固定电容器 第五部分: 分规范 额定电压不超过3000伏的直流云母介质固定电容器试验方法的选择和一般要求	Fixed capacitors for use in electronic equipment Part 5: Sectional specification Fixed mica dielectric d.c.capacitors with a rated voltage not exceeding 3000V Selection of methods of test and general requirements	IDT IEC 60384-5:1993
31.060.20	L11	GB/T 6262-1998	电子设备用固定电容 第五部分: 空白详细规范 额定电压不超过3000伏的直流云母介质固定电容器 评定水平E	Fixed capacitors for use in electronic equipment Part 5: Blank detail specification Fixed mica dielectric d.c.capacitors with a rated voltage not exceeding 3000V Assessment level E	IDT IEC 60384-5-1:1993
31.060.30	L11	GB/T 6346-1986	电子设备用固定电容器 第11部分: 分规范: 金属箔式聚乙烯对苯二甲酸乙二醇酯膜介质直流固定电容器 (可供认证用)	Fixed capacitors for use in electronic equipment--Part 11: Sectional specification: Fixed polyethylene-terephthalate film dielectric metal foil D.C.capacitors	IDT IEC TC 40(CO)612-85:FDIS
31.060.30	L11	GB/T 6347-1986	电子设备用固定电容器 第11部分: 空白详细规范: 金属箔式聚乙烯对苯二甲酸乙二醇酯膜介质直流固定电容器 评定水平 E(可供认证用)	Fixed capacitors for use in electronic equipment--Part 11: Blank detail specification: Fixed polyethylene-terephthalate film dielectric metal foil D.C. capacitors--Assessment level E	IDT IEC TC 40(CO)613-85:FDIS
31.080.10	L43	GB/T 6351-1998	半导体器件 分立器件 第2部分: 整流二极管 第一篇 100A以下环境或管壳额定整流二极管(包括雪崩整流二极管)空白详细规范	Semiconductor devices Discrete devices Part 2: Rectifier diodes Section One-Blank detail specification for rectifier diodes(including avalanche recti-fier diodes)1, ambient and case-rated,up to 100A	IDT IEC 60747-2-1:1989
31.080.20	L43	GB/T 6352-1998	半导体器件 分立器件 第6部分: 闸流晶体管 第一篇 100A以下环境或管壳额定反向阻断三极闸流晶体管空白详细规范	Semiconductor devices Discrete devices Part 6: Thyristors Section One-Blank detail specification for reverse blocking triode thyristors,ambient or case-rated,up to 100A	IDT IEC 60747-6-1:1989
31.260	N33	GB/T 6360-1995	激光功率能量测试仪器规范	Specification for laser radiation power and energy measuring equipment	EQV IEC 61040-1990
31.030	L90	GB/T 6426-1999	铁电陶瓷材料电滞回线的准静态测试方法	Quasi-static test method for ferroelectric hysteresis loop of ferroelectric ceramics
31.030	L90	GB/T 6427-1999	压电陶瓷振子频率温度稳定性的测试方法	Test method for freguency temperature stability of piezoelectric ceramic vibrator
31.080.20	L39	GB/T 6428-1995	氢闸流管测试方法	Methods of the measurement for hydrogen thyratron tubes	NEQ IEC 60151-20
31.140	L21	GB/T 6429-1986	石英谐振器型号命名方法	The rule of type designation for quartz crystal units
31.140	L21	GB/T 6430-1986	晶体盒型号命名方法	The rule of type designation for crystal holders (enclosures)
31.240	L89	GB/T 6431-1986	通信设备条形机架基本尺寸	Basic dimensions of narrow frame used for telecommunication equipment
31.080.10	L41	GB/T 6570-1986	微波二极管测试方法	Measuring methods for microwave diodes	NEQ IEC 60147-2-78
31.080.10	L42	GB/T 6571-1995	半导体器件 分立器件 第3部分:信号(包括开关)和调整二极管	Semiconductor devices--Discrete devices--Part 3: Signal(including switching)and regulator diodes	IDT IEC 60747-3-1985
31.080.10	L41	GB/T 6588-2000	半导体器件 分立器件 第3部分: 信号(包括开关)和调整二极管 第一篇 信号二极管、开关二极管和可控雪崩二极管空白详细规范	Semiconductor devices Discrete devices Part 3: Signal(including switching) and regulator diodes Section One--Blank detail specification for signal diodes,switching diodes and controlled-avalanche diodes	EQV IEC 60747-3-1:1986
31.080.10	L41	GB/T 6589-1986	电压调整和电压基准二极管 (包括温度补尝精密基准二极管) 空白详细规范 (可供认证用)	Blank detail specification for volt age regulator diodes and voltage reference diodes, excluding temperature compensated precision reference diodes	EQV IEC TC47 (CO)897-83:FDIS
31.080.20	L43	GB/T 6590-1998	半导体器件 分立器件 第6部分: 闸流晶体管 第二篇 100A以下环境或管壳额定的双向三极闸流晶体管空白详细规范	Semiconductor devices Discrete devices Part 6: Thyristors Section Two-Blank detail specification for bidirectional triode thyristors(triacs),ambient or case-rated,up to 100A	IDT IEC 60747-6-2:1991
31.030; 31.	L32	GB/T 6625-1986	掺氮吸气剂含氮量测试方法	Test methods for nitrogen content of nitrogen-doped getter
31.030; 31.	L32	GB/T 6626.1-1986	释汞吸气剂性能测试方法 释汞吸气剂释汞特性的测试方法	Test methods for the characteristics of getter-mercury dispenser--Test methods for mercury yield characteristic of getter-mercury dispenser
31.030; 31.	L32	GB/T 6626.2-1986	释汞吸气剂性能测试方法 释汞吸气剂含汞量的测试方法	Test methods for the characteristics of getter-mercury dispenser--Test method for mercury content of getter-mercury dispenser
31.030; 31.	L32	GB/T 6626.3-1986	释汞吸气剂性能测试方法 释汞吸气剂放气量的测试方法	Test methods for the characteristics of getter-mercury dispenser--Test method for gas emission of getter mercury dispenser
31.030; 31.	L32	GB/T 6626.4-1986	释汞吸气剂性能测试方法 释汞吸气剂压粉牢固度的检验方法	Test methods for the characteristics of getter-mercury dispenser--Method for peel off test of getter-mercury dispenser
31.030	L90	GB/T 6628-1996	人造石英晶体制材	Lumbered synthetic quartz crystal	NEQ IEC 60758-1993
31.200	L56	GB/T 6648-1986	半导体集成电路静态读/ 写存储器空白详细规范(可供认证用)	Blank detail specification for semiconductor integrated circuit static read/write memories	NEQ IEC TC 47/SC 47A(CO)988-85:FDIS
31.040.30	L15	GB/T 6663-1986	直热式负温度系数热敏电阻器总规范 (可供认证用)	General specification for the directly heated negative temperature coefficient thermistors	NEQ IEC 60539-76
31.040.30	L15	GB/T 6664-1986	直热式负温度系数热敏电阻器空白详细规范 评定水平E(可供认证用)	Blank detail specification for directly heated negative temperature coefficient thermistors--Assessment level E	NEQ IEC 60738-1-1-82
31.200	L56	GB/T 6798-1996	半导体集成电路 电压比较器测试方法的基本原理	Semiconductor integrated circuits--General principles of measuring methods of voltage comparators
31.200	L56	GB/T 6800-1986	半导体集成音响电路音频功率放大器测试方法的基本原理	General principles of measuring methods of audio power amplifiers for semicomductor audio integrated circuits
31.200	L56	GB/T 6812-1986	半导体集成非线性电路系列和品种 模拟乘- 除法器的品种	Families and variety of semiconductor integrated non-linear circuits variety of analog multipliers-dividers
31.200	L56	GB/T 6813-1986	半导体集成非线性电路系列和品种 时基电路的品种	Families and variety of semiconductor integrated non-linear circuits Variety of timers
31.200	L56	GB/T 6814-1986	半导体集成非线性电路系列和品种 模拟开关的品种	Families and variety of semiconductor integrated non-linear circuits variety of analog switch
31.200	L56	GB/T 6815-1986	半导体集成非线性电路系列和品种 锁相环的品种	Families and variety of semiconductor integrated non-linear circuits Variety of phase-locked loop
31.060.70	K48	GB/T 6915-1986	高原电力电容器	Power capacitors for high altitude districts
31.060.70	K42	GB/T 6916-1997	湿热带电力电容器	Power capacitors for damp tropics
31.020	L05	GB/T 6990-1986	电子设备用元器件(或部件)规范中可靠性条款的编写指南	Guide for the inclusion of reliability clauses into specifications for components (or parts) for electronic equipment	IDT IEC 60409-81
31.020	L05	GB/T 6993-1986	系统和设备研制生产中的可靠性程序	Reliability procedure for system and equipment development and production	NEQ MIL STD 78513
ICS 国際規格分類	中国標準分類	規格番号	規格名称(中国語)	規格名称(英語)	国際整合
31.040.10	L13	GB/T 7016-1986	固定电阻器电流噪声测量方法	Method of measurement of current noise generated in fixed resistors	IDT IEC 60195-65
31.040	L13	GB/T 7017-1986	电阻器非线性测量方法	Method of measurement of non-linearity in resistors	IDT IEC 60440-73
31.200	L55	GB/T 7092-1993	半导体集成电路外形尺寸	Outline dimensions of semiconductor integrated circuits
31.040.30	L15	GB/T 7153-1987	直热式阶跃型正温度系数热敏电阻器总规范 (可供认证用)	Generic specification for the directly heated positive step-function temperature coefficient thermistors	EQV IEC 60738-1-82
31.040.30	L15	GB/T 7154-1987	直热式阶跃型正温度系数热敏电阻器空白详细规范 评定水平E (可供认证用)	Blank detail specification for the directly heated positive step-function temperature coefficient thermistors--Assessement level E	EQV IEC 60738-1-1-82
31.060.40	L11	GB/T 7213-1987	电子设备用固定电容器第十五部分: 分规范 非固体或固体电解质钽电容器 (可供认证用)	Fixed capacitors for use in electronic equipment--Part 15: Sectional specification--Fixed tantalum capacitors with non-solid or solid electrolyte	EQV IEC 60384-15-84
31.060.40	L11	GB/T 7214-1987	电子设备用固定电容器 第十五部分: 空白详细规范 固体定电解质和多孔阳极钽电容器 评定水平 E (可供认证用)	Fixed capacitors for use in electronic equipment--Part 15: Blank detail specification--Fixed tantalum capacitors with solid electrolyte and porous anode--Assessment level E	EQV IEC 60384-15-1-84
31.260	N33	GB 7247.1-2001	激光产品的安全 第1部分: 设备分类、要求和用户指南	Safety of laser products Part 1: Equipment classification,requirements and user's guide	IDT IEC 60825-1:l993
31.260	L39	GB/T 7257-1987	氦氖激光器参数测试方法	Measurement methods of parameter for helium neon laser
31.260	L39	GB/T 7270-1987	光电倍�搖ﾇ测试方法	Methods of measurement for photomultiplier tubes	NEQ IEC 60306-69
31.260	L39	GB/T 7271-1987	光电管测试方法	Methods of measurement for phototubes	NEQ IEC 60306-69
31.100	L35	GB/T 7274-1987	电子管极间电容测试方法	Methods for the measurement of direct interelectrode capacitances of electronic tubes and valves	NEQ IEC 60100-62
31.060.30	L11	GB/T 7332-1996	电子设备用固定电容器 第2部分: 分规范: 金属化聚乙烯对苯二甲酸酯膜介质 直流固定电容器	Fixed capacitors for use in electronic equipment--Part 2: Sectional specification--Fixed metallized polyethylene-terephthalate film dielectric d.c.capacitors	IDT IEC 60384-2-1982
31.060.30	L11	GB/T 7333-1996	电子设备用固定电容器 第2部分: 空白详细规范 金属化聚乙烯对苯二甲酸酯膜介质 直流固定电容器 评定水平E	Fixed capacitors for use in electronic equipment--Part 2: Blank detail specification--Fixed metallized polyethylene-terephthalate film dielectric d.c.capacitors--Assessment level E	IDT IEC 60384-2-1-1982
31.040.10	L13	GB/T 7338-1996	电子设备用固定电阻器 第6部分: 分规范各电阻器可单独测量的固定电阻网络	Fixed resistors for use in electronic equipment--Part 6: Sectional specification--Fixed resistor networks with individually measurable resistors	IDT IEC 60115-6-1987
31.040.10	L13	GB/T 7339-1987	电子设备用固定电阻器 第六部分: 空白详细规范: 阻值和功耗相同, 各电阻器可单独测量的固定电阻网络 评定水平 E (可供认证用)	Fixed resistors for use in electronic equipment--Part 6: Blank detail specification--Fixed resistor networks with individually measurable resistors, all of equalvalue and equal dissipation--Assessment level E	IDT IEC 60115-6-1-83
31.040.10	L13	GB/T 7340-1987	电子设备用固定电阻器 第六部分: 空白详细规范: 阻值和功耗不同, 各电阻器可单独测量的固定电阻网络 评定水平 E (可供认证用)	Part 6: Blank detail specification--Fixed resistor networks with individually measurable resistor of either different resistance values or different rated dissipations--Assessment level E	IDT IEC 60115-6-2-83
31.160	K04	GB/T 7343-1987	10kHz - 30MHz无源无线电干扰滤波器和抑制元件抑制特性的测量方法	Methods of measurement of the suppresion characteristics of passive radio interference filters and suppression components over the frequency range of 10kHz to30MHz
31.240	L32	GB/T 7423.1-1987	半导体器件散热器 通用技术条件	Heat sink of semiconductor devices--Generic specification
31.240	L32	GB/T 7423.2-1987	半导体器件散热器 型材散热器	Heat sink of smiconductor devices--Heat sink, extruded shapes
31.240	L32	GB/T 7423.3-1987	半导体器件散热器 叉指形散热器	Heat sink of semiconductor devices--Heat sink, Staggered fingers shapes
31.080.30	L42	GB/T 7576-1998	半导体器件 分立器件 第7部分: 双极型晶体管 第四篇 高频放大管壳额定双极型晶体管空白详细规范	Semiconductor devices Discrete devices Part 7: Bipolar transistors Section Four-Blank detail specification for case-rated bipolar transistors for high-frequency amplification	IDT IEC 60747-7-4:1991
31.080.30	L42	GB/T 7577-1996	低频放大管壳额定的双极型晶体管空白详细规范	Blank detail specification for case-rated bipolar transistors for low-frequency amplification	IDT IEC 60747-7-2-1989
31.080	L42	GB/T 7581-1987	半导体分立器件外形尺寸	Dimensions of outlines for semiconductor discrete devices	NEQ IEC 60191-2-74
31.180	L30	GB/T 7613.1-1987	印制板导线耐电流试验方法	Test method for current proof of conductors on printed boards
31.180	L30	GB/T 7613.2-1987	印制板表层耐电压试验方法	Test methods for voltage proof of surface layers on printed boards
31.180	L30	GB/T 7613.3-1987	印制板金属化孔耐电流试验方法	Test methods for current proof of plated-through holes on printed boards
31.060.60	K43	GB/T 7675-1987	交流高压断路器的开合电容器组试验	The capacitor banks switching tests for A.C.high-voltage circuit-breaker	EQV IEC 60056-78
ICS 国際規格分類	中国標準分類	規格番号	規格名称(中国語)	規格名称(英語)	国際整合
31.080	K46	GB/T 8446.1-1987	电力半导体器件用散热器	Heat sink for power semiconductor device
31.080	K46	GB/T 8446.2-1987	电力半导体器件用散热器热阻和流阻测试方法	Measuring method of thermal resistance and input fluid-output fluid pressure difference of heat sink for power semiconductor device
31.080	K46	GB/T 8446.3-1988	电力半导体器件用散热器 绝缘件和紧固件	Insulators and fasteners for heat sink for power semiconductor device
31.240	L94	GB/T 8582-2000	电工、电子设备机械结构术语	Terminology for mechanical structures of electrotechnical and electronic equipment	NEQ IEC 60916:1988
31.020	H21	GB/T 8763-1988	非蒸散型吸气材料及制品吸气性能测试方法	Test methods of gas absorption characteristic for non-evaporation gettering materials and products
31.020	H64	GB/T 8766-1988	单水氢氧化锂	Lithium hydroxide monohydrate
31.120	L21	GB/T 8553-1987	晶体盒总规范	Holders (Enclosures), crystal, general specification for	EQV MIL-H 10056E-75
31.200	L55	GB/T 8976-1996	膜集成电路和混合膜集成电路总规范	Generic specification for film integrated circuits and hybrid film integrated circuits	EQV IEC 60748-20-1988
31.100	L37	GB/T 9043-1999	通信设备过电压保护用气体放电管通用技术条件	General technical requirements of gas discharge tubes for the over-voltage protection of telecommunications installations	NEQ ITU-T K.12:1995
31.060	N25	GB/T 9090-1988	标准电容器	Standard capacitors	NEQ GOCT 6746-75
31.200	L55	GB/T 9178-1988	集成电路术语	Terminology for integrated circuits	NEQ IEC 60748
31.120	L63	GB/T 9313-1995	数字电子计算机用阴极射线管显示设备通用技术条件	General specifications for CRT display device of computer
31.180	L30	GB/T 9315-1988	印制电路板外形尺寸系列	Series for printed boards outside dimension
31.060.20	L11	GB/T 9320-1988	电子设备用固定电容器 第八部分 (1): 分规范 1类高压瓷介电容器 (可供认证用)	Fixed capacitors for use in electronic equipment--Part 8(1): Sectional specification: Fixed classs 1 high voltage ceramic dielectric capacitors
31.060.20	L11	GB/T 9321-1988	电子设备用固定电容器 第八部分(1): 空白详细规范 1 类高压瓷介电容器 评定水平 E (可供认证用)	Fixed capacitors for use in electronic equipment--Part 8(1): Blank detail specification: Fixed class 1 ceramic dielectric capacitors--Assessment level E
31.060.20	L11	GB/T 9322-1988	电子设备用固定电容器 第九部分 (1): 分规范 2 类高压瓷介电容器 (可供认证用)	Fixed capacitors for use in electronic equipment--Part 9(1): Sectional specification: Fixed class 2 high voltage ceramic dielectric capacitors
31.060.20	L11	GB/T 9323-1988	电子设备用固定电容器 第九部分 (1): 空白详细规范 2类高压瓷介电容器 评定水平 E (可供认证用)	Fixed capacitors for use in electronic equipment--Part 9(1): Blank detail specification: Fixed class 2 ceramic dielectric capacitors--Assessment level E
31.060.20	L11	GB/T 9324-1996	电子设备用固定电容器 第10部分: 分规范 多层片式瓷介电容器	Fixed capacitors for use in electronic equipment--Part 10: Sectional specification--Fixed multilayer ceramic chip capacitors	IDT IEC 60384-10-1989
31.060.20	L11	GB/T 9325-1996	电子设备用固定电容器 第10部分: 空白详细规范 多层片式瓷介电容器 评定水平E	Fixed capacitors for use in electronic equipment--Part 10: Blank detail specification Fixed multilayer ceramic chip capacitors Assessment level E	IDT IEC 60384-10-1-1989
31.030	L90	GB/T 9394-1998	电子工业用硅酸钾溶液	Potassium silicate solution for use in electronic industry
31.200	L56	GB/T 9423-1988	半导体集成TTL电路系列和品种 54/74 ALS 系列的品种	Series and products for semiconductor TTL integrated circuits--Products of 54/74ALS family
31.200	L56	GB/T 9424-1998	半导体器件 集成电路 第2部分: 数字集成电路 第五篇 CMOS数字集成电路4000B和4000UB系列空白详细规范	Semiconductor devices lntegrated circuits Part 2: Digital Semiconductor devices lntegrated circuits Part 2: Digital integrated circuits Section five-Blank detail specification for complementary MOS digital integrated circuits,series 4000B and 4000UB	IDT IEC 60748-2-5:1992
31.200	L56	GB/T 9425-1988	半导体集成电路运算放大器空白详细规范 (可供认证用)	Blank detail specification for semiconductor integrated circuit operational amplifiers	EQV IEC TC 47/SC 47A(sec)161:CD or CVD
31.120	L39	GB/T 9430-1988	荧光数码显示管亮度稳定性试验方法	Methods of test of luminance stability for fluorescent display tubes
31.100	L36	GB/T 9431-1988	阳极耗散功率大于 1kW的玻壳发射管空白详细规范 (可供认证用)	Blank detail specification for glass enevelope transmitting tubes of anode dissipation over 1kW	NEQ CECC 45003
31.080.30	L36	GB/T 9432-1988	工业加热用四极管空白详细规范 (可供认证用)	Blank detail specification for industrial heating tetrode	NEQ CECC 45002
31.100	L39	GB/T 9433-1988	过电压保护气体放电管总规范 (可供认证用)	General specification of gas discharge tubes for overvoltage protection
31.100	L39	GB/T 9434-1988	过电压保护气体放电管测试方法	Methods of measurement of gas discharge tubes for overvoltage protection
31.120	L38	GB/T 9435-1988	彩色显像管有效屏面尺寸	Useful screen dimensions for color picture tubes	EQV EIA RS324A-82
31.120	L43	GB/T 9436-1988	液晶显示器件参数符号	Letter symbols of parameter for liquid crystal display devices
31.030	L32	GB/T 9489.1-1988	刚玉粉分析方法通则	General rule for analytical method of alundum powder
31.030	L32	GB/T 9489.2-1988	刚玉粉中氧化钙、氧化镁、二氧化硅、三氧化二铁、二氧化钛的电感耦合高频等离子体发射光谱法测定	Determination of CaO,MgO,SiO2,Fe2O3,TiO2 in alundum powder by ICP-AES
31.030	L32	GB/T 9489.3-1988	刚玉粉中三氧化二铁、氧化钙、氧化镁、氧化钠、氧化钾的原子吸收分光光度测定法	Determination of Fe2O3,CaO,MgO,Na2O and K2O in alundum powder by atomic absorption spectrophotometry
31.030	L32	GB/T 9489.4-1988	刚玉粉中三氧化二铝含量的络合滴定 氟化物释放测定法	Determination of Al2O3 in alundum powder by complexometric titration
31.030	L32	GB/T 9489.5-1988	刚玉粉中二氧化硅的比色测定法	Determination of SiO2 in alundum powder by colorimetry
31.030	L32	GB/T 9489.6-1988	刚玉粉中二氧化钛的比色测定法	Determination of TiO2 in alundum powder by colorimetry
31.030	L32	GB/T 9489.7-1988	刚玉粉中氯根的目视比浊测定法	Determination of chloride in alundum powder by visual turbidimetry
31.030	L32	GB/T 9489.8-1988	刚玉粉中碳和硫的测定方法	Methods for determination of carbon and sulphur in alundum powder
31.030	L32	GB/T 9489.9-1988	刚玉粉PH值的测定方法	Methods for determination of pH in alundum powder
31.030	L32	GB/T 9489.10-1988	刚玉粉灼烧失重的测定方法	Method for determination of ignition loss of alundum powder
31.030	L90	GB/T 9505-1998	蒸散型钡吸气剂	Barium flash getters
31.030	L32	GB/T 9506.1-1988	吸气剂性能测试方法通则	Generic rules for test method of getter properties
31.030	L32	GB/T 9506.2-1988	蒸散型钡吸气剂得钡量测试方法	Test method for barium yield of barium flash getter
31.030	L32	GB/T 9506.3-1988	蒸散型钡吸气剂载料和模中钡量的测定	Test method for barium content in getter fill and getter film of barium flash getter
31.030	L32	GB/T 9506.4-1988	吸气剂放气量测试方法	Test method for amount of gas evolved from getter
31.030	L32	GB/T 9506.5-1988	掺氮吸气剂释氮吸气动态曲线测试方法	Test method for nitrogen-released and gas-absorbed dynamic curve of nitrogen-doped getter
31.030	L32	GB/T 9506.6-1988	掺氮吸气剂钡膜分布测试方法	Test method for barium film distribution of nitrogen-doped getter
31.030	L32	GB/T 9506.7-1988	蒸散型钡吸气剂吸气性能测试方法	Test method for gettering properties of barium flash getter
31.030	L32	GB/T 9506.8-1988	非蒸散型吸气剂吸气性能测试方法	Test method for gettering properties of non-evaporable getter
31.030	L32	GB/T 9506.9-1988	吸气剂装载量测试方法	Test method for amount of filling getter
31.030	L32	GB/T 9506.10-1988	吸气剂压制或烧结牢固度测试方法	Test method for firmness of getter by pressure or sinter
31.030	L32	GB/T 9506.11-1988	吸气剂支架焊接强度测试方法	Test method for weld strenght of getter support
31.020	L28	GB/T 9530-1988	电子陶瓷名词术语	Terms for electronic ceramics
31.020	L28	GB/T 9531.1-1988	电子陶瓷零件技术条件	General specification for electronic ceramic parts
31.020	L28	GB/T 9531.2-1988	A 类瓷件技术条件	Specification for ceramic parts,type A
31.020	L28	GB/T 9531.3-1988	B 类瓷件技术条件	Specification for ceramic parts,type B
31.020	L28	GB/T 9531.4-1988	C 类瓷件技术条件	Specification for ceramic parts,type C
31.020	L28	GB/T 9531.5-1988	D 类瓷件技术条件	Specification for ceramic parts,type D
31.020	L28	GB/T 9531.6-1988	E 类瓷件技术条件	Specification for ceramic part,type E
31.020	L28	GB/T 9531.7-1988	F 类瓷件技术条件	Specification for ceramic parts,type F
31.020	L21	GB/T 9532-1988	铌酸锂、钽酸锂、锗酸铋、硅酸铋压电单晶材料型号命名方法	Designations for LiNbO3, LiTaO3, Bi12, GeO20, Bi12 SiO20 piezoelectric crystals
31.220.20	L22	GB/T 9536-1995	电子设备用机电开关 第1部分: 总规范	Electromechanical switches for use in electronic equipment--Part 1: Generic specification	IDT IEC 61020-1:1991
31.220.20	L22	GB/T 9537-1988	电子设备用键盘开关 第一部分: 总规范 (可供认证用)	Keyboard switches for use in electronic equipment--Part 1: Generic specification
31.040.10	L13	GB/T 9546-1995	电子设备用固定电阻器 第8部分:分规范:片式固定电阻器	Fixed resistors for use in electronic equipment--Part 8: Sectional specification: Fixed chip resistors	IDT IEC 60115-8-1989
31.120	L39	GB/T 9586-1988	荧光数码显示管加速寿命试验方法	Methods of accelerated life test of fluorescent display tubes
31.100	L36	GB/T 9587-1988	阳极耗散功率大于1kW的金属陶瓷发射管空白详细规范(可供认证用)	Blank detail specification for matal ceramic transmitting tubes of anode dissipation over 1kW	NEQ CECC 45003-75
31.100	L39	GB/T 9588-1988	盖革-弥勒计数管测试方法	Methods of measurement of Geiger-muller counter tubes
31.060.20	L11	GB/T 9597-1988	电子设备用固定电容器 分规范: 1类高功率瓷介电容器(可供认证用)	Fixed capacitors for use in electronic equipment--Sectional specification--Fixed high reactive power--Classl 1 ceramic dielectric capacitors	NEQ IEC 60384-8-82
31.060.20	L11	GB/T 9598-1988	电子设备用固定电容器 空白详细规范: 1 类高功率瓷介电容器 评定水平E(可供认证用)	Fixed capacitors for use in electronic equipment--Blank detail specification--Fixed high reactive power--Classl 1 ceramic dielectric capacitors assessment level E	NEQ IEC 60384-8-1-82
31.100	L37	GB/T 9602-1988	连续波磁控管电性能测试方法	Measuring methods of electrical properties of continuous wave magnetrons
ICS 国際規格分類	中国標準分類	規格番号	規格名称(中国語)	規格名称(英語)	国際整合
31.060.30	L11	GB/T 10185-1988	电子设备用固定电容器第7部分:分规范: 金属箔式聚苯乙烯膜介质直流固定电容器	Fixed capacitors for use in electronic equipment--Part 7: Sectional specification: Fixed polystyrene film dielectric metal foil d.c. capacitors	IDT IEC 60389-74
31.060.30	L11	GB/T 10186-1988	电子设备用固定电容器 第7部分: 空白详细规范:金属箔式聚苯乙烯膜介质直流固定电容器 评定水平E (可供认证用)	Fixed capacitors for use in electronic equipment--Part 7: Blank detail specification: Fixed polystyrene film dielectric metal foil d.c. capacitors--Assessment level E	IDT IEC 60384-7
31.060.30	L11	GB/T 10188-1988	电子设备用固定电容器 第13部分: 分规范: 金属箔式聚丙烯膜介质直流固定电容器 (可供认证用)	Fixed capacitors for use in electronic equipment--Part 13: Sectional specification: Fixed polypropylene film dielectric metal foil d.c. capacitors	IDT IEC 60384-13-85
31.060.30	L11	GB/T 10189-1988	电子设备用固定电容器 第13部分: 空白详细规范: 金属箔式聚丙烯膜介质直流固定电容器 评定水平E (可供认证用)	Fixed capacitors for use in electronic equipment--Part 13: Blank detail specification: Fixed polypropylene film dielectric metal foil d.c. capacitors--Assessment level E	IDT IEC 60384-13-1-85
31.060.30	L11	GB/T 10190-1988	电子设备用固定电容器 第16部分: 分规范: 金属化聚丙烯膜介质直流固定电容器 (可供认证用)	Fixed capacitors for use in electronic equipment--Part 16: Sectional specification: Fixed metallized polypropylene film dielectric d.c. capacitors	IDT IEC 60384-16-82
31.060.30	L11	GB/T 10191-1988	电子设备用固定电容器 第16部分: 空白详细规范: 金属化聚丙烯膜介质直流固定电容器 评定水平E (可供认证用)	Fixed capacitors for use in electronic equipment--Part 16: Blank detail specification: Fixed metallized polypropylene film dielectric d.c. capacitors--Assessment level E	IDT IEC 60384-16-1-82
31.040.30	L15	GB/T 10193-1997	电子设备用压敏电阻器 第1部分: 总规范	Varistors for use in electronic equipment--Part 1: Generic specification	IDT IEC 61051-1:1991
31.040.30	L15	GB/T 10194-1997	电子设备用压敏电阻器 第2部分: 分规范 浪涌抑制型压敏电阻器	Varistors for use in electronic equipment-Part 2: Sectional specification for surge suppression varistors	IDT IEC 61051-2:1991
31.040.30	L15	GB/T 10195.1-1997	电子设备用压敏电阻器 第2部分: 空白详细规范 碳化硅浪涌抑制型压敏电阻器 评定水平E	Varistors for use in electronic equipment-Part 2: Blank detail specification for silicon carbide surge suppression varistors Assessment leval E	IDT IEC 61051-2-1:1991
31.040.30	L15	GB/T 10195.2-1997	电子设备用压敏电阻器 第2部分: 空白详细规范 氧化锌浪涌抑制型压敏电阻器 评定水平E	Varistors for use in electronic equipment-Part 2: Blank detail specification for zinc oxide surge suppression varistors Assessment level E	IDT IEC 61051-2-2:1991
31.030	L32	GB/T 10304.1-1988	阴极碳酸盐分析方法通则	General rule for analytical method of cathode carbonate
31.030	L32	GB/T 10304.2-1988	阴极碳酸盐中碳酸钡含量的测定 重铬酸钾碘量滴定法	Determination of BaCo3 in cathode carbonate by dichromate iodimetry
31.030	L32	GB/T 10304.3-1988	阴极碳酸盐中碳酸钙含量的络合滴定测定	Determination of CaCo3 in cathod carbonate by complexometric titration
31.030	L32	GB/T 10304.4-1988	阴极碳酸盐中碳酸钙、碳酸锶的原子吸收分光光度测定	Determination of CaCo3, SrCo3 in cathode carbonate by atomic absorption spectrophotometry
31.030	L32	GB/T 10304.5-1988	阴极碳酸盐中硝酸根的测定	Determination of nitrate in cathode carbonate
31.030	L32	GB/T 10304.6-1988	阴极碳酸盐中钠的原子吸收分光光度测定	Determination of Na in cathode carbonate by atomic absorption spectrophotometry
31.030	L32	GB/T 10304.7-1988	阴极碳酸盐中盐酸不溶物的测定	Determination of nonsolute for chloric acid in cathode carbonate
31.030	L32	GB/T 10304.8-1988	阴极碳酸盐中铁的测定	Determination of Fe in cathode carbonate
31.030	L32	GB/T 10304.9-1988	阴极碳硫盐中氯根的测定	Determination of chloride in cathode carbonate
31.030	L32	GB/T 10304.10-1988	阴极碳酸盐中硫酸根的测定	Determination of sulphate in cathode carbonate
31.030	L32	GB/T 10304.11-1988	阴极碳酸盐中重金属(以Pb计)的测定	Determination of heavy metals in cathode carbonate
31.030	L32	GB/T 10304.12-1988	阴极碳酸盐灼烧失重的测定	Determination of ignition losses in cathode carbonate
31.030	L32	GB/T 10305-1988	阴极碳酸盐粒度分布的测定 离心沉降法	Test method for particle distribution of cathode carb-onates by centrifugation sedimentation
31.030	L32	GB/T 10306-1988	阴极碳酸盐	Cathode carbonates
31.030	L32	GB/T 10307-1988	阴极碳酸盐牌号命名方法	Designation for cathode carbonates	NEQ ASTM F70
31.030	L32	GB/T 10308-1988	示波管和显示管用Y1荧光粉	Phosphor Y1 for oscilloscope tubes and display tubes
31.030	L32	GB/T 10309-1988	示波管和显示管用Y14荧光粉	Phosphor Y14 for oscilloscope tubes and display tubes
31.030	L32	GB/T 10310-1988	�K白显像管用Y4-W2荧光粉	Phosphor Y4-W2 for black-white picture tubes
31.030	L32	GB/T 10311-1988	�K白显像管用Y4-B1荧光粉	Phosphor Y4-B1 for black-white picture tubes
31.030	L32	GB/T 10312-1988	�K白显像管用Y4-Y2荧光粉	Phosphor Y4-Y2 for black-white picture tubes
31.030	L32	GB/T 10313-1988	雷达指示管用Y16荧光粉	Phosphor Y16 for radar indicator tubes
31.030	L32	GB/T 10314-1988	双层屏指示管用Y3荧光粉	Phosphor Y3 for double-decker screen indicator tubes
31.030	L32	GB/T 10315-1988	双层屏指示管用G11荧光粉	Phosphor G11 for double-decker screen indicator tubes
31.030	L32	GB/T 10316-1988	双层屏指示管用G16荧光粉	Phosphor G16 for double-decker screen indicator tubes
31.030	L32	GB/T 10317-1988	示波管和显示管用Y10荧光粉	Phosphor Y10 for oscilloscope tubes and image display tubes
31.030	L32	GB/T 10318-1988	夜视器件和存储管用Y20荧光粉	Phosphor Y20 for low-light-level picture tubes and storage tubes
31.260	L51	GB 10320-1995	激光设备和设施的电气安全	Electrical safety of laser equipment and installations	EQV IEC 60820-1986
ICS 国際規格分類	中国標準分類	規格番号	規格名称(中国語)	規格名称(英語)	国際整合
31.060.70	K42	GB/T 11024.1-2001	标称电压1kV以上交流电力系统用并联电容器 第1部分: 总则--性能、试验和定额--安全要求--安装和运行导则	Shunt capacitors for a.c.power systems having a rated voltage above 1kV Part 1: General--Performance,testing and rating--Safety requirements--Guide for installation and operation	EQV IEC 60871-1:1997
31.060.70	K42	GB/T 11024.2-2001	标称电压1kV以上交流电力系统用并联电容器 第2部分: 耐久性试验	Shunt capacitors for a.c.power systems having a rated voltage above 1kV Part 2: Endurance testing	IDT IEC TS 60871-2:1999
31.060.70	K42	GB/T 11024.3-2001	标称电压1kV以上交流电力系统用并联电容器 第3部分: 并联电容器和并联电容器组的保护	Shunt capacitors for a.c.power systems having a rated voltage above 1kV Part 3: Protection of shunt capacitors and shunt capacitor banks	EQV IEC TR 60871-3:1996
31.060.70	K42	GB/T 11024.4-2001	标称电压1kV以上交流电力系统用并联电容器 第4部分: 内部熔丝	Shunt capacitors for a.c.power systems having rated voltage above 1kV Part 4: Internal fuses	IDT IEC 60871-4:1996
31.020; 31.	L32	GB/T 11113-1989	人造石英晶体中杂质的分析方法	Analytical method for impurities in the synthetic quartz crystal
31.020; 31-	L32	GB/T 11114-1989	人造石英晶体位错的X 射线形貌检测方法	Method for detecting dislocations of synthetic quartz crystal using X-ray topographic technique
31.060	N25	GB/T 11149-1989	标准电容箱	Standard capacitance boxes	NEQ ΓOCT 6746-75
31.260	L48	GB/T 11153-1989	激光小功率计性能检测方法	Parameters testing method of laser power meter in low range
31.260	L32	GB/T 11293-1989	固体激光材料名词术语	Terms and definitions of solid-state laser materials
31.260	L32	GB/T 11295-1989	激光晶体棒型号命名方法	Designation for laser crystal rods
31.020	L32	GB/T 11296-1989	红外探测材料型号命名方法	Designation for infrared detecting materials
31.020	L32	GB/T 11297.1-1989	激光棒波前畸变的测量方法	Test method for wavefront distortion of laser rods
31.260	L32	GB/T 11297.2-1989	激光棒侧向散射系数的测量方法	Test method for side direction scattering coefficient of laser rods
31.260	L32	GB/T 11297.3-1989	掺钕钇铝石榴石激光棒消光比的测量方法	Test method for extinction ratio of Nd: YAG laser rods
31.260	L32	GB/T 11297.4-1989	掺钕钇铝石榴石激光棒长脉冲激光阈值及斜率效率的测量方法	Test method for normal pulse lasing threshold and slope efficiency of Nd: YAG laser rods
31.260	L32	GB/T 11297.5-1989	掺钕钇铝石榴石激光棒连续激光阈值、斜率效率和输出功率的测量方法	Test method for continous lasing threshold, slope efficiency and output power of Nb: YAG laser rods
31.030	L32	GB/T 11297.8-1989	热释电材料热释电系数的测试方法	Test method for pyroelectric coefficient of pyroelectric materials
31.030	L32	GB/T 11297.9-1989	热释电材料介质损耗角正切 tanδ的测试方法	Test method for dielectric tangent of loss angle of pyroelectric material
31.020	L32	GB/T 11297.10-1989	热释电材料居里温度 Tc 的测试方法	Test method for curie temperature of pyroelectric materials
31.020	L32	GB/T 11297.11-1989	热释电材料介电常数的测试方法	Test method for the dielectric constant of pyroelectric materials
31.020	L32	GB/T 11297.12-1989	电光晶体铌酸锂、磷酸二氢钾和磷酸二氘钾消光比的测量方法	Test method for extinction ratio of LN, KDP and KDP electrooptic crystal
31.060.60	L11	GB/T 11300-1989	电子设备用A 类调谐可变电容器空白详细规范	Blank detail specification for variable tuning capacitors type A in electronic equipments	EQV IEC 60418-2A-80
31.060.60	L11	GB/T 11301-1989	电子设备用装有整体C 类预调电容器的A 类调谐可变电容器空白详细规范	Blank detail specification for variable tuning capacitors type A fitted with integral preset capacitors type C in electronic equipments	EQV IEC 60418-2B-80
31.060.60	L11	GB/T 11302-1989	电子设备用B 类微调可变电容器空白详细规范	Blank detail specification for variable trimmer capacitors type B in electronic equipments	EQV IEC 60418-3A-80
31.060.60	L11	GB/T 11303-1989	电子设备用C 类预调可变电容器 空白详细规范	Blank detail specification for variable preset capacitors type C in electronic equipments	EQV IBC 60418-4A
31.060.30	L11	GB/T 11305-1989	电子设备用固定电容器 分规范: 3 类瓷介电容器 (可供认证用)	Fixed capacitors for use in electronic equipment - Sectional specification: Fixed capacitors of ceramic dielectric, class 3
31.060.30	L11	GB/T 11306-1989	电子设备用固定电容器 空白详细规范: 3 类瓷介电容器 评定水平 E (可供认证用)	Fixed capacitors for use in electronic equipment - Blank detail specification: Fixed capacitors of ceramic dielectric, class 3 - Assessment level E	NEQ IEC 60384-9-1-84
31.140	L32	GB/T 11309-1989	压电陶瓷材料性能测试方法 纵向压电应变常数 d33的准静态测试	Test methods for the properties of piezoelectric ceramics - Quasi-static test for piezoelectric strain content d33
31.140	L32	GB/T 11310-1989	压电陶瓷材料性能测试方法 相对自由介电常数温度特性的测试	Test methods for the properties of piezoelectric ceramics - Test methods for temperature characteristics of relative free dielectric constants
31.140	L32	GB/T 11311-1989	压电陶瓷材料性能测试方法 泊松比бE的测试	Test methods for the properties of piezoelectric ceramics test for Poisson's ratio
31.140	L32	GB/T 11312-1989	压电陶瓷材料和压电晶体声表面波性能测试方法	Test methods for SAW properties of piezoelectric ceramics and crystals
31.220.10	L23	GB/T 11313-1996	射频连接器 第1部分: 总规范 一般要求和试验方法	Redio-frequency connectors--Part 1: Generic specification--General requirements and measuring methods	IDT IEC 61169-1-1992
31.140	L32	GB/T 11320-1989	压电陶瓷材料性能测试方法 低机械品质因数压电陶瓷材料性能的测试	Test methods for the properties of piezoelectric ceramics material with the low mechanical quality factor
31.140	L18	GB/T 11387-1989	压电陶瓷材料静态弯曲强度试验方法	Testing method for static flexural strength of piezoellectric ceramics	NEQ ISO 12370-80
31.030	L90	GB/T 11446.1-1997	电子级水	Electronic grade water	NEQ ASTM D5127:1990
31.030	L90	GB/T 11446.3-1997	电子级水测试方法通则	Generic rules for test methods of electronic grade water	NEQ ASTM D5196:1991
31.030	L90	GB/T 11446.4-1997	电子级水电阻率的测试方法	Test methods for resistivity of electronic grade water	NEQ ASTM D5127:1990
31.030	L90	GB/T 11446.5-1997	电子级水中痕量金属的原子吸收分光光度测试方法	Test method for measuring trace metals in electronic grade water by atomic absorption spectrophotometry	NEQ ASTM D5127:1990
31.030	L90	GB/T 11446.6-1997	电子级水中二氧化硅的分光光度测试方法	Test method for Si2O in electronic grade water by spectrophotometer	NEQ ASTM D5127:1990
31.030	L90	GB/T 11446.7-1997	电子级水中痕量氯离子、硝酸根离子、磷酸根离子、硫酸根离子的离子色谱测试方法	Test method for trace chloride,nitrate,phosphate,sulfate in electronic grade water by ion-chromatography	NEQ ASTM D5127:1990
31.030	L90	GB/T 11446.8-1997	电子级水中总有机碳的测试方法	Test method for total organic carbon in electronic grade water	NEQ ASTM D5127-90
31.030	L90	GB/T 11446.9-1997	电子级水中微粒的仪器测试方法	Test method for particles in electronic grade water by instrument	NEQ ASTM D5127:1990
31.030	L90	GB/T 11446.10-1997	电子级水中细菌总数的滤膜培养测试方法	Test method for total bacterial count in electronic grade water by membrane filters	NEQ ASTM D5127:1990
31.120	L38	GB/T 11478-1989	摄象管总规范(可供认证用)	Generic specification for camera tubes	EQV CECC 13000-81
31.120	L38	GB/T 11479-1989	摄象管空白详细规范(可供认证用)	Blank detail specification for camera tubes	EQV CECC 13000-81
31.120	L38	GB/T 11480-1989	摄象管测试方法	Methods of measurement for camera tubes	NEQ IEC 60151-26-71
31.120	L39	GB/T 11482-1989	交流等离子体显示器件总规范 (可供认证用)	Generic specification for AC plasma display devicas
31.120	L39	GB/T 11483-1989	交流等离子体显示器件测试方法	Methods of measurement for Ac plasma display devices
31.100	L38	GB/T 11490-1989	彩色显象管管基尺寸	Dimensions of base for colour picture tube
31.030	L32	GB/T 11496.1-1989	彩色显示管用Y30-G1 荧光粉	Phosphors Y30-G1 for color display tubes
31.030	L32	GB/T 11496.2-1989	彩色显示管用Y30-B1荧光粉	Phosphor Y30-B1 for color display tubes
31.200	L56	GB/T 11497.1-1989	半导体集成电路CMOS电路系列和品种 54/74HC 系列的品种	Series and products for CMOS semiconductor integrated circuits products of series 54/74HC
31.200	L56	GB/T 11497.2-1989	半导体集成电路CMOS电路系列和品种 54/74HCT 系列的品种	Series and products for CMOS semiconductor integrated circuits products of series 54/74HCT
31.200	L55	GB/T 11498-1989	膜集成电路和混合膜集成电路分规范 (采用鉴定批准程序) (可供认证用)	Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedure
31.080.01	L40	GB/T 11499-2001	半导体分立器件文字符号	Letter symbols for discrete semiconductor devices
ICS 国際規格分類	中国標準分類	規格番号	規格名称(中国語)	規格名称(英語)	国際整合
31.100	L39	GB/T 12078-1989	X 射线管总规范 (可供认证用)	Generic specification for X-ray tubes
31.100	L39	GB/T 12079-1989	X 射线管光电性能测试方法	Measurements of the photoelectric properties for X-ray tubes
31.260	L39	GB/T 12082-1989	气体激光器文字符号	Letter symbols for gas lasers
31.260	L39	GB/T 12083-1989	气体激光器电源系列	Power supply series for gas lasers	IDT ГOCT 1904-79
31.200	L56	GB/T 12084-1989	半导体集成电路TTL 电路系列和品种 54/74F系列的品种	Series and products for TTL semiconductor integrated circuits - products of series 54/74F
31.220.10	L23	GB/T 12272-1990	射频同轴连接器耐射频高电位电压测试方法	Measuring method of radio-frequency high potential withstanding voltage for radio-frequency coaxial connectors
31.020	L21	GB/T 12273-1996	石英晶体元件 电子元器件质量评定体系规范 第1部分: 总规范	Quartz crystal units--A specification in the quality assessment system for electronic components--Part 1: Generic specification	IDT IEC 61178-1-1993
31.140	L21	GB/T 12274-1990	石英晶体振荡器总规范 (可供认证用)	Quartz crystal controlled oscillators - Generic specification for	IDT IEC 60679-1
31.140	L21	GB/T 12275-1990	石英晶体振荡器型号命名方法	The rule of type designation for quartz crystal oscillators
31.040.10	L13	GB/T 12276-1990	电子设备用固定电阻器 第七部分: 分规范 各电阻器不可单独测量的固定电阻网络 (可供认证用)	Fixed resistors for use in electronic equipment Part 7: Sectional specification:Fixed resistor networks in which not all resistors are individually measurable	IDT IEC 60115-7-84
31.040.10	L13	GB/T 12277-1990	电子设备用固定电阻器 第七部分: 空白详细规范: 各电阻器不可单独测量的固定电阻网络 评定水平 E (可供认证用)	Fixed resistors for use in electronic equipment - Part 7 : Blank detail specification - Fixed resistor networks in which not all resistors are individually measurable？Assessment level E	EQV IEC 60115-7-1-84
31.080.30	L40	GB/T 12300-1990	功率晶体管安全工作区测试方法	Test methods of safe operating area for power transistors	NEQ MIL STD 750B
31.260	L51	GB/T 12507.2-1997	光纤光缆连接器 第2部分: F-SMA型光纤光缆连接器分规范	Connectors for optical fibres and cables-Part 2: Sectional specification for fibre optic connector--Type F-SMA	IDT IEC 60874-2:1993
31.220.20	L51	GB/T 12511-1990	纤维光学开关 第一部分: 总规范(可供认证用)	ibre optic switches - Part 1: Generic specification	IDT IEC 60876-1-86
31.220.20	L51	GB/T 12512-1990	纤维光学衰减器 第一部分: 总规范(可供认证用)	Fibre optic attenuators - Part 1: Generic specification	IDT IEC 60869-1-88
31.180	L39	GB/T 12559-1990	印制电路用照相底图图形系列	The patternes series for artwork master of printed circuits
31.080.01	L40	GB/T 12560-1999	半导体器件 分立器件分规范	Semiconductor devices--Sectional specification for discrete devices	IDT IEC 60747-11:1985
31.080.10	L45	GB/T 12561-1990	发光二极管空白详细规范 (可供认证用)	Blank detail specification for light emitting diodes
31.080.10	L41	GB/T 12562-1990	PIN 二极管空白详细规范 (可供认证用)	Blank detail specification for PIN diodes
31.100	L39	GB/T 12564-1990	光电倍�搖ﾇ总规范 (可供认证用)	Generic specification for photomultiplier tubes
31.260	L50	GB/T 12565-1990	半导体器件 光电子器件分规范 (可供认证用)	Semiconductor devices - Sectional specification for optoelectronic devices
31.120	L38	GB/T 12567-1990	直观存储管测试方法	Methods of measurement of display storage tubes
31.120	L38	GB/T 12568-1990	直观存储管分规范 (可供认证用)	Sectional specification for display storage tubes	IDT CECC 11100-84
31.120	L38	GB/T 12569-1990	直观存储管空白详细规范 (可供认证用)	Blank detail specification for display storage tubes	IDT CECC 11101-84
31.120	L38	GB/T 12570-1990	单色显示管空白详细规范 (可供认证用)	Blank detail specification for monochrome display tubes	NEQ CECC 11001-86
31.120	L38	GB/T 12571-1990	单色显示管测试方法	Methods of measurement of monochrome display tubes	NEQ CECC 11000-86
31.180	L30	GB/T 12629-1990	限定燃烧性的薄覆铜箔环氧玻璃布层压板 (制造多层印制板用)	Thin epoxide woven glass fabric copper-clad laminated sheet of defined flammability for use in the fabrication of multilayer printed boards	EQV IEC 60249-2-12-87
31.180	L30	GB/T 12630-1990	一般用途的薄覆铜箔环氧玻璃布层压板 (制造多层印制板用)	Thin epoxide woven glass fabric copper-clad laminated sheet, general purpose grade, For use in the fabrication of multilayer printed boards	IDT IEC 60249-2-11-87
31.180	L30	GB/T 12631-1990	印制导线电阻测试方法	Test method for resistance of conductor of printed boards	NEQ IEC 60326-2-76
31.140	L32	GB/T 12633-1990	压电晶体性能测试术语	Terms for the measurements of the properties of the piezoelectric crystals
31.140	L32	GB/T 12634-1990	压电晶体电弹常数测试方法	Test methods for electroelastic constants of piezoelectric crystals
31.060	K48	GB/T 12747-1991	自愈式低电压并联电容器	Low voltage shunt capacitors of the self-healing type	EQV IEC 60831-1-88
31.200	L55	GB/T 12750-1991	半导体集成电路分规范 (不包括混合电路) (可供认证用)	Sectional specification for semiconductor integrated circuits, excluding hybrid circuits
31.060.60	L11	GB/T 12775-1991	电子设备用圆片型瓷介预调可变电容器总规范	Generic specification for disc-style ceramic dielectric variable pre-set capacitors in electronic equipment	NEQ IEC 60499-1
31.060.40	L11	GB/T 12794-1991	电子设备用固定电容器 第十五部分: 空白详细规范 非固体电解质箔电极钽电容器 评定水平 E (可供认证用)	Fixed capacitors for use in electronic equipment - Part 15: Blank detail specification - Tantalum capacitors with non-solid electrolyte and foil electrode - Assessment level E	IDT IEC 60384-15-1-84
31.060.40	L11	GB/T 12795-1991	电子设备用固定电容器 第十五部分: 空白详细规范 非固体电解质多孔阳极钽电容器 评定水平 E (可供认证用)	Fixed capacitors for use in electronic equipment - Part 15: Blank detail specification - Tantalum capacitors with non-solid electrolyte and porous anode - Assessment level E	IDT IEC 60385-15-2-84
31.200	L55	GB/T 12842-1991	膜集成电路和混合膜集成电路术语	Terminology for film integrated circuits and hybrid film integrated circuits
31.200	L55	GB/T 12843-1991	半导体集成电路 微处理器及外围接口电路电参数测试方法的基本原理	General principle of measuring methods of microproces sors and peripheral interface circuits' parameters for semiconductor integrated circuits
31.200	L56	GB/T 12844-1991	半导体集成电路非线性电路系列和品种 采样/ 保持放大器的品种	Series and products of nonlinear circuits for semiconductor integrated circuits？Products of sample/hold amplifiers
31.200	L56	GB/T 12845-1991	半导体集成电路非线性电路系列和品种 电压/ 频率和频率/ 电压转换器的品种	Series and products of nonlinear circuits for semiconductor integrated circuits - Products of voltage/frequency and frequency/voltage converters
31.080.20	L39	GB/T 12846-1991	脉冲闸流管总规范 (可供认证用)	General specification for pulse thyratrons	NEQ BS 9014-79
31.080.20	L39	GB/T 12847-1991	氢闸流管空白详细规范 (可供认证用)	Blank detail specification for hydrogen thyratrons
31.120	L49	GB/T 12848-1991	扭曲向列型液晶显示器件总规范 (可供认证用)	Generic specification of twisted nematic liquid crystal display devices
31.120	L49	GB/T 12849-1991	钟、表用扭曲向列型液晶显示器件空白详细规范 (可供认证用)	Blank detail specification of twisted nematic liquid crystal displays for watches
31.120	L49	GB/T 12850-1991	计算器用扭曲向列型液晶显示器件空白详细规范 (可供认证用)	Blank detail specification of twisted nematic liquid crystal displays for calculators
31.120	L49	GB/T 12851-1991	仪器、仪表用扭曲向列型液晶显示器件空白详细规范 (可供认证用)	Blank detail specification of twisted nematic liquid crystal displays for instruments
31.100	L37	GB/T 12852-2001	磁控管总规范	General specification for magnetrons	NEQ BS EN 136000:1993
31.100	L37	GB/T 12853-2001	连续波磁控管空白详细规范	Blank detail specification for continuous wave magnetrons	NEQ BS EN 136002:1996
31.100	L36	GB/T 12854-1991	脉冲调制管空白详细规范 (可供认证用)	Blank detail specification for pulse modulator tubes
31.100	L35	GB/T 12855-1991	小功率发射管的使用和维护	Application and care for small power transmitting tubes
31.140	L21	GB/T 12859-1991	电子设备用压电陶瓷谐振器总规范 (可供认证用)	Generic specification for piezoelectric ceramic resonators for use in electronic equipment
31.140	L21	GB/T 12860-1991	电子设备用压电陶瓷谐振器分规范 低频压电陶瓷谐振器	Piezoelectric ceramic resonators for use in electronic equipment - Sectional specification for piezoelectric ceramic resonators for low frequency
31.140	L21	GB/T 12861-1991	电子设备用压电陶瓷谐振器空白详细规范 低频压电陶瓷谐振器 评定水平 E(可供认证用)	Piezoelectric ceramic resonators for use in electronic equipment - Blank detail specification for piezoelectric ceramic resonators for low frequency - Assessment level E
31.140	L21	GB/T 12862-1991	电子设备用压电陶瓷谐振器分规范 高频压电陶瓷谐振器 (可供认证用)	Piezoelectric ceramic resonators for use in electronic equipment - Sectional specification for piezoelectric ceramic resonators for high frequency
31.160	L21	GB/T 12863-1991	电子设备用压电陶瓷谐振器空白详细规范 高频压电陶瓷谐振器 评定水平 E(可供认证用)	Piezoelectric ceramic resonators for use in electronic equipment - Blank detail specification for piezoelectric ceramic resonators for high frequency - Assessment level E
31.160	L18	GB/T 12864-1997	电子设备用压电陶瓷滤波器 电子元器件质量评定体系规范 第2部分: 分规范 鉴定批准	Piezoelectric ceramic filters for use in electronic equipment A specification in the quality assessment system for electronic components-Part 2: Sectional specification--Qualification approval	IDT IEC 61261-2:1994
31.160	L18	GB/T 12865-1997	电子设备用压电陶瓷滤波器 电子元器件质量评定体系规范 第2部分; 分规范 鉴定批准 第一篇: 空白详细规范 评定水平E	Piezoelectric ceramic filters for use in electronic equipment A specification in the quality assessment system for electronic components-Part 2: Sectional specification--Qualification approval Section 1: Blank detail specification-Assessment level E	IDT IEC 61261-2-1:1994
31.220	L05	GB/T 12992-1991	电子设备强迫风冷热特性测试方法	Measuring methods of thermal characteristic for forced air cooling of electronic equipment
31.220	L05	GB/T 12993-1991	电子设备热性能评定	Thermal performances evaluation for electronic equipment
ICS 国際規格分類	中国標準分類	規格番号	規格名称(中国語)	規格名称(英語)	国際整合
31.200	L55	GB/T 13062-1991	膜集成电路和混合膜集成电路空白详细规范 (可供认证用)	Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedure
31.080.10	L41	GB/T 13063-1991	电流调整和电流基准二极管空白详细规范	Blank detail specification for current-regulator and current-reference diodes
31.200	L56	GB/T 13064-1991	半导体集成电路系列和品种 复印机用系列的品种	Series and products for semiconductor integrated circuits - Products for use in copying machine
31.100	L39	GB/T 13065-1991	过电压保护气体放电管空白详细规范 (可供认证用)	Blank detail specification of gas discharge tubes for overvoltage protection
31.080.20	L41	GB/T 13066-1991	单结晶体管空白详细规范	Blank detail specification for unijunction transistors
31.200	L56	GB/T 13067-1991	半导体集成电路系列和品种 石英电子钟表用系列的品种	Series and products for semiconductor integrated circuits - Products for use in quartz electronic clock and watch
31.200	L56	GB/T 13068-1991	半导体集成电路系列和品种 磁敏传感器用系列的品种	Series and products for semiconductor integrated circuits - Products for use in transducer sensitive to magnetic
31.200	L56	GB/T 13069-1991	半导体集成电路系列和品种 数控机床用系列的品种	Series and products for semiconductor integrated circuits - Products for use in numerical control machine tool
31.080.20	K46	GB/T 13150-1991	100A以上环境或管壳额定双向三极晶闸管空白详细规范	Blank detail specification for bidirectional triode thyristors, ambient or case-rated, above 100A
31.080.20	K46	GB/T 13151-1991	100A以上环境或管壳额定反向阻断三极晶闸管空白详细规范	Blank detail specification for reverse blocking triode thyristors, ambient or case-rated, above 100A
31.080.20	K46	GB/T 13152-1991	5A/5A 以上环境或管壳额定逆导三极晶闸管空白详细规范	Blank detail specification for reverse conducting triode thyristors, ambient or case-rated, 5A/5A and above
31.080.20	K46	GB/T 13153-1991	5A以上环境或管壳额定可关断晶闸管空白详细规范	Blank detail specification for gate turn-off thyristors, ambient or case-rated, 5A and above
31.040.30	L15	GB/T 13189-1991	旁热式负温度系数热敏电阻器总规范 (可供认证用)	Geanral specification for the indirectly heated thermistors with negative temperature coefficient
31.260	L51	GB/T 13265.1-1997	纤维光学隔离器 第1部分: 总规范	Fiber optic isolators--Part 1: Generic specification	IDT IEC 61202-1-1994
31.260	L51	GB/T 13265.2-1997	纤维光学隔离器 第1-1部分: 空白详细规范	Fibre optic isolators--Part 1-1: Blank detail specification	IDT IEC 61202-1-1:1994
31.020	L26	GB/T 13415-1992	射频混频器总规范	Mixers, radio frequency, general specification for	NEQ MIL M28839
31.220.20	L26	GB/T 13416-1992	射频传输线(同轴)开关总规范	Switches(coaxial), RF transmission line, general specification for	NEQ MIL S3928c(1)
31.220.20	L22	GB/T 13419-1998	电子设备用机电开关 第6部分: 微动开关分规范	Electromechanical switches for use in electronic equipment Part 6: Sectional specification for sensitive switches	IDT IEC 61020-6:1991
31.220.20	L22	GB/T 13420-1998	电子设备用机电开关 第6部分:微动开关分规范 第1篇:空白详细规范	Electromechanical switches for use in electronic equipment Part 6: Sectional specification for sensitive switches Section 1: Blank 1: Blank detail specification	IDT IEC 61020-6-1:1991
31.180	L30	GB/T 13555-1992	印制电路用挠性覆铜箔聚酰亚胺薄膜	Flexible copper-clad polyimide film for printed circuits	EQV IEC 60249-2-13-87
31.180	L30	GB/T 13556-1992	印制电路用挠性覆铜箔聚脂薄膜	Flexible copper-clad polyester film for printed circuits	EQV IEC 60294-2-8-87
31.180	L30	GB/T 13557-1992	印制电路用挠性覆铜箔材料试验方法	Test methods for flexible copper-clad material for printed circuits	EQV IEC 60249-1-82
31.020	L52	GB/T 13583-1992	红外探测器外形尺寸系列	Outline dimension series of infrared detectors
31.020	L52	GB/T 13584-1992	红外探测器参数测试方法	Measuring methods for parameters of infrared detectors
31.260	L39	GB/T 13706-1992	光电管总规范 (可供认证用)	Generic specification for phototubes
31.260	L39	GB/T 13707-1992	光电管空白详细规范 (可供认证用)	Blank detail specification for phototubes
31.260	L39	GB/T 13708-1992	光电倍�搖ﾇ空白详细规范 (可供认证用)	Blank detail specification for photomultiplier tubes
31.100	L39	GB/T 13709-1992	检测用Ｘ射线管空白详细规范 (可供认证用)	Blank detail specification of X-ray tubes for detection
31.100	L39	GB/T 13710-1992	分析用Ｘ射线管空白详细规范 (可供认证用)	Blank detail for specification of X-ray tubes for analysis
31.260	L51	GB/T 13739-1992	激光辐射横模鉴别方法	Testing method of transverse mode of laser radiation
31.260	L51	GB/T 13740-1992	激光辐射发散角测试方法	Testing method of divergence angle of laser radiation
31.260	L51	GB/T 13741-1992	激光辐射光束直径测试方法	Testing method of beam diameter of laser radiation
31.040	L15	GB/T 13823.18-1997	振动与冲击传感器的校准方法 互易法校准	Methods for the calibration of vibration and shock pick-ups primary vibration calibration by reciprocity method	IDT ISO/DIS 5347-20:1989
31.260	L90	GB/T 13842-1992	掺钕钇铝石榴石激光棒	Neodymium-doped yttrium aluminum garnet laser rods
31.260	L51	GB/T 13863-1992	激光辐射功率测试方法	Testing method for laser radiant power
31.260	L51	GB/T 13864-1992	激光辐射功率稳定度测试方法	Testing method for laser radiant power stability
31.060.70	N22	GB/T 13865-1992	电力定量器	Instrument for electric load control	NEQ IEC/TC13 1006号文件
31.120	L39	GB/T 13943-1992	荧光显示管总规范(可供认证用)	General specification for vacuum fluorescent display tubes
31.120	L39	GB/T 13944-1992	荧光显示管空白详细规范(可供认证用)	Blank detail specification for vacuum fluorescent display tubes
31.120	L39	GB/T 13945-1992	辉光放电显示管总规范(可供认证用)	General specification for glow discharge display tubes
31.120	L39	GB/T 13946-1992	辉光放电显示管空白详细规范(可供认证用)	Blank detail specification for glow discharge display tubes
31.020	L99	GB/T 13947-1992	电子元器件塑料封装设备通用技术条件	General specification for electronic components plastic packaging equipments
31.020	N04	GB/T 13965-1992	仪表元器件术语	Instrument components--Vocabulary
ICS 国際規格分類	中国標準分類	規格番号	規格名称(中国語)	規格名称(英語)	国際整合
31.060	L11	GB/T 14004-1992	电子设备用固定电容器 第六部分: 分规范 金属化聚碳酸酯膜介质直流固定电容器(可供认证用)	Fixed capacitors for use in electronic equipment--Part 6: Sectional specification Fixed metallized polycarbonate film dielectric d.c. capacitors	IDT IEC 60384-6-87
31.060.30	L11	GB/T 14005-1992	电子设备用固定电容器 第六部分: 空白详细规范 金属化聚碳酸酯膜介质直流固定电容器 评定水平 E(可供认证用)	Fixed capacitors for use in electronic equipment--Part 6: Blank detail specification--Fixed metallized polycarbonate film dielectric d.c. capacitors--assessment level E	IDT IEC 60384-6-1
31.120	L38	GB/T 14010-1992	阴极射线管玻壳试验方法	Methods of test for cathode-ray tube bulbs
31.120	L38	GB/T 14011-1992	阴极射线管X射线辐射测试方法	Methods of measurement of X-radiation for cathode-ray tubes
31.120	L38	GB/T 14012-1992	�K白显象管玻壳总规范 (可供认证用)	Generial specification for black-and-white picture tube bulbs
31.200	K52	GB/T 14024-1992	内燃机电站无线电干扰特性的测量方法及允许值 传导干扰	Limits and methods of measurement of radio interference characteristics of electric power plant with internal combustion engines--Conducted interference	NEQ IEC 60533
31.200	L56	GB/T 14025-1992	半导体集成电路门阵列电路系列和品种 ECL系列的品种	Series and products for semiconductor gate array integrated circuits--Products of series ECL
31.200	L56	GB/T 14026-1992	半导体集成电路微型计算机电路系列和品种80C86系列的品种	semiconductor integrated circuits--Products of 80C86 family
31.200	L56	GB/T 14027.1-1992	半导体集成电路通信电路系列和品种 有源滤波器系列品种	Series and products of communication circuits for semiconductor integrated circuits--Products of active filters
31.200	L56	GB/T 14027.2-1992	半导体集成电路通信电路系列和品种 脉码调制编译码器系列品种	Series and products of communication circuits for semiconductor integrated circuits--Products of PCM coder-decoders
31.200	L56	GB/T 14027.3-1992	半导体集成电路通信电路系列和品种 模拟开关阵列系列品种	Series and products of communication circuits for semiconductor integrated circuits--Products of analogue switch arraies
31.200	L56	GB/T 14027.4-1992	半导体集成电路通信电路系列和品种 双音多频电路系列品种	Series and products of communication circuits for semiconductor integrated circuits--Products of dual-tone multi-frequency circuits
31.200	L56	GB/T 14027.5-1992	半导体集成电路通信电路系列和品种 电话电路系列品种	Series and products of communication circuits for semiconductor integrated circuits--Products of telephone circuits
31.200	L56	GB/T 14027.6-1992	半导体集成电路通信电路系列和品种 频率合成器系列品种	Series and products of communication circuits for semiconductor integrated circuits--Products of frequency synthesizers
31.200	L56	GB/T 14027.7-1992	半导体集成电路通信电路系列和品种 数字交换系统接口电路系列品种	Series and products of communication circuits for semiconductor integrated circuits--Products of digital switching system interface circuits
31.200	L55	GB/T 14028-1992	半导体集成电路模拟开关测试方法的基本原理	General principles of measuring methods of analogue switches for semiconductor integrated circuits
31.200	L55	GB/T 14029-1992	半导体集成电路模拟乘法器测试方法的基本原理	General principles of measuring methods of analogue multiplier for semiconductor integrated circuits
31.200	L55	GB/T 14030-1992	半导体集成电路时基电路测试方法的基本原理	General principles of measuring methods of timer circuits for semiconductor integrated circuits
31.200	L55	GB/T 14031-1992	半导体集成电路模拟锁相环测试方法的基本原理	General principles of measuring methods of analogue phase-loop for semiconductor integrated circuits
31.200	L55	GB/T 14032-1992	半导体集成电路数字锁相环测试方法的基本原理	General principles of measuring methods of digital phase-locked loop for semiconductor integrated circuits
31.260	L48	GB/T 14078-1993	氦氖激光器技术条件	He-Ne laser specification
31.100	L39	GB/T 14110-1993	闸流管与充气整流管总规范 (可供认证用)	General specification for thyratrons and gas-filled rectifier tubes
31.100	L39	GB/T 14111-1993	闸流管与充气整流管空白详细规范 (可供认证用)	Blank detail specification for thyratorns and gas-filled rectifier tubes
31.200	L55	GB/T 14112-1993	半导体集成电路 塑料双列封装冲制型引线框架规范	Semiconductor integrated circuits--Specification for stamped leadframes of plastic DIP	NEQ SEMI G9、G10-86
31.200	L55	GB/T 14113-1993	半导体集成电路封装术语	Terminology of packages for semiconductor integrated circuits	NEQ SEMI G9
31.200	L56	GB/T 14114-1993	半导体集成电路电压/频率和频率/电压转换器测试方法的基本原理	General principles of measuring methods of V/F and F/V converters for semiconductor integrated circuits
31.200	L56	GB/T 14115-1993	半导体集成电路采样/保持放大器测试方法的基本原理	General principles of measuring methods of Sample/Hold amplifiers for semiconductor integrated circuits
31.120	L49	GB/T 14116-1993	彩色液晶显示器件的光度和色度的测试方法	Photomentric and colorimetric methods of measurement of color liquid crystal displays	NEQ IEC 60441(1974)
31.120	L49	GB/T 14117-1993	彩色液晶显示器件空白详细规范 (可供认证用)	Blank detail specification of color liquid crystal displays
31.200	L56	GB/T 14119-1993	半导体集成电路双极熔丝式可编程只读存储器空白详细规范(可供认证用)	Blank detail specification for semiconductor integrated circuit fusible-link programmable bipolar read-only memories	NEQ IEC TC47A(Co)
31.020	L22	GB/T 14120-1993	单孔轴套安装、轴控电子元件的安装尺寸	Dimensions for the mounting of single-hole, bush-mounted, spendle-operated electronic components
31.060.40	L11	GB/T 14121-1993	电子设备用固定电容器 第3 部分: 分规范 片状钽固定电容器(可供认证用)	Fixed capacitors for use in electronic equipment--Part 3: Sectional specification--Fixed tantalum chip capacitors	IDT IEC 60384-3-89
31.060.40	L11	GB/T 14122-1993	电子设备用固定电容器 第3 部分: 空白详细规范 片状钽固定电容器 评定水平 E(可供认证用)	Fixed capacitors for use in electronic equipment--Part 3: Blank detail specification:chip capacitors--Assessment level E	IDT IEC 60384-3
31.120	L32	GB/T 14126-1993	显示管防眩玻屏技术要求及试验方法	Technical requirement and test method for the non-glare display glass tube
31.260	L32	GB/T 14128-1993	掺铷钇铝石榴石激光棒尺寸系列	Dimension series for neodymium-doped yttrium aluminum garnet laser rods
31.200	L56	GB/T 14129-1993	半导体集成电路TTL电路系列和品种 PAL系列的品种	Series and products for TTL semiconductor integrated circuits--Products of series PAL
31.120	L39	GB/T 14182-1993	变像管和像��强管总规范(可供认证用)	Generic specification for image-converter tubes and image intensifier tubes	EQV CECC 12000
31.120	L39	GB/T 14183-1993	变像管和像��强管空白详细规范(可供认证用)	Blank detail specification for image-converter tubes and image intensifier tubes	EQV CECC 12000
31.120	L39	GB/T 14184-1993	变像管和像��强管测试方法	The methods of measurement for image-converter tubes and image intensifier tubes	EQV CECC 12000
31.100	L39	GB/T 14186-1993	充气稳压管总规范(可供认证用)	Generic specification for gas-filled voltage Stabilizing tubes
31.060.30	Y32	GB/T 14217-1993	电容器纸介质损耗因数(tanδ)测定法	Method of test for dielectric dissipation factor (tanδ) of capacitor paper at power frequence	NEQ IEC 60554
31.020	L04	GB/T 14278-1993	电子设备热设计术语	Terms for thermal design of electronic equipment
31.120	L39	GB/T 14279-1993	交流等离子体显示器件空白详细规范(可供认证用)	Blank detail specification for AC plasma display devices
31.060.30	L11	GB/T 14472-1998	电子设备用固定电容器 第14部分: 分规范 抑制电源电磁干扰用固定电容器	Fixed capacitors for use in electronic equipment--Part 14: Sectional specification: Fixed capacitors for electromagnetic interference suppression and connection to the supply mains	IDT IEC 60384-14:1993
31.060.30	L11	GB/T 14473-1998	电子设备用固定电容器 第14部分: 空白详细规范 抑制电源电磁干扰用固定电容器 评定水平D	Fixed capacitors for use in electronic equipment--Part: 14 Blank detail specification--Fixed capacitors for electromagnetic interference suppression and connection to the supply mains--Assessment level D	IDT IEC 60384-14-1:1993
31.180	L39	GB/T 14515-1993	有贯穿连接的单、双面挠性印制板技术条件	Specification for single and double sided flexible printed boards with through connections	NEQ IEC 60326-8
31.180	L39	GB/T 14516-1993	无贯穿连接的单、双面挠性印制板技术条件	Specification for single and double sided flexible printed boards without through connections	NEQ IEC 60326-7
31.060.30	L11	GB/T 14579-1993	电子设备用固定电容器 第17部分: 分规范 金属化聚丙烯膜介质交流和脉冲固定电容器	Fixed capacitors for use in electronic equipment--Part 17: Sectional specification--Fixed metallized polypropylene film dielectric a.c and pulse capacitors	IDT IEC 60384-17
31.060.30	L11	GB/T 14580-1993	电子设备用固定电容器 第17部分: 空白详细规范 金属化聚丙烯膜介质交流和脉冲固定电容器 评定水平E	Fixed capacitors for use in electronic equipment--part 17: Blank detail specification--Fixed metallized polypropylene film dielectric a.c and pulse capacitors--Assessment level E	IDT IEC 60384-17-1
31.200	L32	GB/T 14619-1993	厚膜集成电路用氧化铝陶瓷基片	Alumina ceramic substrates for thick film integrated circuits
31.200	L32	GB/T 14620-1993	薄膜集成电路用氧化铝陶瓷基片	Alumina ceramic substrates for thin film integrated circuits
31.180	L30	GB/T 14708-1993	挠性印制电路用涂胶聚酯薄膜	Adhesive coated polyester film for flexible printed circuits	NEQ BS 4548第15部分
31.180	L30	GB/T 14709-1993	挠性印制电路用涂胶聚酰亚胺薄膜	Adhesive coated polyimide film for flexible printed circuits	NEQ BS 4548
31.120	M73	GB/T 14858-1993	�K白监视器通用技术条件	General specification for black-white monitors
31.200	L55	GB/T 14862-1993	半导体集成电路封装结到外壳热阻测试方法	Junction-to-case thermal resistance test methods of packages for semiconductor integrated circuits	NEQ SEMI G30-86,G43-87
ICS 国際規格分類	中国標準分類	規格番号	規格名称(中国語)	規格名称(英語)	国際整合
31.140	L21	GB/T 15020-1994	电子设备用石英晶体元件 空白详细规范 电阻焊石英晶体元件 评定水平 E	Quartz crystal units for use in electronic equipment--Blanr detail specification--Resistance welded quartz crystal units--Assessment level E
31.200	L56	GB/T 15136-1994	半导体集成电路石英钟表电路测试方法的基本原理	General principles of measuring methods for quartz clock and watch circuits of semiconductor integrated circuits
31.080.10	L41	GB/T 15137-1994	体效应二极管空白详细规范	Blank detail specification for gunn diodes
31.200	L55	GB/T 15138-1994	膜集成电路和混合集成电路外形尺寸	Case outlines for film integrated circuits and hybrid integrated circuits
31.140	L21	GB/T 15156-1994	压电陶瓷换能元件总规范	Generic specification for piezoelectric ceramic transducing elements
31.220.10	L23	GB/T 15157-1994	印制板用频率低于3MHz的连接器 第1 部分: 总规范 一般要求和编制有质量评定的详细规范的导则	Connectors for frequencies below 3MHz for use with printed boards--Part l: Generic specification--General requirements and guide for the preparation of detail specifications, with assessed quality	IDT IEC 60603-1-92(E)
31.220.10	L23	GB/T 15157.2-1998	印制板用频率低于3MHz的连接器 第2部分: 有质量评定的具有通用安装特征 基本网格2.54mm(0.1in)的印制板用两件式连接器详细规范	Connectors for frequencies below 3MHz for use with printed boards--Part 2: Detail specification for two-part connectors with assessed quality,for printed boards,for basic grid of 2.54mm(0.1in) with commonmounting features	IDT IEC 60603-2:1995
31.260	L47	GB/T 15167-1994	半导体激光光源总规范	General specification for light source of semiconductor lasers
31.260	L51	GB/T 15175-1994	固体激光器主要参数测试方	Measurement methods for main parameter of solid-state lasers
31.220.10	L24	GB/T 15176-1994	插入式电子元器件用插座及其附件总规范	Generic specification for sockets and accessories for electronic plug-in devices	EQV IEC 60149-1
31.080.10	L41	GB/T 15177-1994	微波检波、混频二极管 空白详细规范	Blank detail specification for microwave detectors and mixer diodes
31.080.10	L41	GB/T 15178-1994	变容二极管空白详细规范	Blank detail specification for variable capacitance diodes
31.140	H21	GB/T 15250-1994	压电铌酸锂单晶体声波衰减测试方法	Test method for bulk acoustic wave attenuation of piezoelectric lithium niobate crystals
31.020	L24	GB/T 15286-1994	端接件总规范	General specification for terminals
31.160	L18	GB/T 15287-1994	抑制射频干扰整件滤波器 第一部分: 总规范	Complete filter units for radio interference suppression--Part 1: Generic specification	EQV IEC 60939-1-88
31.160	L18	GB/T 15288-1994	抑制射频干扰整件滤波器 第二部分: 分规范 试验方法的选择和一般要求	Complete filter units for radio interference suppression--Part 2: Sectional specification--Selection of methods of test and general requirements	EQV IEC 60939-2-88
31.080.20	K46	GB/T 15291-1994	半导体器件 第6部分 晶闸管	Semiconductor devices--Part 6: Thyristors	EQV IEC 60747-6-83
31.080.20	K46	GB/T 15292-1994	晶闸管测试方法 逆导三极晶闸管	Measuring methods for thyristor--Reverse conducting triode thyristor	EQV IEC 60747-6-83
31.080.20	K46	GB/T 15293-1994	晶闸管测试方法 可关断晶闸管	Measuring methods for thyristor--Gate turn-off thyristor	EQV IEC 60747-6-83
31.200	L55	GB/T 15297-1994	微电路模块机械和气候试验方法	Mechanical and climatic test methods for microcircuit modules
31.040.20	L14	GB/T 15298-1994	电子设备用电位器 第一部分: 总规范	Potentiometers for use in electronic equipment--Part 1: Generic specification	IDT IEC 60393-1-89
31.040.20	L14	GB/T 15299-1994	电子设备用电位器 第二部分: 分规范 螺杆驱动和旋转预调电位器	Potentiometers for use in electronic equipment--Part 2: Sectional specification--Lead-screw actuated and rotary preset potentiometers	IDT IEC 60393-2-89
31.040.20	L14	GB/T 15300-1994	电子设备用电位器 第二部分: 空白详细规范 螺杆驱动和旋转预调电位器 评定水平 E	Potentiometers for use in electronic equipment--Part 2: Blank detail specification--Lead-screw actuated and rotary preset potentiometers--Assessment level E	IDT IEC 60393-2-1-89
31.260	L39	GB/T 15301-1994	气体激光器总规范	General specification for gas lasers
31.260	N04	GB/T 15313-1994	激光术语	Terminology for laser
31.240	L97	GB/T 15394-1994	多探针测试台通用技术条件	General specification for probe tester
31.240	M05	GB/T 15395-1994	电子设备机柜通用技术条件	General technical specification for cabinet of electronic equipment
31.100	L36	GB/T 15426-1994	收讯放大电子管空白详细规范	Blank detail specification for receiving tubes
31.120	L38	GB/T 15427-1994	彩色显示管测试方法	Methods of measurement of colour display tubes
31.060.30?	L11	GB/T 15448-1995	电子设备用固定电容器 第19部分: 分规范 金属化聚乙烯对苯二甲酸酯膜介质直流片式固定电容器	Fixed capacitors for use in electronic equipment--Part 19: Sectional specification-- Fixed metallized polyethylene-terephthalate film dielectric chip D.C.capacitors	IDT IEC 60384-19-1993
31.080.30?	L44	GB/T 15450-1995	硅双栅场效应晶体管 空白详细规范	Blank detail specification for silicon dual-gate field-effect transistors	IDT IEC 60747-8-1
31.220.20	L22	GB/T 15461-1995	电子设备用机电开关 第3部分: 成列直插封装式开关分规范	Electromechanical switches for use in electronic equipments--Part 3: Sectional specification for in-line package switches	IDT IEC 61020-3-91
31.220.20	L22	GB/T 15462-1995	电子设备用机电开关 第3-1部分: 成列直插封装式开关 空白详细规范	Electromechanical switches for use in electronic equipments--Part 3-1: Blank detail specification for in-line package switches	IDT IEC 61020-3-1-91
31.220.10?	M64	GB/T 15644-1995	视听系统设备互连用连接器的应用	Application of connectors for the interconnection of equipment in audio-visual systems	NEQ IEC 60574-3-1983
31.260?	L40	GB/T 15651-1995	半导体器件 分立器件和集成电路 第5部分:光电子器件	Semiconductor devices--Discrete devices and integrated circuits--Part 5: Optoelectronic devices	IDT IEC 60747-5-1992
31.040.30?	L15	GB/T 15652-1995	金属氧化物半导体气敏元件总规范	Generic specification for gas sensors of metal-oxide semiconductor	NEQ IEC 60738-1
31.040?	L13	GB/T 15654-1995	电子设备用膜固定电阻网络 第1部分:总规范	Fixed film resistor networks for use in electronic equipment--Part 1: Generic specification	IDT IEC 61045-1-1991
31.020	L15	GB/T 15768-1995	电容式湿敏元件与湿度传感器总规范	General specification for the capacitance type humidity sensor and transducer	NEQ JIS Z 8806-1981
31.200	L97	GB/T 15861-1995	离子束蚀刻机通用技术条件	Generic specification of ion beam etching system
31.200	L97	GB/T 15862-1995	离子注入机通用技术条件	Generic specification for ion implantation equipment
31.030	L97	GB/T 15870-1995	硬面光掩模用铬薄膜	Chrome thin films for hard surface photomasks	EQV SEMI P2-86
31.030	L97	GB/T 15871-1995	硬面光掩模基板	Hard surface photomask substrates	NEQ SEMI P1-92
31.220.10	L97	GB/T 15872-1995	半导体设备电源接口	Power supply interface for semiconductor equipment	NEQ SEMI E7-92
31.220.10	L97	GB/T 15873-1995	半导体设施接口技术文件编写导则	Directives for drafting semiconductor facilities interface specification	NEQ SEMI E6-92
31.200	L55	GB/T 15876-1995	塑料四面引线扁平封装引线框架规范	Specification of leadframes for plastic quad flat package	NEQ SEMI G47-88
31.200	L55	GB/T 15877-1995	蚀刻型双列封装引线框架规范	Specification of DIP leadframes produced by etching	NEQ SEMI G 19-84
31.200	L55	GB/T 15878-1995	小外形封装引线框架规范	Specification of leadframes for small outline package	NEQ SEMI G 28-86
31.200	L55	GB/T 15879-1995	半导体器件的机械标准化 第5部分: 用于集成电路载带自动焊(TAB)的推荐值	Mechanical standardization of semiconductor devices--Part 5: Recommendations applying to tape automated bonding (TAB) of integrated circuits	IDT IEC 60191-5-87
31.040.20	L14	GB/T 15880-1995	电子设备用电位器 第3部分: 分规范 旋转式精密电位器	Potentiometers for use in electronic equipment--Part 3: Sectional specification:Rotary precision potentiometers	IDT IEC 60393-3-92
31.040.20	L14	GB/T 15881-1995	电子设备用电位器 第3部分: 空白详细规范 旋转式精密电位器 评定水平E	Potentiometers for use in electronic equipment--Part 3: Blank detail specification:Rotary precision potentiometers Assessment level E	IDT IEC 60393-3-1-92
31.040	L13	GB/T 15882-1995	电子设备用膜固定电阻网络 第2部分: 按能力批准程序评定质量的膜电阻网络分规范	Fixed film resistor networks for use in electronic equipment--Part 2: Sectional specification for film resistor networks of assessed quality on the basis of the capability approval procedure	IDT IEC 61045-2-91
31.040.10	L13	GB/T 15883-1995	电子设备用膜固定电阻网络 第2部分: 按能力批准程序评定质量的膜电阻网络空白详细规范 评定水平E	Fixed film resistor networks for use in electronic equipment--Part 2: Blank detail specification for film resistor networks of assessed quality on the basis of the capability approval procedure--Assessment level E	IDT IEC 61045-2-1-91
31.040.10	L13	GB/T 15884-1995	电子设备用固定电阻器 第5部分: 空白详细规范: 精密固定电阻器 评定水平 F	Fixed resistors for use in electronic equipment--Part 5: Blank detail specification:Fixed precision resistors--Assessment level F	IDT IEC 60115-5-2-92
31.040.10	L13	GB/T 15885-1995	电子设备用固定电阻器 第4部分: 空白详细规范: 功率型固定电阻器 评定水平 F	Fixed resistors for use in electronic equipment--Part 4: Blank detail specification:Fixed power resistors--Assessment level F	IDT IEC 60115-4-2-92
ICS 国際規格分類	中国標準分類	規格番号	規格名称(中国語)	規格名称(英語)	国際整合
31.180	L30	GB/T 16261-1996	印制板总规范	Generic specification printed boards	IDT IEC/PQC 88-1990
31.140	L18	GB/T 16304-1996	压电陶瓷电场 应变特性测试方法	Test methods of the properties of the relation between strain and electric field for piezoelectric ceramic
31.180	L30	GB/T 16315-1996	印制电路用限定燃烧性的覆铜箔聚酰亚胺玻璃布层压板	Polyimide woven glass fabric copper-clad laminated sheet of defined flammability for printed circuits	NEQ IEC 60249-2-1993
31.180	L30	GB/T 16317-1996	多层印制电路用限定燃烧性的薄覆铜箔聚酰亚胺玻璃布层压板	Thin polyimide woven glass fabric copper-clad laminated sheet of defined flammability for use in the fabrication of multilayer printed boards	NEQ IEC 60249-2-1992
31.200	L55	GB/T 16465-1996	膜集成电路和混合膜集成电路分规范（采用能力批准程序〕	Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures	IDT IEC 60748-22-1992
31.200	L55	GB/T 16464-1996	半导体器件 集成电路 第1部分: 总则	Semiconductor devices integrated circuits--Part 1: General	IDT IEC 60748-1-1984
31.200	L55	GB/T 16466-1996	膜集成电路和混合膜集成电路空白详细规范(采用能力批准程序〕	Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures	IDT IEC 60748-22-1-1991
31.060.30	L11	GB/T 16467-1996	电子设备用固定电容器 第19部分: 空白详细规范 金属化聚乙烯对苯二甲酸酯膜介质 直流片式固定电容器 评定水平E	Fixed capacitora for use in electronic equipment--Part 19: Blank detail specification--Fixed metallized polyethylene-terephthalate film dielectric chip d.c.capacitors--Assessment level E	IDT IEC 60384-19-1-1993
31.080.29	L44	GB/T 16468-1996	静电感应晶体管系列型谱	Series programmes for static induction transistors
31.020	L19	GB/T 16512-1996	抑制射频干扰固定电感器 第1部分 总规范	Fixed inductors for radio interference suppression--Part 1: Generic specification	IDT IEC 60938-1-1988
31.020	L19	GB/T 16513-1996	抑制射频干扰固定电感器 第2部分 分规范 试验方法和一般要求的选择	Fixed inductors for radio interference suppression--Part 2: Sectional specification--Selection of methods of test and gederal requirements	IDT IEC 60938-2-1988
31.040.20	L14	GB/T 16515-1996	电子设备用电位器 第5部分: 分规范 单圈旋转式低功率线绕和非线绕电位器	Potentiometers for use in electronic equipment--Part 5: Sectional specification: Single-turn rotary low-power wirewound and non-wirewound potentiometers	IDT IEC 60393-5-1992
31.020	L21	GB/T 16516-1996	石英晶体元件 电子器件质量评定体系规范 第2部分: 分规范能力批准	Quartz crystal units--A specification in the quality assessment system for electronic components--Part 2: Sectional specification--Capability approval	IDT IEC 601178-2-1993
31.020	L21	GB/T 16517-1996	石英晶体元件 电子元器件质量评定体系规范 第3部分: 分规范 鉴定批准	Quartz crystal units--A specification in the quality assessment system for electronic components--Part 3: Sectional specification--Qualification approval	IDT IEC 61178-3-1993
31.200	L90	GB/T 16523-1996	圆形石英玻璃光掩模基板规范	Specification for round quartz photomask substrates	EQV SEMI P4-92
31.200	L95	GB/T 16524-1996	光掩模对准标记规范	Specification for registration marks for photomasks	EQV SEMI P6-88
31.200	L55	GB/T 16525-1996	塑料有引线片式载体封装引线框架规范	Specification of leadframes for plastic leaded chip carrier packages	EQV SEMI G27-89
31.200	L55	GB/T 16526-1996	封装引线间电容和引线负载电容测试方法	The method of measuring the lead-to-lead and loading capacitance of package leads	EQV SEMI G24-89
31.200	L90	GB/T 16527-1996	硬面感光板中光致抗蚀剂和电子束抗蚀剂规范	Specification for photoresist/E-beam resist for hard surface photoplates	EQV SEMI P3-90
31.030	L95	GB/T 16528-1996	压敏电阻器用氧化锌陶瓷材料	Zinc oxide ceramics for use in varistors
31.260	L51	GB/T 16530-1996	单模纤维光学器件回波损耗偏振依赖性测量方法	Measuring method for polarization dependence of return loss of a single-mode fibre optic component	IDT IEC/DIS 61300-3-19
31.020	L90	GB/T 16822-1997	介电晶体介电性能的试验方法	Test method for dielectric properties of dielectric crystal
31.200	L97	GB/T 16878-1997	用于集成电路制造技术的检测图形单元规范	Specification for metrology pattern cells for integrated circuit manufacture	IDT SEMI P19:1992
31.020	L97	GB/T 16879-1997	掩模曝光系统精密度和准确度的表示准则	Guidelines for precision and accuracy expression for mask writing equipment	IDT SEMI P21:1992
31.020	L97	GB/T 16880-1997	光掩模缺陷分类和尺寸定义的准则	Guidelines for photomask defect classification and size definition	IDT SEMI P22:1993
31.080.10	K46	GB/T 16894-1997	大于100A，环境和管壳额定的整流二极管（包括雪崩整流二极管）空白详细规范	Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100A	IDT IEC 60747-2-2:1993
ICS 国際規格分類	中国標準分類	規格番号	規格名称(中国語)	規格名称(英語)	国際整合
31.080.30	K46	GB/T 17007-1997	绝缘栅双极型晶体管测试方法	Measuring methods for insulated-gate bipolar transistor
31.080.30	K46	GB/T 17008-1997	绝缘栅双极型晶体管的词汇及文字符号	Terminology and letter symbols for insulated-gate bipolar transistor	EQV IEC/TC 47(CO)1339
31.200	L55	GB/T 17023-1997	半导体器件 集成电路 第2部分: 数字集成电路 第二篇HCMOS数字集成电路54/74HC、54/74HCT、54/74HCU系列族规范	Semiconductor devices integrated circuits--Part 2: Digital Integrated circuits Section two--Family specification for HCMOS digital integrated circuits,series 54/74HC,54/74HCT,54/74HCU	IDT IEC 60748-2-2:1992
31.200	L55	GB/T 17024-1997	半导体器件 集成电路 第2部分: 数字集成电路 第三篇HCMOS数字集成电路54/74HC、54/74HCT、54/74HCU系列空白详细规范	Semiconductor devices integrated circuits--Part2: Digital Integrated circuits Section three--Blank detail specification for HCMOS digital integrated circuits series 54/74HC,54/74HCT,54/74HCU	IDT IEC 60748-2-3l:1992
31.040.20	L14	GB/T 17025-1997	电子设备用电位器 第4部分: 分规范 单圈旋转功率电位器	Potentiometers for use in electronic equipment Part 4--Sectional specification: Single-turn rotary power potentiometers	IDT IEC 60393-4:1992
31.040.20	L14	GB/T 17026-1997	电子设备用电位器 第4部分: 空白详细规范 单圈旋转功率电位器 评定水平E	Potentiometers for use in electronic equipment Part 4: Blank detail specification Single-turn rotary power potentiometers--Assessment level E	IDT IEC 60393-4-1:1992
31.040.20	L14	GB/T 17027-1997	电子设备用电位器 第4部分: 空白详细规范: 单圈旋转功率电位器 评定水平F	Potentiometers for use in electronic equipment Part 4: Blank detail specification--Single-turn rotary power potentiometers Assessment level F	IDT IEC 60393-4-2:1992
31.040.20	L14	GB/T 17028-1997	电子设备用电位器 第5部分: 空白详细规范 单圈旋转低功率电位器 评定水平E	Potentiometers for use in electronic equipment Part 5: Blank detail specification--Single-turn rotary low-power potentiometers Assessment level E	IDT IEC 60393-5-1:1992
31.040.20	L14	GB/T 17029-1997	电子设备用电位器 第5部分: 空白详细规范: 单圈旋转低功率电位器 评定水平F	Potentiometers for use in electronic equipment Part 5: Blank detail specification--Single-turn rotary low-power potentiometers Assessment level F	IDT IEC 60393-5-2:1992
31.040.10	L13	GB/T 17034-1997	电子设备用固定电阻器 第2部分: 空白详细规范 低功率非线绕固定电阻器 评定水平F	Fixed resistors for use in electronic equipment Part 2: Blank detail specification Fixed low-power non-wirewound resistors Assessment level F	IDT IEC 60115-2-2:1992
31.040.10	L13	GB/T 17035-1997	电子设备用固定电阻器 第4部分: 空白详细规范 带散热器的功率型固定电阻器 评定水平H	Fixed resistors for use in electronic equipment--Part 4: Blank detail specification--Fixed power resistors, heat-sink types--Assessment level H	IDT IEC 60115-4-3:1993
31.160	L18	GB/T 17190-1997	电子设备用压电陶瓷滤波器 电子元器件质量评定体系规范 第1部分: 总规范 鉴定批准	Piezoelectric ceramic filters for use in electronic equipment A specification in the quality assessment system for electronic components-Part 1: Generic specification--Qualification approval	IDT IEC 61261-1:1994
31.060.50	L11	GB/T 17206-1998	电子设备用固定电容器第18部分: 分规范 固体(MnO2)与非固体电解质片式铝固定电容器	Fixed capacitors for use in electronic equipment--Part 18: Sectional specification: Fixed aluminium electrolytic chip capacitors with solid (MnO2)and non-solid electrolyte	IDT IEC 60384-18:1993
31.060.50	L11	GB/T 17207-1998	电子设备用固定电容 第18部分: 空白详细规范 固体(MnO2)电解质片式铝固定电容器 评定水平E	Fixed capacitors for use in electronic equipment--Part 18: Blank detail specification--Fixed aluminium electrolytic chip capacitors with solid (MnO2)electrolyte--Assessmentlevel E	IDT IEC 60384-18-1:1993
31.060.50	L11	GB/T 17208-1998	电子设备用固定电容器 第18部分: 空白详细规范 非固体电解质片式铝固定电容器 评定水平E	Fixed capacitors for use in electronic equipment--Part 18: Blank detail specification--Fixed aluminium electrolytic chip capacitors with non-solid electrolyte--Assessment level E	IDT IEC 60384-18-2:1993
31.220.20	L22	GB/T 17209-1998	电子设备用机电开关 第2部分: 旋转开关分规范	Electromechanical switches for use in electronic equipment--Part 2: Sectional specification for rotary switches	IDT IEC 61020-2:1991
31.220.20	L22	GB/T 17210-1998	电子设备用机电开关 第2部分: 空白详细规范 旋转开关	Electromechanical switches for use in electronic equipment--Part 2:Blank detail specification: for rotary switches	IDT IEC 61020-2-1:1991
31.260	L52	GB/T 17444-1998	红外焦平面阵列特性参数测试技术规范	The technical norms for measurement and test of characteristic parameters of infrared focal plane arrays
31.220.10	L23	GB/T 17562.1-1998	频率低于3MHz的矩形连接器 第1部分: 总规范--一般要求和编制有质量评定要求的连接器详细规范的导则	Rectangular connectors for frequencies below 3MHz Part 1: Generic specification--General requirements and quide for the preparation of detail specifications,for connectors with assessed quality	EQV IEC 60807-1-1991
31.020	K04	GB/T 17564.1-1998	电气元器件的标准数据元素类型和相关分类模式 第1部分: 定义-原则和方法	Standard data element types with associated classification scheme for electric components--Part 1: Detinitions-Principles and methods	IDT IEC 61360-1:1995
31.020	K04	GB/T 17564.2-2000	电气元器件的标准数据元素类型和相关分类模式 第2部分: EXPRESS字典模式	Standard data element types with associated classification scheme for electric components Part 2: EXPRESS Dictionary schema	IDT IEC 61360-2:1998
31.020	K04	GB/T 17564.3-1999	电气元器件的标准数据元素类型和相关分类模式 第3部分：维护和确认的程序	Standard data element types with associated classification scheme for electric components--Part 3: Maintenance and validation procedures	EQV IEC 61360-3:1995
31.020	K04	GB/T 17564.4-2001	电气元器件的标准数据元素类型和相关分类模式 第4部分: IEC标准数据元素类型、元器件类别和项的基准集	Standard data element types with associated classification scheme for electric components--Part 4: IEC reference collection of standard data element types,component classes and terms	IDT IEC 61360-4:1997
31.200	L56	GB/T 17572-1998	半导体器件 集成电路 第2部分: 数字集成电路 第四篇工 CMOS数字集成电路 4000B和4000UB系列族规范	Semiconductor devices integratcd circuits Part 2: Digital integrated circuits Section four-Family specification for complementary MOS digital integrated circuits,scrics 4000B and 4000UB	IDT IEC 60748-2-4:1992
31.080.01	L40	GB/T 17573-1998	半导体器件 分立器件和集成电路 第1部分: 总则	Semiconductor devices Discrete devices and integrated circuits Part 1: General	IDT IEC 60747-1:1983
31.200	L55	GB/T 17574-1998	半导体器件 集成电路 第2部分: 数字集成电路	Semiconductor devices Integrated circuits Part 2: Digital integrated circuits	IDT IEC 60748-2:1985
31.060.70	K42	GB/T 17702.1-1999	电力电子电容器 第1部分：总则	Power electronic capacitors--Part 1: General	IDT IEC 61071-1:1991
31.060.70	K42	GB/T 17702.2-1999	电力电子电容器 第2部分：熔丝的隔离试验、破坏试验、自愈性试验及耐久性试验的要求	Power electronic capacitors--Part 2: Requirements for disconnecting test on fuses,destruction test,self-healing test and endurance test	IDT IEC 61071-2:1994
31.030	L90	GB/T 17711-1999	钇钡铜氧（123相）超导薄膜临界温度Tc的直流电阻试验方法	The DC electric resistance test method for the critical temperature Tc of a YBa2 Cu3O7-δsuperconducting thin film	NEQ IEC/TC90 RRR WD-1 Ver.2
31.200	L56	GB/T 17864-1999	关键尺寸(CD)计量方法	CD Metrology procedures	IDT SEMI P24:1994
31.200	L56	GB/T 17865-1999	焦深与最佳聚焦的测量规范	Specification for measuring depth of focus and best focus	IDT SEMI P25:1994
31.200	L56	GB/T 17866-1999	掩模缺陷检查系统灵敏度分析所用的特制缺陷掩模和评估测量方法准则	Guideline for programmed defect masks and benchmark procedures for sensitivity analysis of mask defect inspection systems	IDT SEMI P23:1993
31.060.70	K42	GB/T 17886.1-1999	标称电压1kV及以下交流电力系统用非自愈式并联电容器 第1部分: 总则--性能、试验和定额--安全要求--安装和运行导则	Shunt power capacitors of the non-self--healing type for a.c.systems having a rated voltage up to and including 1kV--Part 1: General--Performance,testing and rating--Safety requirements--Guide for installation and operation	IDT IEC 60931-1:1996
31.060.70	K42	GB/T 17886.2-1999	标称电压1kV及以下交流电力系统用非自愈式并联电容器 第2部分: 老化试验和破坏试验	Shunt power capacitors of the non-self-healing type for a.c.systems having a rated voltage up to and including 1kV--Part 2: Ageing test and destruction test	IDT IEC 60931-2:1995
31.060.70	K42	GB/T 17886.3-1999	标称电压1kV及以下交流电力系统用非自愈式并联电容器 第3部分: 内部熔丝	Shunt power capacitors of the non-self-healing type for a.c.systems having a rated voltage up to and including 1kV--Part 3: Internal fuses	IDT IEC 60931-3:1996
31.200	L56	GB/T 17940-2000	半导体器件 集成电路 第3部分: 模拟集成电路	Semiconductor devices Integrated circuits--Part 3: Analogue integrated circuits	IDT IEC 60748-3:1986
ICS 国際規格分類	中国標準分類	規格番号	規格名称(中国語)	規格名称(英語)	国際整合
31.260	N33	GB 18151-2000	激光防护屏	Laser guards	EQV IEC 60825-4:1997
31.180	L30	GB/T 18334-2001	有贯穿连接的挠性多层印制板规范	Specification for flexible multilayer printed boards with through conections	IDT IEC 60326-9:1991
31.180	L30	GB/T 18335-2001	有贯穿连接的刚挠多层印制板规范	Specification for flex-rigid multilayer printed boards with through connections	IDT IEC 60326-11:1991
31.260	L51	GB/T 18461-2001	激光产品的安全 生产者关于激光辐射安全的检查清单	Safety of laser products--Manufacturer's checklist for radiation safety of laser products	EQV IEC 60825-5:1996
31.260	J39	GB/T 18462-2001	激光加工机械 金属切割的性能规范与标准检查程序	Laser processing machines--Performance specifications and benchmarks for cutting of metals	EQV ISO/TR 11552:1997
31.260	L51	GB 18490-2001	激光加工机械 安全要求	Laser processing machines--Safety requirements	EQV ISO 11553:1996
31.220.20	L22	GB/T 18496-2001	电子设备用机电开关 第4部分: 钮子(倒扳)开关分规范	Electromechanical switches for use in electronic equipment Part 4: Sectional specification for lever(toggle) switches	IDT IEC 61020-4:1991
31.200	L56	GB/T 18500.1-2001	半导体器件 集成电路 第4部分: 接口集成电路第一篇: 线性数字/模拟转换器(DAC)空白详细规范	Semiconductor devices Integrated circuits Part 4: Interface integrated circuits Section 1: Blank detail specification for linear digital-to-analogue converters(DAC)	IDT IEC 60748-4-1:1993
31.200	L56	GB/T 18500.2-2001	半导体器件 集成电路 第4部分: 接口集成电路第二篇: 线性模拟/数字转换器(ADC)空白详细规范	Semiconductor devices Integrated circuits Part 4: Interface integrated circuits Section 2: Blank detail specification for linear analogue-to-digital converters(ADC)	IDT IEC 60748-4-2:1993
31.220.10	L23	GB/T 18501.1-2001	有质量评定的直流和低频模拟及数字式高速数据处理设备用连接器 第1部分: 总规范	Connectors with assessed quality,for use in d.c.,low frequency analogue and in digital high speed data applications--Part 1: Generic specification	IDT IEC 61076-1:1995
31.220.10	L23	GB/T 18501.2-2001	直流和低频模拟及数字式高速数据处理设备用连接器 第2部分: 有质量评定的圆形连接器分规范	Connectors for use in d.c.,low-frequency analogue and digital high speed data spplications--Part 2: Circular connectors with assessed quality--Sectional specification	IDT IEC 61076-2:1998
31.020	L90	GB/T 18502-2001	银或银合金包套铋系氧化物超导体直流临界电流的测定	The DC critical current measurement for Ag or Ag-alloy sheathed bismuthal oxide superconductor
ICS 国際規格分類	中国標準分類	規格番号	規格名称(中国語)	規格名称(英語)	国際整合

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